{"paper":{"title":"Imaging at the mesoscale (LEEM, PEEM)","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["physics.ins-det"],"primary_cat":"cond-mat.mes-hall","authors_text":"Alessandro Sala","submitted_at":"2018-12-04T17:46:36Z","abstract_excerpt":"*To be published in Springer Handbook of Surface Science (Springer Verlag) [Preprint]*\n  The capability to display images containing chemical, magnetic and structural information and to perform spectroscopy and diffraction from a {\\mu}m-sized area makes cathode lens electron microscopy one of the most used and reliable techniques to analyze surfaces at the mesoscale. Thanks to its versatility, LEEM/PEEM systems are currently employed to study model systems in the fields of nanotechnology, nanomagnetism, material science, catalysis, energy storage, thin films and 2D materials. In the following "},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1812.01610","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}