{"paper":{"title":"Phase-sensitive imaging of microwave currents in superconductive circuits","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cond-mat.supr-con"],"primary_cat":"physics.app-ph","authors_text":"A. Karpov, A. P. Zhuravel, A. S. Averkin, A. V. Ustinov, V. I. Chichkov","submitted_at":"2018-04-09T14:40:27Z","abstract_excerpt":"The contemporary superconductive electronics is widely using planar circuits with micrometer-scale elements for a variety of applications. With the rise of complexity of a circuit and increased number of its components, a simple impedance measurement are often not efficient for diagnostics of problems, nor for clarifying the physics underlying the circuit response. The established Scanning Laser Microscope (LSM) technique generates the micrometer-scale images of the amplitude of the microwave currents in a planar superconductive circuit, but not the phase of the oscillating currents. Here we p"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1804.03026","kind":"arxiv","version":2},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}