{"paper":{"title":"Photoluminescence of resin-based solder flux residue under ultraviolet excitation from 120 nm to 310 nm","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"Solder flux residues photoluminesce in the visible range when exposed to VUV light relevant to liquid xenon detectors.","cross_cats":["hep-ex"],"primary_cat":"physics.ins-det","authors_text":"Andreas Leonhardt, Anna Hurhina, Marjolein Troost, Tina R. Pollmann","submitted_at":"2026-05-16T07:04:31Z","abstract_excerpt":"Nuisance photoluminescence is a potential source of background in particle detectors that use noble liquids as target material for galactic dark matter particles and neutrinos. Liquid argon and xenon scintillate in the vacuum ultraviolet (VUV) wavelength range in response to particle interactions. Photoluminescent materials that absorb these photons can cause unexpected signals that may impede event reconstruction in these detectors. We illuminated residue from different types of commercial solder flux commonly used in liquid xenon detectors with ultraviolet and VUV light and measured their ph"},"claims":{"count":4,"items":[{"kind":"strongest_claim","text":"We find that all tested flux residues photoluminesce in the visible spectral region when exposed to VUV light.","source":"verdict.strongest_claim","status":"machine_extracted","claim_id":"C1","attestation":"unclaimed"},{"kind":"weakest_assumption","text":"The commercial solder fluxes and residues tested are representative of those actually used during assembly of liquid xenon detectors and that the laboratory illumination conditions mimic the VUV scintillation light present in the detector.","source":"verdict.weakest_assumption","status":"machine_extracted","claim_id":"C2","attestation":"unclaimed"},{"kind":"one_line_summary","text":"All tested resin-based solder flux residues photoluminesce in the visible spectral region when exposed to VUV light.","source":"verdict.one_line_summary","status":"machine_extracted","claim_id":"C3","attestation":"unclaimed"},{"kind":"headline","text":"Solder flux residues photoluminesce in the visible range when exposed to VUV light relevant to liquid xenon detectors.","source":"verdict.pith_extraction.headline","status":"machine_extracted","claim_id":"C4","attestation":"unclaimed"}],"snapshot_sha256":"3b7b2b0c1aea42f99ceed31b097486a251d66e34f50e88f6dfbba17b4e55c918"},"source":{"id":"2605.16845","kind":"arxiv","version":1},"verdict":{"id":"309badaa-15a2-4d8e-b84f-602ff8e534b7","model_set":{"reader":"grok-4.3"},"created_at":"2026-05-19T19:27:53.805524Z","strongest_claim":"We find that all tested flux residues photoluminesce in the visible spectral region when exposed to VUV light.","one_line_summary":"All tested resin-based solder flux residues photoluminesce in the visible spectral region when exposed to VUV light.","pipeline_version":"pith-pipeline@v0.9.0","weakest_assumption":"The commercial solder fluxes and residues tested are representative of those actually used during assembly of liquid xenon detectors and that the laboratory illumination conditions mimic the VUV scintillation light present in the detector.","pith_extraction_headline":"Solder flux residues photoluminesce in the visible range when exposed to VUV light relevant to liquid xenon detectors."},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2605.16845/integrity.json","findings":[],"available":true,"detectors_run":[{"name":"doi_title_agreement","ran_at":"2026-05-19T20:01:19.005179Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"doi_compliance","ran_at":"2026-05-19T19:40:53.303277Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"claim_evidence","ran_at":"2026-05-19T18:41:56.318661Z","status":"completed","version":"1.0.0","findings_count":0},{"name":"ai_meta_artifact","ran_at":"2026-05-19T18:33:26.391278Z","status":"skipped","version":"1.0.0","findings_count":0}],"snapshot_sha256":"998822771873e1889824b4360d39469ded1b1a7e5a23c0dd1c609ead8c0d66ca"},"references":{"count":23,"sample":[{"doi":"","year":2018,"title":"Two distinct components of the delayed single electron background signals in liquid xenon emission detectors","work_id":"21cf2f2e-4547-498b-a994-b5824a7168c8","ref_index":1,"cited_arxiv_id":"1711.07025","is_internal_anchor":true},{"doi":"","year":2025,"title":"Singh.Search for rare low energy interactions in liquid xenon Dark Matter experiments","work_id":"40c10faa-97ef-4434-bea6-dc09c15d56b7","ref_index":2,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"","year":1972,"title":"O. Cheshnovsky, B. Raz, and J. Jortner. Emission spectra of deep impurity states in solid and liquid rare gas alloys.J. Chem. Phys., 57(11):4628–4632, 1972","work_id":"6bd9d31c-7d09-43cf-b2a2-8d503c367219","ref_index":3,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"","year":2015,"title":"K. Fujii, Y. Endo, Y. Torigoe, et al. High-accuracy measurement of the emission spectrum of liquid xenon in the vacuum ultraviolet region.NIM A, 795:293–297, 2015","work_id":"c0f4c683-923e-49c0-baa3-1695337eb045","ref_index":4,"cited_arxiv_id":"","is_internal_anchor":false},{"doi":"","year":2007,"title":"E. Kh. Baksht, A. M. Boichenko, I. V. Galakhov, et al. Spectral characteristics of a high-current pulsed discharge in xenon.Laser Physics, 17(6):782–797, 2007","work_id":"7bd116ca-dc6a-438c-9e85-c617d6eecba9","ref_index":5,"cited_arxiv_id":"","is_internal_anchor":false}],"resolved_work":23,"snapshot_sha256":"95030ff510dd5e36caa32e3521e5031d456731530b827e7e809f2150b4a6273e","internal_anchors":2},"formal_canon":{"evidence_count":2,"snapshot_sha256":"4024a851c907aa73017174edb501129fd59cbdab0cbbc621e7861862f3393e0a"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}