{"paper":{"title":"DICE: Detailed Inter-Chiplet End-to-End PHY Modeling for Accurate Chiplet Simulation","license":"http://creativecommons.org/licenses/by/4.0/","headline":"","cross_cats":[],"primary_cat":"cs.AR","authors_text":"Rashid Aligholipour, Stefanos Kaxiras, Yuan Yao","submitted_at":"2026-07-27T09:53:10Z","abstract_excerpt":"Scaling monolithic multicores is increasingly constrained by power/thermal limits, yield, and rising manufacturing and testing costs. Chiplet designs address these challenges by partitioning large dies into smaller parts (typically multiple core-complex dies and an I/O die) linked via high-bandwidth physical fabrics (PHY). As bandwidth and wiring density scale, however, these short-reach links are pushed closer to their signal-integrity limits, increasing susceptibility to noise, crosstalk, and channel loss, motivating stronger link-level reliability mechanisms such as forward error correction"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"2607.24221","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"integrity":{"clean":true,"summary":{"advisory":0,"critical":0,"by_detector":{},"informational":0},"endpoint":"/pith/2607.24221/integrity.json","findings":[],"available":true,"detectors_run":[],"snapshot_sha256":"c28c3603d3b5d939e8dc4c7e95fa8dfce3d595e45f758748cecf8e644a296938"},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}