{"paper":{"title":"Tritium and helium analyses in thin films by enhanced proton backscattering","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"nucl-ex","authors_text":"Jing-Jun Zhu, Li Mao, Man-Tian Liu, Tao Fu, Zhu An","submitted_at":"2013-10-14T11:10:37Z","abstract_excerpt":"In order to perform quantitative tritium and helium analysis in thin film sample by using enhanced proton backscattering (EPBS), EPBS spectra for several samples consisting of non-RBS light elements (i.e., T, 4He, 12C, 16O, natSi), medium and heavy elements have been measured and analyzed by using analytical SIMNRA and Monte Carlo-based CORTEO codes. The CORTEO code used in this paper is modified and some non-RBS cross sections of proton scattering from T, 4He, 12C, 14N, 16O and natSi elements taken from ENDF/B-VII.1 database and the calculations of SigmaCalc code are incorporated. All cross s"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1310.3629","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}