{"paper":{"title":"Impact of Electrostatic Forces in Contact Mode Scanning Force Microscopy","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.mtrl-sci","authors_text":"\\'A. Hoffmann, E. Soergel, F. Johann","submitted_at":"2010-09-09T22:25:48Z","abstract_excerpt":"In this $\\ll$ contribution we address the question to what extent surface charges affect contact-mode scanning force microscopy measurements. %\nWe therefore designed samples where we could generate localized electric field distributions near the surface as and when required. %\nWe performed a series of experiments where we varied the load of the tip, the stiffness of the cantilever and the hardness of the sample surface. %\nIt turned out that only for soft cantilevers could an electrostatic interaction between tip and surface charges be detected, irrespective of the surface properties, i.\\,e. ba"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1009.1905","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}