{"paper":{"title":"The tearing mode instability of thin current sheets: the transition to fast reconnection in the presence of viscosity","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"physics.plasm-ph","authors_text":"Anna Tenerani, Antonio Franco Rappazzo, Fulvia Pucci, Marco Velli","submitted_at":"2014-11-28T22:58:58Z","abstract_excerpt":"This paper studies the growth rate of reconnection instabilities in thin current sheets in the presence of both resistivity and viscosity. In a previous paper, Pucci and Velli (2014), it was argued that at sufficiently high Lundquist number S it is impossible to form current sheets with aspect ratios L/a which scale as $L/a\\sim S^\\alpha$ with $\\alpha > 1/3$ because the growth rate of the tearing mode would then diverge in the ideal limit $S\\rightarrow\\infty$. Here we extend their analysis to include the effects of viscosity, (always present in numerical simulations along with resistivity) and "},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1412.0047","kind":"arxiv","version":2},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"}