{"as_of":"2026-08-20T11:41:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:1a67f7ede7ccb82825c4527e56b69f9ed9e398b5705a1bef4e90a30cc611e621","coverage":[{"denominator":0,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":1,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-20T06:33:59.587034+00:00","state":"measured"},{"denominator":1,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":1,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-15T16:07:18.135582Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"pith","source_observed_at":"2026-08-15T16:07:18.598672Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"2304.11325","last_updated":"2023-04-22T05:36:12Z","snapshot_observed_at":"2026-08-20T05:20:21.576952Z","submitted_at":"2023-04-22T05:36:12Z","title":"Deterministic identity testing paradigms for bounded top-fanin depth-4 circuits","version":1},"cited_work":{"arxiv_id":"2304.11325","doi":null,"metadata_source":"pith","pith_arxiv_id":"2304.11325","snapshot_observed_at":"2026-08-15T16:07:18.598672Z","title":"Deterministic identity testing paradigms for bounded top-fanin depth-4 circuits","venue":"cs.CC","work_id":"2c8cb937-9522-4a26-afe5-2700eca0ec13","year":2023},"citing_paper":{"arxiv_id":"2509.21536","last_updated":"2026-08-02T07:29:15Z","snapshot_observed_at":"2026-08-15T15:44:24.993601Z","submitted_at":"2025-09-25T20:22:43Z","title":"A weak regularity lemma for polynomials","version":4},"reference_index":5,"source":"arxiv_source","source_observed_at":"2026-08-15T16:07:18.135582Z"},"links":{"cited_paper":"/paper/2304.11325","citing_paper":"/paper/2509.21536"},"observation_digest":"sha256:8cf8b015d0d380c3f5dcb58545b244ebd11bc43403cb66bc1f37e0a70a41dbf7","observation_id":"7bcd9d28-fada-4864-bd73-d8855a417ade","resolution":{"observed_at":"2026-08-15T16:07:18.604067Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}}],"links":{"evidence":"/evidence","html":"/paper/2304.11325/citation-record","integrity":"/paper/2304.11325/integrity","json":"/paper/2304.11325/citation-record.json","paper":"/paper/2304.11325"},"outbound":[],"paper":{"arxiv_id":"2304.11325","last_updated":"2023-04-22T05:36:12Z","latest_version":1,"primary_category":"cs.CC","snapshot_observed_at":"2026-08-20T05:20:21.576952Z","submitted_at":"2023-04-22T05:36:12Z","title":"Deterministic identity testing paradigms for bounded top-fanin depth-4 circuits"},"reference_resolution":{"displayed":0,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":0,"verified_exact":0,"verified_fuzzy":0},"total_outbound_references":0},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"thesis":"As of 20 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:2304.11325."}