{"as_of":"2026-08-20T21:00:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:9f655e4fa14d3a160522b75c40bc43f3fee44553c7c54165b0dbbddbfb129623","coverage":[{"denominator":31,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":31,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-10T22:11:40.061821Z","state":"measured"},{"denominator":33,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":33,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-20T06:33:59.587034+00:00","state":"measured"},{"denominator":2,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":2,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-07T05:12:30.395937Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"pith","source_observed_at":"2026-08-06T19:12:16.072393Z","state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2501.03283","snapshot_observed_at":"2026-08-07T05:12:30.395937Z","title":"2025, arXiv e-prints, arXiv:2501.03283,","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2506.08751","last_updated":"2025-07-04T18:58:45Z","snapshot_observed_at":"2026-08-13T11:14:37.904451Z","submitted_at":"2025-06-10T12:45:43Z","title":"XRISM insights for interstellar Sulfur","version":2},"reference_index":60,"source":"pdf_text","source_observed_at":"2026-08-07T05:12:30.395937Z"},"links":{"cited_paper":"/paper/2501.03283","citing_paper":"/paper/2506.08751"},"observation_digest":"sha256:419237765380e33164ed5799a558d9054088717a83897cb8a0d1b047a620de09","observation_id":"20d7e670-eb64-468a-97ab-8d135e72ea66","resolution":{"observed_at":"2026-08-07T05:12:30.395937Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"cited_work":{"arxiv_id":"2501.03283","doi":null,"metadata_source":"pith","pith_arxiv_id":"2501.03283","snapshot_observed_at":"2026-08-06T19:12:16.072393Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","venue":"astro-ph.IM","work_id":"cc6ee64c-92b4-4ffc-b558-d7f3f1c6cf14","year":2025},"citing_paper":{"arxiv_id":"2507.06289","last_updated":"2025-07-08T18:00:01Z","snapshot_observed_at":"2026-08-11T18:02:06.504649Z","submitted_at":"2025-07-08T18:00:01Z","title":"The Structure of the Relativistic Fe Line in GX 340+0 as Viewed with XRISM/Resolve, NICER, and NuSTAR","version":1},"reference_index":56,"source":"pdf_text","source_observed_at":"2026-08-06T19:12:15.711837Z"},"links":{"cited_paper":"/paper/2501.03283","citing_paper":"/paper/2507.06289"},"observation_digest":"sha256:9dee62c685ec69b2f4cfc60c5f337141c12829526e3022eff30396a6d0d65469","observation_id":"e5c22793-d567-4306-8498-7583c7a95d1a","resolution":{"observed_at":"2026-08-06T19:12:16.082077Z","resolver_source":"local_arxiv","status":"metadata_mismatch"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}}],"links":{"evidence":"/evidence","html":"/paper/2501.03283/citation-record","integrity":"/paper/2501.03283/integrity","json":"/paper/2501.03283/citation-record.json","paper":"/paper/2501.03283"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:41.274380Z","title":"McCammon, S","venue":null,"work_id":"b78bf290-ca28-4caf-89e2-4ada6413c9ea","year":1984},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":1,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.745374Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:eb3736c6b766e744657b55dad374eae00da9d802d470514040336c9283f709fb","observation_id":"df3f4430-58aa-450d-82c6-43a7fbeff6b8","resolution":{"observed_at":"2026-08-10T22:11:41.283545Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:41.234905Z","title":"Tashiro , H","venue":null,"work_id":"5e1f259e-a541-4a8d-89d7-9294665cb1ba","year":2020},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":2,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.752192Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:82241fd0bca8c6f73d80393ba23272a667f4fc2ccb7478892734e380a02de615","observation_id":"9d9f3458-2172-451b-ae13-b7288e15d696","resolution":{"observed_at":"2026-08-10T22:11:41.245318Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:41.182238Z","title":null,"venue":null,"work_id":"f158f7cf-8711-4891-a995-208525eadc8b","year":1999},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":3,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.760998Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:187aa6f148b28db21a09648317919139babba983bcaa34e9193989b2cc0eddc1","observation_id":"e5fb2d59-602f-49d8-938b-17488adf7e8c","resolution":{"observed_at":"2026-08-10T22:11:41.194811Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:41.124750Z","title":"Tsujimoto , T","venue":null,"work_id":"d7845f7b-b0c8-4de2-98d2-98d2e62dc942","year":2018},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":4,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.766714Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:01eecbdce82583963892bff8c09cf231e8f4534fbd8338e476f32b4d81bec1f5","observation_id":"c90dc1b8-6db1-4215-b8e8-8f1beb6d7c61","resolution":{"observed_at":"2026-08-10T22:11:41.150485Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:41.065749Z","title":"Mitsuda et al","venue":null,"work_id":"5608464a-26f3-470b-ab2b-f1f97355da88","year":2014},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":5,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.772489Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:7652bebf2b0b1f77c453221de32bdeafbe0de098b184fee5694b200ed22bbd9b","observation_id":"cdbeac40-827b-41af-8845-4f1655b2798c","resolution":{"observed_at":"2026-08-10T22:11:41.071621Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:41.043000Z","title":"Takahashi et al","venue":null,"work_id":"2f8ce643-97e0-4347-954a-ec71329cc86c","year":2018},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":6,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.777054Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:627f8e9c3bbf9675fe5210669393dbff724530518925f62d7a9dbd7dd1be5314","observation_id":"1b93baa6-1e1f-410f-9aee-5a05b525ef84","resolution":{"observed_at":"2026-08-10T22:11:41.052101Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:41.011409Z","title":"Ishisaki , R","venue":null,"work_id":"d4ca1fd8-5940-4570-b295-6347ea992421","year":2022},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":7,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.787925Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:5b8e32c6cc080d7a8518388e496f1f6813625febb2e62ede0d41ba3125b2a55a","observation_id":"c17a5a3c-4a00-42c6-8e90-0fa0dee325f1","resolution":{"observed_at":"2026-08-10T22:11:41.025870Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.989641Z","title":"Sato , Y","venue":null,"work_id":"8688ab50-63b7-48be-a736-0016cea40206","year":2023},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":8,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.792147Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:0886d5eb537724b6b18f283d08af1e5f20688c9bd78cb19f603574c4ae939b56","observation_id":"19e90ec7-7823-425d-b0ea-112d4bec3b54","resolution":{"observed_at":"2026-08-10T22:11:40.996905Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.969946Z","title":null,"venue":null,"work_id":"bc1d9f6b-2bd2-43a1-b05b-ef5611112b4d","year":2025},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":9,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.804750Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:8b1becb13d61375dc2dbc455287bd0cf0f8614a1f6de1d48e05e91f38b4ded57","observation_id":"0684c5d3-38ba-4077-91d5-1befa083cfbd","resolution":{"observed_at":"2026-08-10T22:11:40.976101Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.939526Z","title":null,"venue":null,"work_id":"1c01eed8-ba74-452a-8565-9193354b755e","year":2022},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":10,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.815373Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:dc481baf29a0633f90121f2d10c77cfd2a0e199250e0ff7e8951938245db9ef4","observation_id":"13d760f8-aa45-467e-a833-a0882a07c667","resolution":{"observed_at":"2026-08-10T22:11:40.956598Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.915105Z","title":"Willingale , B","venue":null,"work_id":"5df8fdba-b1ab-4627-965a-4573e726b69e","year":2001},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":11,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.821332Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:767de0c2171ec6d71a51bc8078202a6fa6e12de034f74a58420b270d6758c02a","observation_id":"eea4da38-e138-48ef-be82-05ac441dba1c","resolution":{"observed_at":"2026-08-10T22:11:40.922234Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.887615Z","title":null,"venue":null,"work_id":"6fe78a0d-b185-43ab-a1cc-fffcb372b43f","year":2018},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":12,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.833776Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:569e231404452439ea49b0460172d530a7a6c58f4871b4a2369639f619bf134c","observation_id":"f560d144-ac30-4440-bc96-317acd070452","resolution":{"observed_at":"2026-08-10T22:11:40.894486Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.862068Z","title":null,"venue":null,"work_id":"a10fd187-2495-47d0-afe8-d25c03f2caaa","year":2018},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":13,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.839145Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:5c7749fd8ccfb2af8f2ae744284a9a0c552f5271f3a66e1b094558774bf03000","observation_id":"0cf2c048-156c-4747-8700-0d74a454e068","resolution":{"observed_at":"2026-08-10T22:11:40.868097Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.804019Z","title":null,"venue":null,"work_id":"93ddf002-6f62-488e-a58d-b1dd954ddea3","year":2016},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":14,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.843893Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:f1ff2b0fea11bf9cf71acbe8a2480299218fc52bac2adf27fe8f9c64dace98d6","observation_id":"b749f72e-ce7d-41ef-837b-95214dcacd38","resolution":{"observed_at":"2026-08-10T22:11:40.824787Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.782133Z","title":"Ishisaki , S","venue":null,"work_id":"c9de89c7-515d-4108-a421-6a38ae935e65","year":2018},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":15,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.853859Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:8ac8b854dde595206ca5202edd861d67025e080192fdd327a37eb6dc4057bd05","observation_id":"62454af2-7cb6-4789-a869-5384b42944a2","resolution":{"observed_at":"2026-08-10T22:11:40.788483Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.724683Z","title":null,"venue":null,"work_id":"33e6bf7e-8220-434e-8b18-7837489f4e3b","year":2016},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":16,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.863630Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:cae413be29b6e43d38d977f6af1ab3939a50ce61313b0e193b147e548cbb8013","observation_id":"88977386-df0a-42fb-bb16-cc11711e6002","resolution":{"observed_at":"2026-08-10T22:11:40.735877Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.662412Z","title":null,"venue":null,"work_id":"bf8c74e6-55ba-4c07-9cb6-5ed961604723","year":2025},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":17,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.883781Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:aad3afa172d5092915bc95afecfa01be9af8652d716754a6957d4874b864e187","observation_id":"d1628241-27c6-4cac-9d8a-f5d029343f44","resolution":{"observed_at":"2026-08-10T22:11:40.710029Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.636130Z","title":"Cucchetti , M","venue":null,"work_id":"57d28764-9fc8-401d-a050-41adb9a8bf41","year":2018},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":18,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.907570Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:7023c123a9573f268666a6250fbe4177c42fbcbf4c08c06113453fe44f1d3695","observation_id":"7763d765-3ced-48a7-a167-53bc789e5b62","resolution":{"observed_at":"2026-08-10T22:11:40.647590Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.591460Z","title":null,"venue":null,"work_id":"293c719a-9c8b-4ede-95b8-2f9b2477a310","year":2023},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":19,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.915995Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:50ba63303605fdb7ce57294069dc27881c6f45da642f1f27c9693859955b17dc","observation_id":"f7448ed8-7ede-4d71-bfb0-b54f10e6fdd2","resolution":{"observed_at":"2026-08-10T22:11:40.615031Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.546882Z","title":"Cucchetti , S","venue":null,"work_id":"0d1698c5-f4cd-4916-b5f0-04907fcaa8e2","year":2024},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":20,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.922489Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:548c4f803fc0879b718d93b0ddc763121f3005ec7241a2477c430ba5b22aea68","observation_id":"2cc22832-f0d8-4dd0-8a08-56efbb68fb5a","resolution":{"observed_at":"2026-08-10T22:11:40.559786Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.517961Z","title":null,"venue":null,"work_id":"4c9c3843-c66c-45fd-b8bb-2cf0056863c8","year":2025},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":21,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.927839Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:77969ecf498b77729df85cc2a0508bcbc0adb8f536425a2d13a4ac016eb2c97e","observation_id":"d34d9d75-ea3a-4bf0-b53b-26e78014d13e","resolution":{"observed_at":"2026-08-10T22:11:40.528495Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.469527Z","title":null,"venue":null,"work_id":"a3c1d21f-f0c4-400b-838a-6d14298f02e2","year":2018},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":22,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.956090Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:1ddc84522ddf6b835b63bd151c5b1697f8e380273c91324b7eecc7d4ccefa596","observation_id":"38c84ab5-c8a2-4ac4-8483-22228d3348b8","resolution":{"observed_at":"2026-08-10T22:11:40.491924Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.425128Z","title":"Terada et al","venue":null,"work_id":"0987b102-b82f-473b-9983-a674e46eb12a","year":2021},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":23,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.962769Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:e904c80660736ef9664e9691ae0ade36a49284e56ec091558085389d8937683a","observation_id":"411fb74b-083b-4440-a68b-d4418bbec54b","resolution":{"observed_at":"2026-08-10T22:11:40.443105Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.372531Z","title":"Loewenstein , R","venue":null,"work_id":"9ca633c7-53e6-425e-9e14-43d2edea28d3","year":2020},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":24,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:39.994836Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:64cf1a99994dc66b1e76e5cb8bfac1144883cd5bfa6e32714b2553e424ecbd48","observation_id":"615d4fc8-07d6-48ef-acd8-b1b8f86e38b7","resolution":{"observed_at":"2026-08-10T22:11:40.395798Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.331150Z","title":null,"venue":null,"work_id":"381eadcf-d255-4aa4-8e9b-9fb2e658a31c","year":2016},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":25,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:40.007755Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:a64726208e5e3ec650504e348515c7dc595df54acff5511e71129c6ab5fb007b","observation_id":"c1ed7a1b-f17d-4599-8e9c-63604fe35c1a","resolution":{"observed_at":"2026-08-10T22:11:40.340860Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.287671Z","title":"Mochizuki, M","venue":null,"work_id":"b7843179-b7ea-465a-85e6-1534ea3a372e","year":2025},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":26,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:40.013107Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:e9c02b35399524b5a3e0400fd2a50278a588fcb781503efacdd70653cc9f5c7e","observation_id":"40a244d9-4e51-4836-b477-9b86c2885d4e","resolution":{"observed_at":"2026-08-10T22:11:40.293674Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.264380Z","title":"Okajima et al","venue":null,"work_id":"7c1779c2-405e-4deb-b4a0-206d13839812","year":2016},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":27,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:40.026711Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:deae14a87465fbfba95cba205bf3ea0d12d5b32140eea1e26e74a9eab914143f","observation_id":"d952c2d7-1396-4044-acff-b36cfffa9d31","resolution":{"observed_at":"2026-08-10T22:11:40.270445Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.232460Z","title":"Iaria , T","venue":null,"work_id":"e5242188-ad64-4dbb-94ea-ad544b306f85","year":2014},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":28,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:40.038872Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:f956123f973861e148bfd53147afd00ba9884ea0fbb7371d314933327b038b57","observation_id":"387939b6-7124-4fed-86ea-fdc9a8257b2f","resolution":{"observed_at":"2026-08-10T22:11:40.247278Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.153683Z","title":"Sidoli , A","venue":null,"work_id":"41ffb81e-1908-4e9a-ab44-90d63b192b87","year":2002},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":29,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:40.049879Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:d68bd7c862ddbee062227563b9e58b82ed308145065e89679cb79b494087dd37","observation_id":"2c3d4830-1aba-4226-b96e-d3ca3b49ec16","resolution":{"observed_at":"2026-08-10T22:11:40.174519Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.125053Z","title":"Tomaru , C","venue":null,"work_id":"6a054aec-427b-4c60-a433-acbe40facd29","year":2020},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":30,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:40.056002Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:a73d632f94a6e5b8666289d97b78603f5ea1d47e53586c2226f311a62977b78b","observation_id":"a0ecff23-b676-4276-a270-70ee02009beb","resolution":{"observed_at":"2026-08-10T22:11:40.138467Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T22:11:40.061821Z","title":"write newline","venue":null,"work_id":null,"year":null},"citing_paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test","version":1},"reference_index":31,"source":"arxiv_source","source_observed_at":"2026-08-10T22:11:40.061821Z"},"links":{"citing_paper":"/paper/2501.03283"},"observation_digest":"sha256:f329a2cedfd177a07ec9d55918925342fba6bd5b775411bdb37af20d8d944436","observation_id":"9e7e4855-21a7-4f99-9bed-3210a498ed9d","resolution":{"observed_at":"2026-08-10T22:11:40.061821Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}}],"paper":{"arxiv_id":"2501.03283","last_updated":"2025-01-06T02:14:47Z","latest_version":1,"primary_category":"astro-ph.IM","snapshot_observed_at":"2026-08-20T09:21:14.494596Z","submitted_at":"2025-01-06T02:14:47Z","title":"High count rate effects in event processing for XRISM/Resolve x-ray microcalorimeter: I. Ground test"},"reference_resolution":{"displayed":31,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":13,"verified_exact":0,"verified_fuzzy":18},"total_outbound_references":31},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-20T06:33:59.587034+00:00","source":"crossref"},{"observed_at":"2026-08-20T06:33:54.927442+00:00","source":"retraction_watch"}],"thesis":"As of 20 August 2026, this Paper Citation Record lists 31 of 31 outbound references and 2 inbound Pith citation observations for arXiv:2501.03283."}