{"as_of":"2026-08-15T02:57:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:6b73242a1d04c95e4ffba1f7398cc58aaec1076b45e607bd63dd2f11bfd3db9f","coverage":[{"denominator":28,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":28,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-09T05:13:03.494916Z","state":"measured"},{"denominator":28,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":28,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-14T06:32:32.682623+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2502.03318/citation-record","integrity":"/paper/2502.03318/integrity","json":"/paper/2502.03318/citation-record.json","paper":"/paper/2502.03318"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.870836Z","title":null,"venue":null,"work_id":"5322583a-97ba-4a7f-aee1-d135dc56437f","year":2023},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.006073Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:a6d724f12d5babc3b27d9e735e34f880468c6202c203a7805a675bc260b8c2cd","observation_id":"9f20e6c5-9f58-477f-b668-a7e9f1cfd69c","resolution":{"observed_at":"2026-08-09T05:13:03.874657Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.857558Z","title":null,"venue":null,"work_id":"fa025f80-74ff-477f-a5d2-e608d7cdb113","year":2015},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.048348Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:37d81a68628124923b30114c3b6ddd8c94be84b72144204f66f3cf5d94b75b62","observation_id":"66ea32fb-9316-4b28-87b8-3a2090787b41","resolution":{"observed_at":"2026-08-09T05:13:03.862955Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.844872Z","title":null,"venue":null,"work_id":"4178c2ce-548b-482d-9a8c-8ae514509f6c","year":2018},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.090711Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:83bb893155f051afd6b3d23ba881a777d26707992f1245b684042fd383d65062","observation_id":"c67801ef-87a7-451a-a2ba-e76078c487e3","resolution":{"observed_at":"2026-08-09T05:13:03.848981Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.833221Z","title":null,"venue":null,"work_id":"4957320c-ac0c-4cd6-b3ed-e83a864cc5a1","year":2019},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.130025Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:57346c7f24e06fd74141d9b98846f94ed5b074c0ecbdd51221bbae46a15189a5","observation_id":"61051cf0-ff02-479d-b7b5-66a4b9e9cacd","resolution":{"observed_at":"2026-08-09T05:13:03.837234Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.821409Z","title":null,"venue":null,"work_id":"5fe92722-61b2-4601-b523-739a2b57a1cb","year":2021},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.188332Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:238a7e09e907891e65d5e405ee165549ef5023ce73eadd3e41b85f6ce72708d1","observation_id":"9480f5d4-2468-415f-a121-4cf4f57acc28","resolution":{"observed_at":"2026-08-09T05:13:03.825342Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.809916Z","title":null,"venue":null,"work_id":"0249a15c-77a7-4bd4-97cc-8df548356977","year":2022},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.193978Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:434a9008abafcd9004589b980b094971e940d82fbc8d831c1cd72aae7e261cbd","observation_id":"2c8f2f96-672b-4087-b777-5d2a6d92dd14","resolution":{"observed_at":"2026-08-09T05:13:03.813771Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.798169Z","title":null,"venue":null,"work_id":"dc8794ec-1abd-4721-9ad4-41eaef6f214a","year":2023},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.199439Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:c31cee512bf88a272e96e4f334a37036071cba2d6e9563ff437f91f0294fb7ca","observation_id":"8014e496-9cef-49aa-bc83-f5a5864cb729","resolution":{"observed_at":"2026-08-09T05:13:03.802551Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.787653Z","title":null,"venue":null,"work_id":"118e2e2a-30ae-4d66-b614-2ff8b0b7a5c6","year":2022},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.204451Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:0b1b846691a1e2e432849777f6e5788491083ce1e5dcf56b4a600d43dd0e16f7","observation_id":"29c2a1d7-c49a-4300-95c3-091d8d91a9ad","resolution":{"observed_at":"2026-08-09T05:13:03.791088Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.776299Z","title":null,"venue":null,"work_id":"b28b8363-842f-4b89-ab9b-0a1026f1eabd","year":2017},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.208960Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:490640a703250fe6b3f8fe4a0ea7e8a226798bf47e9c6ef7b2918a906fe7f771","observation_id":"fdd83f12-2e93-4545-886b-af3f0d05cd2d","resolution":{"observed_at":"2026-08-09T05:13:03.780169Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.763969Z","title":null,"venue":null,"work_id":"57e33791-7c6a-431a-aee7-87f1a6499516","year":2022},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.212963Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:47f43ebb4d3e0143635a533978d13d17246f410d62e3368e18868f602600caf4","observation_id":"ee5fff2c-19db-47c8-a4f7-d5d4fa847fb7","resolution":{"observed_at":"2026-08-09T05:13:03.767903Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.752200Z","title":null,"venue":null,"work_id":"42bc51c4-7314-4360-837f-23ee99c6a229","year":2020},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.216753Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:c432b96016bfe9706b563ac326e5280fd35adc85f8ff9cb61327d2ee8c10b79d","observation_id":"45959738-d3b1-4031-b302-d5f0459fe7d3","resolution":{"observed_at":"2026-08-09T05:13:03.756097Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.739821Z","title":null,"venue":null,"work_id":"3a0e1ced-0057-4e91-8080-43711c052af4","year":2023},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.220918Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:297947dbb3001fa8e8003726f4bce789baaf96dcec5414efdf9160db6054b73f","observation_id":"5224ee64-26e9-401f-b3dd-cf1a23292172","resolution":{"observed_at":"2026-08-09T05:13:03.743965Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.726421Z","title":null,"venue":null,"work_id":"249e0053-af01-4542-8a98-7308d04c5003","year":2024},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.224849Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:af8e507b8d245c4256034cbaed2903a6aa1270d4be069176dfde75b2c5dea49d","observation_id":"9bf6be9d-e4a8-4909-9959-9636fc942f0d","resolution":{"observed_at":"2026-08-09T05:13:03.730848Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.713645Z","title":null,"venue":null,"work_id":"49c0658f-7c9b-4ac0-8ba6-43825fec53b0","year":2024},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.231180Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:2d9547cc5f134eaf29681b14da270e68ef0555a8575f27bcfe4c9ad182d353db","observation_id":"4f0271b5-518f-4d8d-86f0-e96eb3e097d9","resolution":{"observed_at":"2026-08-09T05:13:03.717601Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.703208Z","title":null,"venue":null,"work_id":"a7305acd-d24e-49d8-8eb0-c4aea9137377","year":2015},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.236684Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:c7bc0de554d73232fb20da3dc6840e60bbf453b2a71202bb605309b65a749994","observation_id":"f6a2488d-2c23-463c-bbd1-a77cc0767d28","resolution":{"observed_at":"2026-08-09T05:13:03.706836Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.691043Z","title":null,"venue":null,"work_id":"87026ce2-ccd4-4fcd-a465-11dd31c0a011","year":2023},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.241781Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:bb35eefbde891ab1efe86079807c2be27f0599c8cf61d6f45d81f0013b01635e","observation_id":"f2676cb9-f140-4df7-b716-6dc7d5c37475","resolution":{"observed_at":"2026-08-09T05:13:03.695068Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.678675Z","title":null,"venue":null,"work_id":"d26456c8-722f-4fdc-be5c-b0ed4e64e8e4","year":2018},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.247486Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:b85f6b2d877dd2534a4b1f18590b41e49d8ce9e9b3ded89ba9c7e4109e085546","observation_id":"756925eb-516e-4e03-a790-350c66e5a1a3","resolution":{"observed_at":"2026-08-09T05:13:03.682892Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.663499Z","title":null,"venue":null,"work_id":"9c312b25-552e-4d41-b013-71a49ad054b5","year":2018},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.251749Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:7cd0d0a885f5d20ba38c28ebd7c062c9a47078f80ab62830076842a95cf2e93b","observation_id":"54351e65-689f-4f36-934a-7422f2123f1c","resolution":{"observed_at":"2026-08-09T05:13:03.668446Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.649601Z","title":null,"venue":null,"work_id":"3d6bff25-e3cc-4c6a-a9e0-4dcb7d55178b","year":2010},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.255681Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:a6e6855ae0af32ed16d8c2a1dd2a3c82a1ba930bcd4a58870fa293f86dcda365","observation_id":"ca4eb739-fb2e-4c14-950f-bcd8ff4d05e8","resolution":{"observed_at":"2026-08-09T05:13:03.654285Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.636274Z","title":null,"venue":null,"work_id":"b997e39c-c494-4252-ae45-4aa88de3f200","year":2022},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.259814Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:d0856160951d3772fdecc1d20e970aaf6b0393c740a5ce4ec709f927afda6c12","observation_id":"cdd08c5e-12b2-41a2-b280-46d221c479ad","resolution":{"observed_at":"2026-08-09T05:13:03.640701Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.622554Z","title":null,"venue":null,"work_id":"b4175e8c-dc8e-4721-9246-79aa6c1fb4d3","year":2019},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.263519Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:1a04ab2764434be5bd5180caf781ddceed18ee7a6096cd058a9bc5347ca506df","observation_id":"2ecc92ad-8858-41d4-97c2-70126e4acdae","resolution":{"observed_at":"2026-08-09T05:13:03.627504Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.609753Z","title":null,"venue":null,"work_id":"a3f7dbf3-14c5-4cdc-ab05-21b176864a8d","year":2020},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.267439Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:28ab303a8c6ec57a37134f7e05c8293c01c3b5a1c75419e87766f1d5b607c313","observation_id":"21309d99-030a-462b-b394-731dea900cda","resolution":{"observed_at":"2026-08-09T05:13:03.614216Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.596705Z","title":null,"venue":null,"work_id":"4bb9e343-63b2-4578-af38-03595876f0aa","year":2017},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.324073Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:935c8476cbca7738bd5f958a056345ad1d911bc450c05c889e2c626eb3d19f7c","observation_id":"e93a555d-25d2-4e6c-ae94-7f41297925ab","resolution":{"observed_at":"2026-08-09T05:13:03.601025Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.576075Z","title":null,"venue":null,"work_id":"327c25a7-9392-4065-9d26-69b8202a72b4","year":1996},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.385793Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:6700abddd469d8ac69cbff2197c27d49248341a6eb727f3b40202e4866f16d93","observation_id":"18be79e8-7934-41ee-968e-3be9394b4ed3","resolution":{"observed_at":"2026-08-09T05:13:03.587928Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.563863Z","title":null,"venue":null,"work_id":"563a3de7-76ff-494f-93ef-b84f42cc8f1b","year":2013},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.448419Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:2438b65651d4a63c87d7911cf236e66c205ef80cce009d151b4e1d9ef2774b0e","observation_id":"c290a200-37f4-4da0-8e07-b1cdc22c0f7f","resolution":{"observed_at":"2026-08-09T05:13:03.567453Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.550416Z","title":null,"venue":null,"work_id":"0e0baf1b-404e-403c-9372-51755bdb5889","year":2018},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.487257Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:1f50b75b31e24d880db92e59b47e2e3f70a514c5bd1f0b3456bf0a63a89b5909","observation_id":"c7902568-a7fa-4d0a-8538-6cd820abece2","resolution":{"observed_at":"2026-08-09T05:13:03.554895Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.537080Z","title":null,"venue":null,"work_id":"d7a1e957-9ff0-4e75-a3ba-d94d6ea1d4f2","year":2018},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.491330Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:a27fa8514104cf398f6a90bf18a53f7727548a27500e72268315ba27012a16dc","observation_id":"175fb2bf-1022-4889-ad42-3a05d7d8a1d0","resolution":{"observed_at":"2026-08-09T05:13:03.541589Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-09T05:13:03.522253Z","title":null,"venue":null,"work_id":"089d9555-d97d-43f9-8182-49533c830fca","year":2020},"citing_paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-09T05:13:03.494916Z"},"links":{"citing_paper":"/paper/2502.03318"},"observation_digest":"sha256:35d2c8fdc4f20d167cadd2554491c63fa1ecc1960bb32d1a9f3faca19cc1ec89","observation_id":"e81e1139-3bcb-48fe-a54b-fec249ca4f60","resolution":{"observed_at":"2026-08-09T05:13:03.527720Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2502.03318","last_updated":"2025-02-05T16:16:19Z","latest_version":1,"primary_category":"cond-mat.mes-hall","snapshot_observed_at":"2026-08-11T19:30:30.614797Z","submitted_at":"2025-02-05T16:16:19Z","title":"Electronic properties and transport in metal/2D material/metal vertical junctions"},"reference_resolution":{"displayed":28,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":28,"verified_exact":0,"verified_fuzzy":0},"total_outbound_references":28},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-14T06:32:32.682623+00:00","source":"crossref"},{"observed_at":"2026-08-14T06:32:18.44784+00:00","source":"retraction_watch"}],"thesis":"As of 15 August 2026, this Paper Citation Record lists 28 of 28 outbound references and 0 inbound Pith citation observations for arXiv:2502.03318."}