{"as_of":"2026-08-10T20:49:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:e8470f7cf2b04906ba0c33e2a3cf6b449b5a27e99f233bfd90c3aa2b8ed9a610","coverage":[{"denominator":36,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":36,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-06T13:38:48.594655Z","state":"measured"},{"denominator":36,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":36,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-10T06:31:04.303077+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2507.20357/citation-record","integrity":"/paper/2507.20357/integrity","json":"/paper/2507.20357/citation-record.json","paper":"/paper/2507.20357"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:56.717026Z","title":"Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach,","venue":null,"work_id":"d487962b-b062-47c5-911d-089c87f78354","year":2015},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:44.193985Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:2f0e59d45ce4d7f37589d31a3de896aea3336b56506aa967fe07ab3c5e1dc09c","observation_id":"48c5f8b7-641a-4549-8c24-7acaf921de6e","resolution":{"observed_at":"2026-08-06T13:38:56.840249Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:56.427812Z","title":"Virtual metrology on semiconductor manufacturing based on just-in- time learning,","venue":null,"work_id":"06a7e606-8969-48de-bb43-5a47cf40c488","year":2016},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:44.303751Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:052db959455f97b7b9eb32cf6f89ee702b347d76a43d8ba01cdf059c2ad78771","observation_id":"d330f317-d289-45e5-966e-27184851c1c7","resolution":{"observed_at":"2026-08-06T13:38:56.560293Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:56.201752Z","title":"Variable selection under missing values and unlabeled data in semiconductor pro- cesses,","venue":null,"work_id":"c0f185a4-df55-4f48-a10e-1a7d6a4febdd","year":2018},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:44.427114Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:31d113b7ce06972f801c6d5cbff93be7467c6aba4960f86217dab1939b8df9b5","observation_id":"3d8de63f-3883-4519-82eb-1807e8520273","resolution":{"observed_at":"2026-08-06T13:38:56.311882Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:55.972120Z","title":"Sequence-aware inline measurement attribution for good-bad wafer diagnosis,","venue":null,"work_id":"9425816d-9591-4c3f-8cbd-46b83c88beed","year":2025},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:44.531366Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:1872d5ced9a4ad1bc4a185d953035f749795d893dad510ef9b7c37cee737ae02","observation_id":"9da73bb3-15aa-488e-9b60-64e5cb53f2bb","resolution":{"observed_at":"2026-08-06T13:38:56.059255Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:55.760513Z","title":"Soft-sensing conformer: A curriculum learning-based convolutional transformer,","venue":null,"work_id":"3e8f837c-6318-4989-a19d-970c3248233a","year":1990},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:44.686018Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:5dab8763eefe3a92e579e691e4f82546df7c6cdbb1ecbd221516c22d5850f353","observation_id":"bbb3a890-c095-43a7-b906-a27f39fa4fb5","resolution":{"observed_at":"2026-08-06T13:38:55.837351Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:55.613795Z","title":"Deep learning-based virtual metrology in multivariate time series,","venue":null,"work_id":"5203338c-4870-4987-82ea-51671d678cf9","year":2023},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:44.861415Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:45870e6d07098e8e84edf6c56c10f8d5b82105e3737894891e0ba0de2115b675","observation_id":"dba9d51b-fcd9-497b-8163-b4a5180161e4","resolution":{"observed_at":"2026-08-06T13:38:55.692051Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:55.346399Z","title":"Deep learning-based sequence modeling for advanced process control in semiconductor manufacturing,","venue":null,"work_id":"fbefc93d-db23-4425-becf-7427eaf0e70e","year":2023},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:45.060506Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:dae58206fd4efbcf7c51c90fb905cd1dfa9a686c2e89c3a005f6fde924c299b0","observation_id":"37e62196-b322-44e4-a17d-f489ba217fa3","resolution":{"observed_at":"2026-08-06T13:38:55.487207Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:55.061038Z","title":"Recurrent feature-incorporated convolutional neural network for virtual metrology of the chemical mechanical pla- narization process,","venue":null,"work_id":"d0d4ea76-c18b-4734-9b90-e78545e09d61","year":2020},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:45.193790Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:fce68e62959ec91a62014f4e73a5b24b421e400717120118c2cc94c57ded33a4","observation_id":"6a034f8c-ae46-44ec-b12a-55a2e45a38ab","resolution":{"observed_at":"2026-08-06T13:38:55.205188Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:54.740829Z","title":"Virtual metrology of material removal rate using a one-dimensional convolutional neural network-based bidirec- tional long short-term memory network with attention,","venue":null,"work_id":"2aad8a18-3a25-41f7-8c41-be46884771e6","year":2023},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:45.328763Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:c5b568e1f834659e4868cbec117c867ca79da1c6753c63260e3c1663932c5c68","observation_id":"ea144d45-1ef8-4a15-aba5-2aa55aca7a5d","resolution":{"observed_at":"2026-08-06T13:38:54.853950Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:54.491919Z","title":"Machine learning assisted new product setup,","venue":null,"work_id":"1fe85373-2aa7-41b3-9305-a828734598b7","year":2020},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:45.444815Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:363f53b52c31f0cfc5b1a6e3050b67e46dd1f8908981a1ccfdf222afae5fd043","observation_id":"5a5b5e78-8820-472c-a93e-1e2749949887","resolution":{"observed_at":"2026-08-06T13:38:54.578452Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:54.253877Z","title":"Using explainable artificial intelligence to improve process quality: evidence from semiconductor manufacturing,","venue":null,"work_id":"52e51a85-ba79-4275-8e0f-14037d81714e","year":2022},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:45.518899Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:c2b974b7cd79dd1e09af11beaedb54b60d032913347c8f66d28e9b8ac6f3fc82","observation_id":"54acb0a7-8b77-4119-ab31-83c88739ada2","resolution":{"observed_at":"2026-08-06T13:38:54.386411Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:54.027101Z","title":"An expandable yield prediction framework using explainable artificial intelligence for semiconductor manufacturing,","venue":null,"work_id":"2fcafdc9-2a98-4ada-a33d-e4fe914df462","year":2023},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:45.655109Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:f384a9d597bbf69de8c95f33c0ee4ffa46726f70bc8482244b187376f11ba810","observation_id":"1e07a5cf-a75e-445a-ade4-4706048e6c3e","resolution":{"observed_at":"2026-08-06T13:38:54.177211Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:53.750195Z","title":"Enhanced yield prediction in semiconductor manufacturing: Innovative strategies for imbalanced sample management and root cause analysis,","venue":null,"work_id":"225766c8-ea9c-48a2-a215-52b9443a6a27","year":2024},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:45.772085Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:efdb268fe60ed99aa8c2a40d4e70dd87a85049c98691b1a73b00accae3458bcd","observation_id":"670b64b2-4b5d-448c-85e4-033980f21b31","resolution":{"observed_at":"2026-08-06T13:38:53.856672Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:53.459182Z","title":"Travel-time prediction using gaussian process regression: A trajectory-based approach,","venue":null,"work_id":"f4a77a8e-451f-4fac-a92d-bbc9b7a3fb4c","year":2009},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:45.839957Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:3c7037c1e8f018b9bc95a9bf8b4dd25cead6ac8ce853ef4003f28200f5b27dd6","observation_id":"d64a75e9-f507-465f-bcc4-812f88f29ddf","resolution":{"observed_at":"2026-08-06T13:38:53.611259Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:53.186087Z","title":"Trajectory regression on road networks,","venue":null,"work_id":"840dbdea-8fd2-4a99-8548-86fc59dc1e5b","year":2011},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:45.916359Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:e7505469dcb375bc6afc8282a13f6dad34dadea75ed3e487c11f97a09eaa8137","observation_id":"c7956e30-b5b5-4d87-927b-431dc529586b","resolution":{"observed_at":"2026-08-06T13:38:53.397431Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:52.836160Z","title":"Root cause analysis in industrial manufacturing: A scoping review of current research, challenges and the promises of ai-driven approaches,","venue":null,"work_id":"2bfb4645-6cba-4122-8e90-4570665cb981","year":2024},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:46.017869Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:14201bba5e96ab4758bc6cc7bb3d48b6478325b78d415ea4bb3ebe30d3945222","observation_id":"0714ae04-53b0-4c3f-905d-f8ff9aa0cd7c","resolution":{"observed_at":"2026-08-06T13:38:53.003029Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:52.533766Z","title":"A fast ramp-up framework for wafer yield improvement in semiconductor manufacturing systems,","venue":null,"work_id":"62da3625-088b-4d96-8cff-ea916a0edd7e","year":2024},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:46.112560Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:7c7b473434513ad4946cbed7c45897642f768372237d7d4261c1111502277f70","observation_id":"dd1af6ff-82a5-436d-9665-44a959c33b9a","resolution":{"observed_at":"2026-08-06T13:38:52.695406Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:52.263795Z","title":"Key feature identification for monitoring wafer-to-wafer variation in semiconductor manufacturing,","venue":null,"work_id":"2e95ea64-5a5e-423d-bad1-af4f767a53c9","year":2022},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:46.318070Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:eb574f80ce7a7b165e851d05172278d0e5402d78eb571b580a5cc9c9490e4e2c","observation_id":"b140d5d5-a8b0-47ee-bfa9-267650731fee","resolution":{"observed_at":"2026-08-06T13:38:52.374821Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:51.941837Z","title":"Improved yield prediction and failure analysis in semiconductor manufacturing with xgboost and shapley additive explanations models,","venue":null,"work_id":"95be100a-cbd4-4797-92dd-e4c3095ed677","year":2024},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:46.483298Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:9f46e7be99682fe15611b944e49a99c4f2e2c599f7a0f5bdc069a5d653793885","observation_id":"928fff11-93d2-4039-9bee-3b4899ecb894","resolution":{"observed_at":"2026-08-06T13:38:52.141145Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:51.713658Z","title":"A novel approach to reducing testing costs and minimizing defect escapes using dynamic neighborhood range and shapley values,","venue":null,"work_id":"e993024d-bfc3-4fa5-8f65-9c9b6a77e221","year":2025},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:46.694962Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:df0ba6f332783ef2dad0518dc9db7242a6821e8151ed579dfcb2dc51b973a485","observation_id":"28794f1d-369f-4cd0-9681-67798341e7ea","resolution":{"observed_at":"2026-08-06T13:38:51.816526Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"1301.3781","last_updated":"2013-09-07T00:30:40Z","snapshot_observed_at":"2026-07-06T03:04:11.148340Z","submitted_at":"2013-01-16T18:24:43Z","title":"Efficient Estimation of Word Representations in Vector Space","version":3},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"1301.3781","snapshot_observed_at":"2026-08-06T13:38:46.796305Z","title":"Efficient estimation of word representations in vector space,","venue":null,"work_id":null,"year":2013},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:46.796305Z"},"links":{"cited_paper":"/paper/1301.3781","citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:c9588b9e93eacc1edcb93a9484b02c967250536e1e066b696eb8d5dd8e2745dc","observation_id":"5605b4bb-f6d4-44dc-84cb-31e9fe8345b3","resolution":{"observed_at":"2026-08-06T13:38:46.796305Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:46.860048Z","title":"Attention is all you need,","venue":null,"work_id":null,"year":2017},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:46.860048Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:db9f8c43a215082de328d2e2d1af04e6a34b304f1a315063b99215ef3108b3c7","observation_id":"3ea370a8-3fa7-4318-8daf-13be6573e524","resolution":{"observed_at":"2026-08-06T13:38:46.860048Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:51.432394Z","title":"Data-driven optimization of accessory combinations for final testing processes in semiconductor manufacturing,","venue":null,"work_id":"f136cc36-149b-4c9f-bcc5-705cf6d7cde6","year":2022},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:46.981031Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:7b21ccb443d7c4ec16f387c6165e1da009e6511f479085a1699ae4ba2fec7c92","observation_id":"b542940c-0fcd-40f7-a705-0fbb85e1ec88","resolution":{"observed_at":"2026-08-06T13:38:51.583970Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:51.188517Z","title":"Graph representation and embedding for semiconductor manufacturing fab states,","venue":null,"work_id":"49d8206f-2f82-4831-95f2-c93b45179c90","year":2022},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:47.096726Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:dfcfb497a052e20b83ae01fe20178d20cc20a34b4d2f1995c67ee7b61f526fb9","observation_id":"6409b7c4-7beb-4b05-80d9-c1fcb14b7911","resolution":{"observed_at":"2026-08-06T13:38:51.285881Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:50.831692Z","title":"Explain- able AI: A brief survey on history, research areas, approaches and challenges,","venue":null,"work_id":"b0b2a3b9-bd36-4ed1-9f9f-72518cecc0f1","year":2019},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:47.176921Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:a16a287ef7665cec0711ca427250741cc5a7d648ebca0f239632bc57b7f7fc3d","observation_id":"d75be7de-0feb-47c2-88ec-6ec388f2b5d7","resolution":{"observed_at":"2026-08-06T13:38:51.044191Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:50.563318Z","title":"A unified approach to interpreting model predictions,","venue":null,"work_id":"384ec3e7-af85-4c4b-9a95-ec309881b556","year":2017},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:47.305328Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:b18480bca88801a404f046d07c2877002c93cc510cd10e22815da1a69ffa0f51","observation_id":"da8907fe-0060-4469-8371-65c6ad3f778c","resolution":{"observed_at":"2026-08-06T13:38:50.699039Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:50.278039Z","title":"‘Why Should I Trust You?’: Explaining the predictions of any classifier,","venue":null,"work_id":"76a9f7ea-fd48-4bcb-9718-e38a1015a16a","year":2016},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:47.421539Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:2075fa8558ec3739285d36dc02a5de24e14dfd978d905e8fee38f2380c157999","observation_id":"bf611b94-f0cc-4e9f-94e7-fdaa2e1f74f5","resolution":{"observed_at":"2026-08-06T13:38:50.390787Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:50.073837Z","title":"Grad-cam: visual explanations from deep networks via gradient-based localization,","venue":null,"work_id":"f5bc6969-8bcb-494e-9d38-ea83c7dad186","year":2020},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:47.569825Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:76b1fa0764bf4c7d10c04b02639dc8f1ee31265ceae4c8eed964bb967e7a738c","observation_id":"2402d4e8-e905-428b-893a-9406372e8862","resolution":{"observed_at":"2026-08-06T13:38:50.181778Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:49.921832Z","title":"Xai for transformers: Better explanations through conservative propa- gation,","venue":null,"work_id":"f93b6a20-edc5-4ac8-a5b9-021a4e62f908","year":2022},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:47.674377Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:8dca4bf18a713a37dae7bbe088ff311035383a4a401014902f2ae23c349128f3","observation_id":"f5385bec-fb56-4fea-a896-c9564037871c","resolution":{"observed_at":"2026-08-06T13:38:50.005892Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"2104.00950","last_updated":"2021-04-02T09:14:00Z","snapshot_observed_at":"2026-08-09T20:28:17.305240Z","submitted_at":"2021-04-02T09:14:00Z","title":"Explainable Artificial Intelligence (XAI) on TimeSeries Data: A Survey","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2104.00950","snapshot_observed_at":"2026-08-06T13:38:47.830805Z","title":"Explainable artificial intelligence (XAI) on timeseries data: A survey,","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:47.830805Z"},"links":{"cited_paper":"/paper/2104.00950","citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:f006998a6fb8639231a1d341097a96f0dc948ef75a8cd639d6dd68c0d3dac94d","observation_id":"7bb23550-8dab-42bc-a4d8-31e8d6d9b226","resolution":{"observed_at":"2026-08-06T13:38:47.830805Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:49.556032Z","title":"Molnar,Interpretable machine learning","venue":null,"work_id":"44ac1d80-87fa-48bd-ae6d-1317a7d6a8a7","year":2020},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:47.945010Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:603ed1689ee3a5d558aae6629e429e69d9284f925d4903acafecd4c4e5b185db","observation_id":"e8ca7ba7-b3c0-4847-939d-6655b66fc1a5","resolution":{"observed_at":"2026-08-06T13:38:49.767636Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:49.333594Z","title":"Generative perturbation analysis for probabilis- tic black-box anomaly attribution,","venue":null,"work_id":"d5348b84-2d6e-4fa2-ad28-38a8cb2f1aad","year":2023},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:48.103717Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:985ba8e1a085666133f4a97b85a199ccbe7227d7e875858e508bdd2240c6b6b4","observation_id":"2f21ce07-9c0b-4ee5-865d-5e51cdda2049","resolution":{"observed_at":"2026-08-06T13:38:49.436822Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:49.130027Z","title":"Text classification using string kernels,","venue":null,"work_id":"7747e987-2f33-4827-bd5f-273f864ab9d3","year":2002},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:48.240948Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:cea165f80e8525fe878d66e8117c76f5a7ad607f07b1ba6d0f30d9849777cd5b","observation_id":"2ee4758d-f4d2-425b-9cbc-053e780af61a","resolution":{"observed_at":"2026-08-06T13:38:49.219823Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:48.359925Z","title":"Shawe-Taylor and N","venue":null,"work_id":null,"year":2004},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:48.359925Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:350ad5af75be5d931010cab56bc2d14febfdd3f7198d5b38a83f2abae2b86cd9","observation_id":"80d52dcf-39b5-4b04-bc29-d1cb155ad431","resolution":{"observed_at":"2026-08-06T13:38:48.359925Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:48.470649Z","title":"Causal inference using potential outcomes: Design, modeling, decisions,","venue":null,"work_id":null,"year":2005},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:48.470649Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:9f56b49f85638b044fc36eb22e2590e7b338f4117b51591cbc335ffbb2456b25","observation_id":"6dfa65d7-eb44-4cd7-a26f-6af86e2f79fe","resolution":{"observed_at":"2026-08-06T13:38:48.470649Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-06T13:38:48.817546Z","title":"Visualizing data usingt-SNE.,","venue":null,"work_id":"0b948d4c-f874-41bc-a672-4ae2dd54737a","year":2008},"citing_paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression","version":1},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-06T13:38:48.594655Z"},"links":{"citing_paper":"/paper/2507.20357"},"observation_digest":"sha256:f36e8cab88e28f2018df6d38bfbf1ab21a74a64c03e161281468fb556ba95565","observation_id":"d09c7a05-06ce-48a1-ae23-7710a7360403","resolution":{"observed_at":"2026-08-06T13:38:48.964821Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2507.20357","last_updated":"2025-07-27T17:08:40Z","latest_version":1,"primary_category":"cs.LG","snapshot_observed_at":"2026-08-10T04:27:16.042530Z","submitted_at":"2025-07-27T17:08:40Z","title":"Wafer Defect Root Cause Analysis with Partial Trajectory Regression"},"reference_resolution":{"displayed":36,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":5,"verified_exact":0,"verified_fuzzy":31},"total_outbound_references":36},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"thesis":"As of 10 August 2026, this Paper Citation Record lists 36 of 36 outbound references and 0 inbound Pith citation observations for arXiv:2507.20357."}