{"as_of":"2026-08-22T01:09:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:78c617ef702e2f5bc8344d152ddbdd20677cc81c1d927c017d37de3db47d1b69","coverage":[{"denominator":68,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":68,"source":"paper_references, paper_reference_links","source_observed_at":"2026-06-30T04:32:12.099022Z","state":"measured"},{"denominator":68,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":68,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-21T06:32:19.484+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2606.29749/citation-record","integrity":"/paper/2606.29749/integrity","json":"/paper/2606.29749/citation-record.json","paper":"/paper/2606.29749"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2019},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:0b94eacb0e683e498ab7fe127fc64df5b0a2022b1f59652075c2b4584c4f9582","observation_id":"62b9520d-98f2-4a1c-beda-1cad16cd514e","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2020},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:c63205ea67237c1d3072ea0a4581f58b8eb8cb88a547aff22de0a5eb538b63a6","observation_id":"f1764f9a-c48e-4ae4-8074-46a8e0837cba","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:7aa9010c1cd2ba1a221b26ef0c85607e91126f39931e0959f5189c573ede2b82","observation_id":"f267786b-02d4-4081-b946-7663f023234f","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Wilson and B","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:59be942444c52f310fc7682c11944f9a3c2370accdba8f1b6128dabc24e8f79e","observation_id":"a97cf805-613e-4365-8311-703e3b3ccc32","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Zhong, J.-X","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:03e501901eec10c54c9a5f09ff5c2d45cead20dc807ac13b627dd9b03c6d1d0a","observation_id":"f65545bc-8bb5-4570-8d19-272b29f4c81f","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Liang, X","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:827d5df06c7f71a1b23d1ea92b975b18b4bc2c33ec0ef913a622d6ee87b21157","observation_id":"001b94ee-7ae4-4801-bd08-c47d211233c1","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:a1b87ebfa947ffb64b1a572a04cbcb1d4af04abe963c1aeef9add53765e354b5","observation_id":"f2ccc80b-d2eb-4e24-8fca-8205a2861587","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:980c0dbd775e34578300ccff0386619db049a45ee1aac5f0e112f4504fdf43ce","observation_id":"24dfe586-6b31-43be-a4d4-3b4b6c033604","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Jiang, J.-X","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:a484e1e22b0b6359b88f21fed77e99314edf338d5843686690137ccda109a8e7","observation_id":"1e99a401-9625-4ecd-8fa8-625cdba31e92","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:3f986a16291707dc7c99179667704ef4c99fc2565f992f1022f3f7f42bd5e1e8","observation_id":"ad14884a-de2b-4442-ab04-d921821b29ee","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Mielke III, D","venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:b3e4f7360b3a56ae6a6fe806528642edf2478db47aba781529002fc07a6fe330","observation_id":"6a879de9-af32-4c82-8646-87162829ce5f","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:f7e4cb8e688ca1160361ab50d65f0a3ca04cab264c27461628fe9cbce6e41775","observation_id":"7c953cac-9740-446b-a795-51fb002a81e7","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Nakayama, Y","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:81b673eed793a16b46cd027d34e7e7bc89998e506a8fac8f8ad9453cc49d972b","observation_id":"72e813c5-6f7a-4e3c-aa5b-9dc8132f904d","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:fe7692eaf4adc1a3498031c206d73e0346b67fadf18f1eef3fd2f0365cb93b19","observation_id":"94b3b8f6-1eaf-4721-9e0b-b3da14a3a4b0","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:0d7ae307d50a06a8895b13bb3dc0a013a8058ee902c0fe6868bcbe3263eae0ae","observation_id":"8e287925-2452-473b-ab29-350b532057f6","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:f4f9af81e7126bfb7f097e9556ddb7af09f21d17a36bd42d2d28a1388db2c8df","observation_id":"cf0f0bd7-ebc8-4078-bb1c-9ffaa6a16970","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:d7cc4f8c88523e4bb64ffae86e4ed2b3d63496f4a5269031ef7c4a71b5a4a79e","observation_id":"04522fe7-5c78-4f6b-b235-5d747661a7bb","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:ebcb5e094b77f2ca56eb67901b33614438de4501519c02ba13492faae5b10edb","observation_id":"75d93e59-2b92-4bb2-a144-e201adc23202","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:6bc74051b74e5f1e784bdd89f32e2fcba14e7c5f57d541ebb1fc3d999e3f0eeb","observation_id":"ac9a88b2-eb82-463c-a997-dffb60d8bf23","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:22b63c663e0b980fa0d7995ca9efa0ce3d173d18a85d915fffa34c79f3728fff","observation_id":"51988a32-4b1e-45d7-b26d-1e795fc88544","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:82d278e8e819141d2d67c4f87d8fccf4766a072150687abd396f462ff8cc8f66","observation_id":"d3f50a04-6c2f-49c6-9564-fd52afc7283d","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:0c15e3d58eea0dd651b71e3b7cd5cb777906346c90edb1dfe0a9fde1ed520481","observation_id":"7b6a8a42-a8d2-4bfb-a203-0a9ba9a244c4","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:a3afb0c269ebc09e55ae85823c8760e137b89c66240de96cc35298d991fd25c4","observation_id":"7590bb66-0ee7-4ef4-8005-c1b5b4c8c446","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:3b173f2eb8b00837aa1ec310e066243cd25a0fcb731b3e8791e443ce1ef72489","observation_id":"fac8b7a9-908f-41c7-8237-3a0b9659027a","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Zheng, Z","venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:e3a6fe060e69a5003115931af7f73d2d1272e1484a8bf3798cfe8fc8a2172274","observation_id":"ac8211ca-b4f6-4084-af4b-7ffb70d2864a","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Zhong, J","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:03f617fe3f127315d22c5b3dd9194c3b13a2d9568363ed7d2a740b59c484136a","observation_id":"894630f3-2ab3-41f8-b5bb-685aeb3a6560","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:89371e4920db952469e85da36b8992a5dec52f68de5762a69eea83463011d944","observation_id":"aa87fda3-d83c-4978-91da-e3a33f784eca","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":null},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:7be41be524a0f9217d14b46ed385c961e006baa68c3a6636e6a582e787a87a01","observation_id":"141feca4-f6b0-4a57-a8a7-74c05d25ebed","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Zhang, Z","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:a9888e5e573a26683a141a5c23af40c3dc8e4096ec324d1973d86d91c045661e","observation_id":"b3819cf6-a0af-439b-9b0c-bfaa2296245f","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:3fcbed46ac64b844e5fc967fb8c1f6ef5d2ef8dab38ad4663ba5aee4d4212461","observation_id":"2ea22c6d-eb1f-47d5-bb4a-a7982c84aaca","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:dcdfc669646284a2d0cda1b41bcc11ec331b877e8549e8c8ee02e4d369e6bab5","observation_id":"4948d235-ead7-4741-9ff7-0e628535dede","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:536b9712291934fe1d50e35cec35b1d2c5ef2178c5f509f1c0f17d2cc97bfaed","observation_id":"c0ac3799-2106-4d67-af2e-42c2a2774622","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Xu, Y.-J","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:d8edc84b68d9f88789e7d64b1d0d76e1a4437fea4d4ee170888178e059e228a3","observation_id":"1308d0e5-9a3a-4e02-8db5-8bc51151a6ad","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Xiang, Q","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:7f100da5e5faa4276914413ba15baa51a87058e20566431dfa5d3dc8a340adce","observation_id":"2de41a56-7ca1-47f0-9114-7b50ddf3db72","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Wulferding, S","venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:27e301b9b4747001fd9780b3898f112cada8770a588757b93373844abbe6e4eb","observation_id":"753d90c3-95c5-4991-a5a9-973f05a5ab83","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:6482be7b6d7d8e5896636ba804ce6b36929ba718199661322ab545f5e3646ffb","observation_id":"2b53f8e7-c2f4-416b-aeb6-77ba75cc3c01","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:dffd482bd9513c88b4bbd638897d9ad9150a3393278058323f8e467904916bc0","observation_id":"eb998c13-0338-489b-aa4c-60753ede7611","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:70f6bea03d11186a2679b7ff2c198c1ae2e01d040a2b5c0726f4eb96b6b9cc6b","observation_id":"6fff5486-d350-48d9-bf2d-61490482c0fa","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Tazai, Y","venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:759a9c2aab00f0c085c57d6ccbc7a0ed768b0436a942961fb29252b87515846c","observation_id":"586bc909-3883-4f02-99d9-dc4b7feb862a","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"LaBollita and A","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:9ba5375b112b77e443f863935e07b0572e7c472123e951d20e90be00f562c934","observation_id":"efaa2355-e67d-41c1-8af1-ddb14149543b","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Subedi, Hexagonal-to-base-centered-orthorhombic 4q charge density wave order in kagome metals KV 3Sb5, RbV3Sb5, and CsV 3Sb5, Phys","venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:a74aef2df493c66d61c7fb7f5a2838a2828474a2a12fcba9db736982c6d66f97","observation_id":"1ee477fc-d006-401c-aae6-e1775c597495","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Bendele, A","venue":null,"work_id":null,"year":2014},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":42,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:45a645c0cab616e82d9f7ac9475d7690981c5107dc6dfa9f67afbedbf45b07b2","observation_id":"045a0428-fea9-40a7-9bd7-57ba05217048","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Mizokawa, M","venue":null,"work_id":null,"year":2016},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":43,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:1047da2feae1c934b342c1e4afb0fcd2cb46a19b6a65e0afb503d90cba5f326f","observation_id":"24d98c5d-b390-4e92-8b11-1071ce383c84","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Mizokawa, A","venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":44,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:fffc6c20580f179c6a92a1642a81074cc5b934c331805ed27be3294a7938541b","observation_id":"244d9754-eea3-4849-9490-b5512c6166ec","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Takegami, K","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":45,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:b19612e00b0e606fb8ad80da061e8445a711e10a9675f0a809c5a0a2292cc0f0","observation_id":"3b389f42-f7b2-498b-a29e-cac895835546","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Dudin, P","venue":null,"work_id":null,"year":2010},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":46,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:157bf3572a06e2d46c95a8cdac1929167cda93ed196b357831f85b5d84e5cb02","observation_id":"bd3efad3-b3a1-4924-8133-4182bfe0398e","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Momma and F","venue":null,"work_id":null,"year":2011},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":47,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:4471aa99b1b3333f601ca7f7795e52ef6cfb5a011191ba4491c05c9be2f18f2a","observation_id":"5753218f-ee56-41b4-b9ba-74726f6d455d","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Giannozzi, O","venue":null,"work_id":null,"year":2017},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":48,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:cd146c4198f12f350bda0011aa0bbd6dd32152436ea9d6061aae200b45fd2bec","observation_id":"50657d6c-93da-47e6-b4e5-45442acf27cc","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Kawamura, Fermisurfer: Fermi-surface viewer provid- ing multiple representation schemes, Computer Physics Communications239, 197 (2019)","venue":null,"work_id":null,"year":2019},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":49,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:ebfac12f727dfa2f3c938238bf00b220bd2e5f2316cdd6343dbc13948052dcbd","observation_id":"b500fb2c-d84f-4c20-ac1d-28fb22cf9854","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2012},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":50,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:085e3872979ebd3308b347d0f87af72348bd3031e03676fead34ba62ba38dbd4","observation_id":"789dd98b-40e6-491e-b2f9-197a6bf10698","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2012},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":51,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:19a4f2916b04d8a68bed63889a9840d4ed30a6654394364875aa7a622071db3c","observation_id":"5b05fe26-2da8-404f-9abe-b17ec50a9a6c","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Ootsuki, Y","venue":null,"work_id":null,"year":2012},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":52,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:00a05bc32095763bde85e7673b0dff1eec1de280f18543ce0b024e45cf519c8a","observation_id":"b621157f-a1cd-4dbb-9fab-946603051100","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Ootsuki, H","venue":null,"work_id":null,"year":2019},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":53,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:91e42918a10712a35d94158bb900467499967cccbae88b9fec18e2fe8ed62f6f","observation_id":"3a67def3-7a59-4a5c-8c67-4bfce55b8fba","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":54,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:61d470aca9b6b6f254bd8e2b5a1b1068fe0931f7ed34f469b1bf4a4e42288fcc","observation_id":"80683ab1-d391-449b-ad8c-181896ddc6f4","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Dardel, M","venue":null,"work_id":null,"year":1992},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":55,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:3abf7f7c90486da70cac6be9301b66adff2431c0ad477e7841f8b91d30894320","observation_id":"91d67da4-ca83-4dd6-acf5-5f19cc794049","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Zwick, H","venue":null,"work_id":null,"year":1998},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":56,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:430baf876e7fb9a6cf001dec89e8ec7cdbbcc770e8388b0dbfef05e7113e15bb","observation_id":"25f2fed7-ea24-4b40-abd2-e29b1146585a","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Pillo, J","venue":null,"work_id":null,"year":1999},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":57,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:d909e18eb0c24067fe6df37ec2395c9a6850fd057089a81282751be9dfb956e0","observation_id":"d55bb583-fc72-400d-9702-a1059053c6d5","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Horiba, K","venue":null,"work_id":null,"year":2002},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":58,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:38f0e424e6ffc6176068656acf045155aac4dfc20d5f81ed8dc26f7311ff4e12","observation_id":"b80290c3-90ce-4f03-89b4-7442cdc7985a","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Clerc, C","venue":null,"work_id":null,"year":2006},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":59,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:f54d1d6e9f027fbde006ab280c2d1b33672dd34329b94a548097c899cb8e7a27","observation_id":"5c5613c4-d6f8-4bc0-a62d-bea0088d3e54","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Hellmann, M","venue":null,"work_id":null,"year":2010},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":60,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:b68c305acd7d628310925e900e673ed16c10c4b1ee2f3634e0493ad774bc9a71","observation_id":"cc845b4b-cb41-4ecf-8c3c-934fb4057749","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Ritschel, J","venue":null,"work_id":null,"year":2013},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":61,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:c74129fc80be092a05339b1557fcb2eb2af4fe1fd95833b0b904320a692920d3","observation_id":"929ff9db-f8f9-44bb-bcc4-504e6fd3bcd0","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2017},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":62,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:ff5f47bf8dd5adc98a1071a26e9e55dea1aa90b7f5621bce74e249b7a85c3076","observation_id":"cbfb9138-2468-4321-8d28-addbd496029c","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":null,"venue":null,"work_id":null,"year":2020},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":63,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:a894b8d5a047ecbda34b370d364dd4e8b166e7d3556420d995cecba6d965e135","observation_id":"654bb7b5-e2c0-4ff3-9cec-3eab2700c4e7","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Nakata, K","venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":64,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:7e03c86ad30eae01a0cfeb933af435531a190d1892ea6fe8983c4705dc73f0db","observation_id":"a208fb30-8b46-4ac8-836f-fd438fd8369c","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Terashima, T","venue":null,"work_id":null,"year":2003},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":65,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:f5543626817f945f3d2337781d5e01d6d3ea98d35ceb213d3cbb6ae3ed1774e2","observation_id":"38a2ecc0-7d3c-499a-b47c-0fb5dd5a7209","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Sereika, C","venue":null,"work_id":null,"year":2020},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":66,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:fac16c4a2c8afb15b693c6594a39ad1715ccdb2f79c2e7184d39d536b64d97ce","observation_id":"090e5d76-7de4-45c4-b563-fffce4b42306","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-06-30T04:32:12.099022Z","title":"Sahoo, U","venue":null,"work_id":null,"year":2020},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":67,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:fd266e2c870ebf2fc34d3ee6cee6450a08c7433801252039607994b13e35a438","observation_id":"bc84a273-1ce4-46a1-b83e-612860110b9f","resolution":{"observed_at":"2026-06-30T04:32:12.099022Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2412.02599","last_updated":"2024-12-03T17:30:45Z","snapshot_observed_at":"2026-08-19T09:44:09.510996Z","submitted_at":"2024-12-03T17:30:45Z","title":"Evidence for reduced periodic lattice distortion within the Sb-terminated surface layer of the kagome metal CsV$_3$Sb$_5$","version":1},"cited_work":{"arxiv_id":"2412.02599","doi":null,"metadata_source":"arxiv_reference","pith_arxiv_id":"2412.02599","snapshot_observed_at":"2026-06-30T17:04:57.862645Z","title":"Kurtz, G","venue":null,"work_id":"cbac419d-0b11-4717-bf57-d130e9698ef7","year":2024},"citing_paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy","version":1},"reference_index":68,"source":"pdf_text","source_observed_at":"2026-06-30T04:32:12.099022Z"},"links":{"cited_paper":"/paper/2412.02599","citing_paper":"/paper/2606.29749"},"observation_digest":"sha256:1b62781a2f96c394935878d02ec3fc3fcdd02900038fa63e19a642b561e8b1cf","observation_id":"c0a4bbaa-92c7-4500-af03-00c1c96b09c2","resolution":{"observed_at":"2026-06-30T17:04:57.864295Z","resolver_source":"arxiv_id","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2606.29749","last_updated":"2026-06-29T03:45:26Z","latest_version":1,"primary_category":"cond-mat.supr-con","snapshot_observed_at":"2026-08-12T05:52:14.296485Z","submitted_at":"2026-06-29T03:45:26Z","title":"Electronic inhomogeneity in Cs- and Sb-terminated surfaces of CsV$_3$Sb$_5$ probed by scanning photoemission spectromicroscopy"},"reference_resolution":{"displayed":68,"state_counts":{"malformed_identifier":0,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":67,"verified_exact":1,"verified_fuzzy":0},"total_outbound_references":68},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-21T06:32:19.484+00:00","source":"crossref"},{"observed_at":"2026-08-21T06:32:16.066871+00:00","source":"retraction_watch"}],"thesis":"As of 22 August 2026, this Paper Citation Record lists 68 of 68 outbound references and 0 inbound Pith citation observations for arXiv:2606.29749."}