{"as_of":"2026-08-11T03:17:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:c067a61d3c88695cd5754a85f56248c16c70095361cd105c18ac761d242c7132","coverage":[{"denominator":58,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":58,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-01T06:58:53.834142Z","state":"measured"},{"denominator":59,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":59,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-10T06:31:04.303077+00:00","state":"measured"},{"denominator":1,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":1,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-01T06:58:47.658712Z","state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[{"citation":{"cited_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2607.21718","snapshot_observed_at":"2026-08-01T06:58:47.658712Z","title":"Here, we propose to use a single mobile quantum dot to probe charge defects across large sections of a device","venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":42,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:47.658712Z"},"links":{"cited_paper":"/paper/2607.21718","citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:db2d7fc6bd7d3c5377c8b8b04386094e9c67e19fd9032da463f3ee14ce0b7e16","observation_id":"baa801bc-d08f-43b1-8c44-5e9bf35104cd","resolution":{"observed_at":"2026-08-01T06:58:47.658712Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}}],"links":{"evidence":"/evidence","html":"/paper/2607.21718/citation-record","integrity":"/paper/2607.21718/integrity","json":"/paper/2607.21718/citation-record.json","paper":"/paper/2607.21718"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:47.785734Z","title":"Maurand, X","venue":null,"work_id":null,"year":2016},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:47.785734Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:0285ca94a91df873f4fcfe640bece50095f9f5efac8af262a2b6fbd0fe0a8846","observation_id":"9f1ac27e-15d1-4c8b-9dab-4b668cdf2cc6","resolution":{"observed_at":"2026-08-01T06:58:47.785734Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:47.961093Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:47.961093Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:c2e90486b7e329957ca564fb185bc7a5edbb0eb35a70f0573e012f3213977a2b","observation_id":"4f1aceae-83ce-4419-86dc-93c9e4d75783","resolution":{"observed_at":"2026-08-01T06:58:47.961093Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:48.131081Z","title":null,"venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:48.131081Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:06a34c8db7dfbe2cc69c08c6d38219b060e17cc1a2628f8bc60a5168ba0ffa90","observation_id":"c6edbdd8-d733-4d45-8a1d-01cfea2c8838","resolution":{"observed_at":"2026-08-01T06:58:48.131081Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:48.261864Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:48.261864Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:9b4c8b2274ded07eec035155a8ee557d296dedf1461ebea94a4c2bd20e1080ce","observation_id":"37f8d1c4-c67e-4a7e-a9a3-746a665623f7","resolution":{"observed_at":"2026-08-01T06:58:48.261864Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:48.358625Z","title":"Steinacker, N","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:48.358625Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:b7f8d07ddf5487518a28e976f88bfee45bab67c2f1af1e36e72b4dccaed04e38","observation_id":"845723f6-7391-4dcf-8201-3b3355209452","resolution":{"observed_at":"2026-08-01T06:58:48.358625Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:48.476366Z","title":null,"venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:48.476366Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:9b631a0feaa189e89199374a30a044158eb21c5e749b35bea055dc2dd34b4266","observation_id":"70e50029-4334-42e4-84ab-1d8a3aa9c384","resolution":{"observed_at":"2026-08-01T06:58:48.476366Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:48.615609Z","title":"Burkard, T","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:48.615609Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:40d6887451d1ad9f912d4ecc93facd28d347c0b458aa9d5ee3bac30a682d084f","observation_id":"3b162e4a-eaee-4b85-9e6e-6d9e7fc49501","resolution":{"observed_at":"2026-08-01T06:58:48.615609Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2507.11918","last_updated":"2026-07-15T08:10:59Z","snapshot_observed_at":"2026-08-06T16:55:58.088664Z","submitted_at":"2025-07-16T05:26:40Z","title":"Simultaneous High-Fidelity Single-Qubit Gates in a Spin Qubit Array","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2507.11918","snapshot_observed_at":"2026-08-01T06:58:48.735421Z","title":"Takeda, T","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:48.735421Z"},"links":{"cited_paper":"/paper/2507.11918","citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:ba4c358f1717194e12ece6043d5f9411b0bd005e78e4f97d751ba1952e77fab5","observation_id":"cfdc9868-351b-4f87-9003-9f525be461f9","resolution":{"observed_at":"2026-08-01T06:58:48.735421Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:48.903350Z","title":null,"venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:48.903350Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:a1945fe9af0fd6b11ac9ac1e30aedb8042ff0e406014cdd865db34be76ec0905","observation_id":"91eb1155-a028-4e07-9044-afb0270912ec","resolution":{"observed_at":"2026-08-01T06:58:48.903350Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:49.017308Z","title":"Scappucci, and S","venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:49.017308Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:0f34b337fa685e26660ce850ad0e8bc5cac5fd106b9cc0fa308bce2d5bfb56ed","observation_id":"b2a03959-4f4e-441b-8872-f61cc6c16495","resolution":{"observed_at":"2026-08-01T06:58:49.017308Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:49.134238Z","title":null,"venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:49.134238Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:3488986b8b5e85a1d07595f6439cc543d2290685ba81651e544a85987ed128fb","observation_id":"e9c711fc-81b1-4070-a2c9-e28cc8b8d834","resolution":{"observed_at":"2026-08-01T06:58:49.134238Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2505.10435","last_updated":"2025-05-15T15:53:09Z","snapshot_observed_at":"2026-08-07T15:45:01.949043Z","submitted_at":"2025-05-15T15:53:09Z","title":"High-fidelity dispersive spin sensing in a tuneable unit cell of silicon MOS quantum dots","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2505.10435","snapshot_observed_at":"2026-08-01T06:58:49.209576Z","title":"Lainé, G","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:49.209576Z"},"links":{"cited_paper":"/paper/2505.10435","citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:81d431b2fe8743ce73df3cec84fda97a8725f440538785c235b79868652808e8","observation_id":"81104738-63c4-4314-bb2d-7addc6474102","resolution":{"observed_at":"2026-08-01T06:58:49.209576Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:49.340467Z","title":"Takeda, A","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:49.340467Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:b90e7608e0ff7c82b8e8f25151310b5b776b82eed014ba0bca7b85a1b0195a29","observation_id":"34419c90-ac67-4060-952b-354a46ec49d2","resolution":{"observed_at":"2026-08-01T06:58:49.340467Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1038/s41467-021-24371-7","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":"Yoneda, W","venue":"Nature Communications","work_id":"67d2e2be-fcc0-4316-a0cb-ea6e794925d7","year":2021},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:49.460636Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:cdcdece14edd5b7728116dccfe6f609fa6136229c16bb436342d125fce18d5ff","observation_id":"41fe37f3-fcd7-4b94-8571-e42c4d41c92e","resolution":{"observed_at":"2026-08-01T07:08:39.451060Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:49.523737Z","title":"Seidler, T","venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:49.523737Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:3387e2417d42c15c9a23e72f0f983ee3b1c20762d2a873c478a88b68cb73d22b","observation_id":"035e8e21-2805-457d-ab53-bb730a8ac96a","resolution":{"observed_at":"2026-08-01T06:58:49.523737Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2406.07267","last_updated":"2025-06-12T12:31:21Z","snapshot_observed_at":"2026-08-09T08:14:42.891301Z","submitted_at":"2024-06-11T13:51:52Z","title":"High-fidelity single-spin shuttling in silicon","version":3},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2406.07267","snapshot_observed_at":"2026-08-01T06:58:49.600490Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:49.600490Z"},"links":{"cited_paper":"/paper/2406.07267","citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:43ece6672ff1a94255241e854b53ae6e6c87314c5e5e443934752f9678471ca4","observation_id":"a3b24305-70ef-4477-97bb-851b5a86e3f7","resolution":{"observed_at":"2026-08-01T06:58:49.600490Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:49.663867Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:49.663867Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:64cc1772af65923bf6f51b1b2346ee441cce48239bc3031c505c15e5537cdce8","observation_id":"88e3b52a-de8b-47be-825c-b3cd14ec856e","resolution":{"observed_at":"2026-08-01T06:58:49.663867Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:49.819497Z","title":"Siegel, A","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:49.819497Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:59ed7d0956b5a1bd04375fa0e5fbbfcebef0d65de3f999cf10eb8810c674df8f","observation_id":"54fcc90d-3b13-49c2-a724-c93761c462a9","resolution":{"observed_at":"2026-08-01T06:58:49.819497Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:49.920680Z","title":"Siegel, Z","venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:49.920680Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:91d3cb7b0bf602c84adc3ae43ba620482490c0e311c07aacab430be0cfffe775","observation_id":"191efc08-8e03-425a-b62b-a8842f6891a3","resolution":{"observed_at":"2026-08-01T06:58:49.920680Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:50.006494Z","title":null,"venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:50.006494Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:43ffcf749cac8e26715cb1703b6c04ede9500571d0f736735d24b48553047074","observation_id":"c8922f91-17d7-43c3-a2fb-334b3371f1a4","resolution":{"observed_at":"2026-08-01T06:58:50.006494Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1103/prxquantum.4.020345","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-05T02:28:24.338817Z","title":null,"venue":"PRX Quantum","work_id":"8a0a7476-c9eb-4ca0-becc-a9d58b51a1a1","year":2023},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:50.124250Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:ca95b9ad5372f2b79e7ec88b95648d7b729f5a5e920b683a7384ba2b6960dc7b","observation_id":"2b50956e-e216-4833-b120-80f12cd36c5b","resolution":{"observed_at":"2026-08-01T07:08:39.123358Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:50.247593Z","title":"Jnane, A","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:50.247593Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:c13c28f71bc8dafe8c76f103e536da592d0d552e39880fa0d07ccf7b3f5a878b","observation_id":"fedf9fbb-81e4-440f-b0e6-6afbab89e574","resolution":{"observed_at":"2026-08-01T06:58:50.247593Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:50.396350Z","title":null,"venue":null,"work_id":null,"year":1998},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:50.396350Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:269cda900bc0973c46873a1607109741dd894ba2be1e0fffb5ea3ffb2e9b4dc7","observation_id":"e94537e2-ebd0-49de-bb53-40d3ef8e925a","resolution":{"observed_at":"2026-08-01T06:58:50.396350Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:50.522841Z","title":null,"venue":null,"work_id":null,"year":2014},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:50.522841Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:8c50948b522f5421977b0fbbfd4c20c60fa4f6517443f5fbad69b3753324dcd1","observation_id":"85185d01-496a-46c9-8ae2-06e93c283b95","resolution":{"observed_at":"2026-08-01T06:58:50.522841Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:50.689748Z","title":null,"venue":null,"work_id":null,"year":1988},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:50.689748Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:80896d7c6597bb4339886be7971c9fc44db22bd810bac963e60488b004d9c8e1","observation_id":"0b95bfca-ff45-43e4-93e3-a81ddf3bdc86","resolution":{"observed_at":"2026-08-01T06:58:50.689748Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:50.832094Z","title":null,"venue":null,"work_id":null,"year":1972},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:50.832094Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:bed7dd323c2983ae740cee5d59578811985b48272fcda31b4340c82663852bb8","observation_id":"2a832e40-2fcf-4b5c-9019-97d1e7ccc36c","resolution":{"observed_at":"2026-08-01T06:58:50.832094Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:50.935373Z","title":null,"venue":null,"work_id":null,"year":1972},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:50.935373Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:d93ca5fb92d7027a0912815142691380e6619fd9308073bc470aecc03518013c","observation_id":"e5401235-0d99-4c41-b53f-15f8164afb1a","resolution":{"observed_at":"2026-08-01T06:58:50.935373Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:50.990546Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:50.990546Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:2876d752db7e9e4faf98717dbf6bf5701b7a41219c845d9e18334d25c77cdc60","observation_id":"5ba8eff7-85c4-4c53-9a04-1174acf77497","resolution":{"observed_at":"2026-08-01T06:58:50.990546Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:51.070707Z","title":null,"venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:51.070707Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:908a4a1633ef2fef6a04573b648fb83c07797bb88cf085da5b8f235e12a21321","observation_id":"d7c1a7d1-0adc-4ea6-8fb8-c45a64c6b190","resolution":{"observed_at":"2026-08-01T06:58:51.070707Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:51.136820Z","title":null,"venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:51.136820Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:9ff5ddc459f5ef9cb80e8fcf991331436e0d224ba8f7ece45c7b31ba20678cfe","observation_id":"c2c52f1c-273d-4b09-b27f-b9aec15403f8","resolution":{"observed_at":"2026-08-01T06:58:51.136820Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:51.225862Z","title":null,"venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:51.225862Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:85c9e23968d7e03a78e56e412f02e9522448593f4da65cf9db304a610f0472a8","observation_id":"f4f1eafe-2dba-4e95-9781-bd866430256a","resolution":{"observed_at":"2026-08-01T06:58:51.225862Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:51.285314Z","title":null,"venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:51.285314Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:a7fc70c4153301293c5dc60454319f97879904c6cb632f5fa050ab31b7392182","observation_id":"f67d8c61-47bf-453a-9eb7-8977621bf395","resolution":{"observed_at":"2026-08-01T06:58:51.285314Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:51.353310Z","title":null,"venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:51.353310Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:fec8503c221010a345b74fc3c34c5e5f3594464262e41b22b9c40b5ec0ac33e1","observation_id":"2af09581-be4d-493c-86a6-6438c59d2b0e","resolution":{"observed_at":"2026-08-01T06:58:51.353310Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:51.420943Z","title":"Jeon and Z","venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:51.420943Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:ddbf1ad8bcd280cf2dab766122328ca025a9657397b03885cd022bddc139f84b","observation_id":"c089d0f5-9f1f-4519-96ec-aba1cbfa7a2e","resolution":{"observed_at":"2026-08-01T06:58:51.420943Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:51.467446Z","title":null,"venue":null,"work_id":null,"year":2019},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:51.467446Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:6302144f4aba4a1c25b7b6767a7c9e79bd718a0d5ff11400c7c0bf5915f07fcc","observation_id":"afd53d21-bf1b-4f43-8f37-0e11ba5737bd","resolution":{"observed_at":"2026-08-01T06:58:51.467446Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:51.577988Z","title":null,"venue":null,"work_id":null,"year":2022},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:51.577988Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:42043af55965990718941ac0ac0d3445219b05b5308334f72ed3a89706962abe","observation_id":"d6da3215-c072-4b77-ae05-087e77c2122f","resolution":{"observed_at":"2026-08-01T06:58:51.577988Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:51.705279Z","title":"Vigneau, F","venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:51.705279Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:22c82ae1095cbd5b7cb673b0e82345189b8b5594c4d21a3f4a997d5300cbbffd","observation_id":"4c326ef7-ed69-40fa-8fba-bf15ecb6b804","resolution":{"observed_at":"2026-08-01T06:58:51.705279Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:51.904749Z","title":"Mehmandoost and V","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:51.904749Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:58070b3936b7f44b0b000e84816b37eb34afe0c22a7fb19094ebb0f24fe6fcf6","observation_id":"de5a3202-17ed-45d6-81a0-361af6dc31b2","resolution":{"observed_at":"2026-08-01T06:58:51.904749Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:52.075731Z","title":"Nishi, K","venue":null,"work_id":null,"year":1972},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:52.075731Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:47f569f1bdcf27f6a92f2ee02d055483430d0247adfaedbcf9f8140e2c22c8bd","observation_id":"2017d76e-80bc-4722-a504-6bd02a42d051","resolution":{"observed_at":"2026-08-01T06:58:52.075731Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:47.522569Z","title":"However, the defects we are interested in sit at a buried interface or in the bulk","venue":null,"work_id":null,"year":null},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:47.522569Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:7497f95ef1dd1ad0f50aa6f124430347bc6aac9f636d0526b1da73d0aaed76d8","observation_id":"c0bbaa60-b5be-4c58-bb40-d01870f35ead","resolution":{"observed_at":"2026-08-01T06:58:47.522569Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:52.221529Z","title":"Cakar, H","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:52.221529Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:8ee2bbf8aca2e1e134174ac3c8f6bab988486b06114a7c8a166895007632f6bc","observation_id":"6cfab21e-1ebe-4e5d-9bc1-6ab070b026b0","resolution":{"observed_at":"2026-08-01T06:58:52.221529Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2607.21718","snapshot_observed_at":"2026-08-01T06:58:47.658712Z","title":"Here, we propose to use a single mobile quantum dot to probe charge defects across large sections of a device","venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":42,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:47.658712Z"},"links":{"cited_paper":"/paper/2607.21718","citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:db2d7fc6bd7d3c5377c8b8b04386094e9c67e19fd9032da463f3ee14ce0b7e16","observation_id":"baa801bc-d08f-43b1-8c44-5e9bf35104cd","resolution":{"observed_at":"2026-08-01T06:58:47.658712Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:52.144648Z","title":"Pitters, J","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":43,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:52.144648Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:59e40feb468c8f18ee7a41c40e55913edb95193daccff0a4d335a397017c7e17","observation_id":"f648db10-cfcd-46d0-b968-16a2cd398595","resolution":{"observed_at":"2026-08-01T06:58:52.144648Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:52.299423Z","title":null,"venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":44,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:52.299423Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:0d0363960252fb43772b24c7d0c71e619a854f2ba05ef57ec6dee73f59a427ef","observation_id":"3f6577fb-b1bb-4cb5-8af0-b14aa895b516","resolution":{"observed_at":"2026-08-01T06:58:52.299423Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:52.386581Z","title":"Volmer, T","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":45,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:52.386581Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:fcdd8d36e3c038b0659888da5139b415c491b03b884a4c497cce87c622eb78f0","observation_id":"b963808b-26b3-4b61-ac71-232b55d70507","resolution":{"observed_at":"2026-08-01T06:58:52.386581Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2603.01844","last_updated":"2026-07-15T15:28:00Z","snapshot_observed_at":"2026-08-09T23:00:08.564029Z","submitted_at":"2026-03-02T13:23:00Z","title":"Mapping g-factors and complex intervalley coupling in Si/SiGe by conveyor-mode shuttling","version":2},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2603.01844","snapshot_observed_at":"2026-08-01T06:58:52.470131Z","title":"Volmer, T","venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":46,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:52.470131Z"},"links":{"cited_paper":"/paper/2603.01844","citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:e64df9e8d8d9963c4b557fdbe01b90ac6ef55e0764fa8adf984218d79661cb69","observation_id":"70d35965-68e1-49a5-83eb-2dfbf5ebbc50","resolution":{"observed_at":"2026-08-01T06:58:52.470131Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2409.04404","last_updated":"2024-09-06T16:55:13Z","snapshot_observed_at":"2026-07-06T19:11:40.618767Z","submitted_at":"2024-09-06T16:55:13Z","title":"Modeling of decoherence and fidelity enhancement during transport of entangled qubits","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2409.04404","snapshot_observed_at":"2026-08-01T06:58:52.539556Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":47,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:52.539556Z"},"links":{"cited_paper":"/paper/2409.04404","citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:c3021c9fbf816c75bd900ed4494d6344ec9d005b1c82e577ddb98181bc50ddb2","observation_id":"680d8dc2-51c8-45d1-b9e1-219c60a09fff","resolution":{"observed_at":"2026-08-01T06:58:52.539556Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:52.600680Z","title":"Bergli, Y","venue":null,"work_id":null,"year":2009},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":48,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:52.600680Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:bd6139af9949ad0e76f53a1a7e0c7d320c4ada9f8ef3304290d50fe61e284e50","observation_id":"d769c55b-1621-444a-8063-24a483ea8235","resolution":{"observed_at":"2026-08-01T06:58:52.600680Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2512.03853","last_updated":"2026-06-24T09:08:45Z","snapshot_observed_at":"2026-08-03T18:46:00.359875Z","submitted_at":"2025-12-03T14:53:12Z","title":"Modelling the Impact of Device Imperfections on Electron Shuttling in SiMOS devices","version":3},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2512.03853","snapshot_observed_at":"2026-08-01T06:58:52.673145Z","title":null,"venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":49,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:52.673145Z"},"links":{"cited_paper":"/paper/2512.03853","citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:87726fececebbae0b8e611fa1834f2e2381e4d30febe980ad2694de43db96bc5","observation_id":"c573e275-1e87-4074-a78f-9766e9090e3b","resolution":{"observed_at":"2026-08-01T06:58:52.673145Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:52.786274Z","title":"Ruskov, M","venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":50,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:52.786274Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:fdc5f8d1f61affc76d9fcf91de2e921b42cee593cd5eb4c232cd887bcde6ec7f","observation_id":"ecf61588-44e4-49fd-9d0b-2a000d62ce34","resolution":{"observed_at":"2026-08-01T06:58:52.786274Z","resolver_source":null,"status":"malformed_identifier"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:52.868635Z","title":"Ferdous, K","venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":51,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:52.868635Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:f70710cfd060cb7c80e9aa6e2014c93ecc0421a75dc7a19d22483c086ce86183","observation_id":"5328fa4b-d278-4e71-ae81-15328fc592e1","resolution":{"observed_at":"2026-08-01T06:58:52.868635Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:52.988296Z","title":"Dexter, B","venue":null,"work_id":null,"year":1954},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":52,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:52.988296Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:04d1b97f3a11b8cbaae0a6ed4909006e5d6e98d3c0e16f7f45d3491e5e6dcb08","observation_id":"a2f888a1-1edb-455a-8853-8f91c20840d5","resolution":{"observed_at":"2026-08-01T06:58:52.988296Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:53.082917Z","title":"Ghahramani and M","venue":null,"work_id":null,"year":1995},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":53,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:53.082917Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:41663063085e55ce047d229c2b5b2c35c5b1126589a878aaf9c18a948381dc51","observation_id":"e3b52dde-cc16-4e8d-8b48-9240c1fc26d0","resolution":{"observed_at":"2026-08-01T06:58:53.082917Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:53.142067Z","title":null,"venue":null,"work_id":null,"year":1977},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":54,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:53.142067Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:ba4446a23f2e4b9af7808de6c8dfa8f39fd1db3ea8f9d700dce84d96adfbc3fa","observation_id":"5eb21998-72cd-416a-ab49-10baaadc3640","resolution":{"observed_at":"2026-08-01T06:58:53.142067Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:53.281692Z","title":"Electron shuttling as a probe for charge defects","venue":null,"work_id":null,"year":1981},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":55,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:53.281692Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:081c961e40d843641856bf04ce4251f5c85ff99f5ba65b67338f088a96a533c5","observation_id":"8597dd21-59f6-42cb-b9cc-644e9bf144a7","resolution":{"observed_at":"2026-08-01T06:58:53.281692Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:53.486552Z","title":"Suppose that we start with the TLF inr+ d at timetand consider what could happen during the interval[t, t+dt]","venue":null,"work_id":null,"year":null},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":56,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:53.486552Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:8bef926064dc774c19236e42b5ef4e1666e91392778b17f66477d8e40350fe57","observation_id":"b088c159-e35b-4c7a-b462-ee9ba8b55bf3","resolution":{"observed_at":"2026-08-01T06:58:53.486552Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:53.636465Z","title":"The factor2comes from the fact that the two integrals are equal","venue":null,"work_id":null,"year":null},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":57,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:53.636465Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:36ced303a3a7fcea314fb7d3799e22b88ae6b1872950c9ffb5c8431728008c08","observation_id":"067c5a18-d989-4d65-be16-b355ccce400c","resolution":{"observed_at":"2026-08-01T06:58:53.636465Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-01T06:58:53.834142Z","title":"AsγT≫1, we can see thatu 2 will decay extremely fast, we can thus assume thatdu2 dt = 0","venue":null,"work_id":null,"year":null},"citing_paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects","version":1},"reference_index":58,"source":"pdf_text","source_observed_at":"2026-08-01T06:58:53.834142Z"},"links":{"citing_paper":"/paper/2607.21718"},"observation_digest":"sha256:2a814b73627c90f81f5e439012a88751985640911f3349ccfac085b185b9cf3a","observation_id":"0663426c-6d64-4a9d-96fb-c44d57020f27","resolution":{"observed_at":"2026-08-01T06:58:53.834142Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}}],"paper":{"arxiv_id":"2607.21718","last_updated":"2026-07-23T18:02:20Z","latest_version":1,"primary_category":"quant-ph","snapshot_observed_at":"2026-08-08T02:34:43.104653Z","submitted_at":"2026-07-23T18:02:20Z","title":"Electron shuttling as a probe for charge defects"},"reference_resolution":{"displayed":58,"state_counts":{"malformed_identifier":1,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":55,"verified_exact":2,"verified_fuzzy":0},"total_outbound_references":58},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"thesis":"As of 11 August 2026, this Paper Citation Record lists 58 of 58 outbound references and 1 inbound Pith citation observation for arXiv:2607.21718."}