{"as_of":"2026-08-10T07:21:00Z","caps":{"database_statements":6,"inbound":100,"outbound":100},"context_digest":"sha256:58dd594869fc0fb623af9cedae10d76321126a2f54d598aa57967cc9cd01fea0","coverage":[{"denominator":64,"lane":"reference_resolution","note":"Typed states for the displayed outbound observations.","records_observed":64,"source":"paper_references, paper_reference_links","source_observed_at":"2026-08-07T19:54:44.201954Z","state":"measured"},{"denominator":64,"lane":"standing_notices","note":"One-hop event checks from named stored sources.","records_observed":64,"source":"scholarly_work_events, retraction_status_cache","source_observed_at":"2026-08-10T06:31:04.303077+00:00","state":"measured"},{"denominator":0,"lane":"inbound_itemization","note":"Pith citing papers itemized under the disclosed page cap.","records_observed":0,"source":"paper_references, paper_reference_links","source_observed_at":null,"state":"measured"},{"denominator":1,"lane":"external_citation_measurements","note":"A source-named dated measurement, never combined with another source.","records_observed":0,"source":"cited_works","source_observed_at":null,"state":"measured"}],"external_citation_measurements":[],"inbound":[],"links":{"evidence":"/evidence","html":"/paper/2608.05992/citation-record","integrity":"/paper/2608.05992/integrity","json":"/paper/2608.05992/citation-record.json","paper":"/paper/2608.05992"},"outbound":[{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:43.957509Z","title":null,"venue":null,"work_id":null,"year":2016},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":1,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:43.957509Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:990062bc14570f38f86a6974d2ba6ad9d1c839a9c161a32990360bc7af8b483d","observation_id":"c2a97bee-afba-4e74-8db5-8d084615ffd3","resolution":{"observed_at":"2026-08-07T19:54:43.957509Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:43.962404Z","title":null,"venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":2,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:43.962404Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:a559b744ecefe66f0d8e8964002c22f7a404d5fb63b3c201d4288d2ce61870f3","observation_id":"f0afa8d2-2ddf-4b82-9b93-d43007e58323","resolution":{"observed_at":"2026-08-07T19:54:43.962404Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:43.966455Z","title":null,"venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":3,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:43.966455Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:c4709c8c5573c91b97e67c688d768f19249c1ab33494516f893c15b7b4e7ef83","observation_id":"5c3a4607-f3fd-4d8d-84b9-1974288f9c9b","resolution":{"observed_at":"2026-08-07T19:54:43.966455Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.932554Z","title":null,"venue":null,"work_id":"51d55da2-b737-44ba-9211-c1ed154af02f","year":2003},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":4,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:43.970314Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:4f8823f66ce45e9d39c9a9ef6cb2e782e5df18872f36e0a6de4fc29cbbca4d9c","observation_id":"b1cf961c-fd0b-4dff-9e29-91fee4f8e1c3","resolution":{"observed_at":"2026-08-07T19:54:44.936327Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.920629Z","title":null,"venue":null,"work_id":"db6ca5fe-6cc6-4eda-bfe8-b5b9d66779a4","year":2009},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":5,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:43.974336Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:ee4d09285f31b6c333763b4207b60fc893eecc86d38f535c10a496d82e487e9a","observation_id":"190b2ca3-3b55-4c9c-9385-5ea1f7e5972d","resolution":{"observed_at":"2026-08-07T19:54:44.924879Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:43.978206Z","title":"Takita, A","venue":null,"work_id":null,"year":2017},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":6,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:43.978206Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:955f70a33b0363a8d990e5bf6918054f4c01da336c4484b03e487105d1e41b31","observation_id":"41856d34-e446-4542-a727-5d6c2efcfa14","resolution":{"observed_at":"2026-08-07T19:54:43.978206Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.903056Z","title":"Chao and B","venue":null,"work_id":"bdd51398-bfa4-4834-b661-7dffd88359d4","year":2018},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":7,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:43.982111Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:1b2091658e156a40ffdf7830874e941230b1eb144f2b5b7e08e00c246f404d57","observation_id":"5acec53e-3367-4018-8c9f-aff491bf9fc2","resolution":{"observed_at":"2026-08-07T19:54:44.906781Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:43.985747Z","title":null,"venue":null,"work_id":null,"year":1999},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":8,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:43.985747Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:de89d246b2ca69f55064c88460a975a03fa7d1b463bbf01140e96e1ec3b29335","observation_id":"b7385967-2575-4b33-a983-e22be2d1503f","resolution":{"observed_at":"2026-08-07T19:54:43.985747Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:43.989317Z","title":"Gottesman, A","venue":null,"work_id":null,"year":2001},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":9,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:43.989317Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:9cf1ec446b30645fc68d0ae617eada413266d361319aa2e7aff7eed030209027","observation_id":"eeb870d2-26ca-4c74-bec6-70c4eb66a67a","resolution":{"observed_at":"2026-08-07T19:54:43.989317Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:43.992825Z","title":null,"venue":null,"work_id":null,"year":2020},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":10,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:43.992825Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:0b068450136753d1cf5ad1741e0e1d33e492cde42b4861515b029a8f6962874d","observation_id":"ccd23421-e593-4e15-a303-02338da9e5dd","resolution":{"observed_at":"2026-08-07T19:54:43.992825Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.872043Z","title":null,"venue":null,"work_id":"3a7b5590-0029-4ca4-a0dd-4c59167a936a","year":2025},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":11,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:43.996418Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:c455ce432b8eb92cda58cd523d2eead2164d69b1deb11eb1976c9f8fefbd8ab1","observation_id":"fe20d8ef-5e62-4a4f-ada6-9b88dc7b9290","resolution":{"observed_at":"2026-08-07T19:54:44.875608Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.860512Z","title":"Fern´ andez de Fuentes, T","venue":null,"work_id":"e8a3708a-d2a6-44bd-be19-257b0e586a23","year":2024},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":12,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.000562Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:4fcd3734096048f0ace17a58c3f5b9a18de86aa54b627b19f334e92c54820a1a","observation_id":"9e86c8d4-3b97-4804-94ff-490a4854bd67","resolution":{"observed_at":"2026-08-07T19:54:44.864574Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.848712Z","title":"Steinacker, G","venue":null,"work_id":"0094f23b-ab61-4477-9383-141986bea628","year":2026},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":13,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.004321Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:f8711465819ca4a4c8c76875aac1bb09ab5fe111b7c2dcfce06aa582cd7f065c","observation_id":"eed3a8f9-b2d8-4a65-802f-06d86a49991e","resolution":{"observed_at":"2026-08-07T19:54:44.852983Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.008102Z","title":null,"venue":null,"work_id":null,"year":2021},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":14,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.008102Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:582fe7a71485e0b0cb75f3bd749082d419d1f7cadf93313b825c5543d880e06f","observation_id":"f63803ff-acc2-4e28-b7c5-ab96adef0bc6","resolution":{"observed_at":"2026-08-07T19:54:44.008102Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.012087Z","title":null,"venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":15,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.012087Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:019f7a81942446a0fc27cb51d9b2e5ac7d416fbf89dbdd4563bdcd74b837ebef","observation_id":"eb84b51d-8976-44a6-9405-4f2efefcc7dc","resolution":{"observed_at":"2026-08-07T19:54:44.012087Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.822664Z","title":"Chiesa, E","venue":null,"work_id":"901db856-fe92-4297-b737-888463d5855b","year":2020},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":16,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.015816Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:99eff3d4d737c06321fd8b9a81f42221d54c6d1d08e82c85575b7b471d32faf3","observation_id":"597746a8-fdc0-4afa-8ea9-c5792bdeac23","resolution":{"observed_at":"2026-08-07T19:54:44.827030Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.811024Z","title":"Mezzadri, A","venue":null,"work_id":"cad354be-9297-4c7d-bcc6-77a84d9e6928","year":2024},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":17,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.019517Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:cfbd4c351ddac3e7bd4b7e480cf9c1ee0d7d64d1438bc2c28a9d280ce0ccd361","observation_id":"8b901325-93b1-4e02-b87c-5069a14f3e87","resolution":{"observed_at":"2026-08-07T19:54:44.814758Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.023279Z","title":"Omanakuttan, V","venue":null,"work_id":null,"year":2024},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":18,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.023279Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:143a241394e541ba0003d5c8e913a9e7117a11621795778c52c3f4ce99c1e7f1","observation_id":"f2cb94d2-04a6-41d3-9537-cf6b79c815b9","resolution":{"observed_at":"2026-08-07T19:54:44.023279Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":{"arxiv_id":"2503.13908","last_updated":"2025-03-18T05:10:21Z","snapshot_observed_at":"2026-08-08T08:22:03.303402Z","submitted_at":"2025-03-18T05:10:21Z","title":"Error correction of a logical qubit encoded in a single atomic ion","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"2503.13908","snapshot_observed_at":"2026-08-07T19:54:44.027021Z","title":"DeBry, N","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":19,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.027021Z"},"links":{"cited_paper":"/paper/2503.13908","citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:0792b0027c516dfc2d8ed14988d62053d2dc77f99270a3ae3a47e3d338f52c91","observation_id":"9c762eb9-4c79-48c7-be1f-9fa15427baa7","resolution":{"observed_at":"2026-08-07T19:54:44.027021Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.031200Z","title":"Kusano, K","venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":20,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.031200Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:9ebbba2c7b94d7be8def9173b48c536885623ea4ffad51ae81ba0904cc35a20b","observation_id":"dd36323b-1437-42e9-925e-2fa8c812f57d","resolution":{"observed_at":"2026-08-07T19:54:44.031200Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.792768Z","title":null,"venue":null,"work_id":"12a9c034-2754-43b8-9b51-360bc3624e19","year":2014},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":21,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.034801Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:a48f51353819938fd9af0aab97b8495b9d9380523031fbfbacfedd4034b46c26","observation_id":"b0e2db23-a40b-40c3-b097-3802bbf2b6c8","resolution":{"observed_at":"2026-08-07T19:54:44.796612Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.038689Z","title":null,"venue":null,"work_id":null,"year":2013},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":22,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.038689Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:faab0e2f9b14189bdbd5be8bd291ab98c93be6d1ddcf4b093453668b8f8e92cf","observation_id":"4a1e121f-1100-4a21-b5f6-1f9a06d06aa6","resolution":{"observed_at":"2026-08-07T19:54:44.038689Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.774613Z","title":"Morello, J","venue":null,"work_id":"2799862c-59e6-4cd9-97e3-3b727027bfea","year":2020},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":23,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.042572Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:4b4521234b89aa8f5954c61eacd2b929ed0f87193753dc49288db5787bb6c8c0","observation_id":"39757644-711a-4167-aa56-f1d306820f36","resolution":{"observed_at":"2026-08-07T19:54:44.778621Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"0904.2557","last_updated":"2009-04-16T18:40:02Z","snapshot_observed_at":"2026-08-02T06:03:48.397877Z","submitted_at":"2009-04-16T18:40:02Z","title":"An Introduction to Quantum Error Correction and Fault-Tolerant Quantum Computation","version":1},"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":"0904.2557","snapshot_observed_at":"2026-08-07T19:54:44.046392Z","title":"Gottesman, An introduction to quantum error cor- rection and fault-tolerant quantum computation (2009), arXiv:0904.2557 [quant-ph]","venue":null,"work_id":null,"year":2009},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":24,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.046392Z"},"links":{"cited_paper":"/paper/0904.2557","citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:3b47338e866c3dcb30636c85aec0263cdb48291e3c610e05ebc08a3f77d8f802","observation_id":"b4d82cd8-39e7-4829-ad95-68f7f877fcb6","resolution":{"observed_at":"2026-08-07T19:54:44.046392Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.050567Z","title":null,"venue":null,"work_id":null,"year":2023},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":25,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.050567Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:c7d44c613d3521ab20370c9a26be89814235181db356202084231da719a071e3","observation_id":"cd96dc13-b500-4540-af48-77fa8106db42","resolution":{"observed_at":"2026-08-07T19:54:44.050567Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.756950Z","title":null,"venue":null,"work_id":"7c8b6c67-fe50-43ae-9150-503253dc90e3","year":2020},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":26,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.054560Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:ad14cabeae5970850de0c65a6f15b2cf5647cf3d10f72ebc6d518c38f4736633","observation_id":"670e8d96-bf18-4391-b3d5-678403a03433","resolution":{"observed_at":"2026-08-07T19:54:44.760755Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.058240Z","title":null,"venue":null,"work_id":null,"year":2020},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":27,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.058240Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:9815d2e6a9d286ac424a9b163d2f35841b9e0256688ba1d0cbb188a1a3058a3a","observation_id":"5d7c8a15-2e6d-496c-9cd6-97ff4cd5eb80","resolution":{"observed_at":"2026-08-07T19:54:44.058240Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.062422Z","title":null,"venue":null,"work_id":null,"year":2013},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":28,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.062422Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:7dc89b3528bbb69a0ef7c90ac2164e52f38885667d8fb53e2dbfef2be9426ef9","observation_id":"6ef7a972-6443-41e5-ba23-8578d49b6078","resolution":{"observed_at":"2026-08-07T19:54:44.062422Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.066284Z","title":"Kapit, Error-transparent quantum gates for small log- ical qubit architectures, Phys","venue":null,"work_id":null,"year":2018},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":29,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.066284Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:210acebd7b9eb95fec3bada615e3a0af71a674470ef5762ae4afa3cd8a527bf5","observation_id":"cd681cd5-dd89-4acb-bfc3-f6c2ecce8dac","resolution":{"observed_at":"2026-08-07T19:54:44.066284Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.070283Z","title":null,"venue":null,"work_id":null,"year":1971},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":30,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.070283Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:581dbc24512b8063a86161c17df1389a40d01d5be6e9afb3975efd3bc6cf5601","observation_id":"33d669db-6d70-4002-ae08-60d1b770d559","resolution":{"observed_at":"2026-08-07T19:54:44.070283Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.074072Z","title":null,"venue":null,"work_id":null,"year":1972},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":31,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.074072Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:7a1e9d0451ed1e613b7d2110bb471f035ea73724fa78ce0620ce46eb00216917","observation_id":"cdead0f4-9d79-4ed5-8cab-847ef7ac204c","resolution":{"observed_at":"2026-08-07T19:54:44.074072Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.077907Z","title":"Knill and R","venue":null,"work_id":null,"year":1997},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":32,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.077907Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:ac10ce5345596bb3d8dbad96fa81e42f736b5b748c4d763ef56c9fb954b6d1f0","observation_id":"111eaf47-7c5f-4926-b079-a37cb668d752","resolution":{"observed_at":"2026-08-07T19:54:44.077907Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.705654Z","title":null,"venue":null,"work_id":"d382b0a0-24b0-4973-877b-3d4ba60ebb40","year":2000},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":33,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.081745Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:45d9cf16f72e749f0ed7f088d873d7355a05602ae335ef28a01957242946c98e","observation_id":"7c34a324-a6b6-4ccb-8b6c-f27712fb4e76","resolution":{"observed_at":"2026-08-07T19:54:44.709434Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.085683Z","title":null,"venue":null,"work_id":null,"year":2020},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":34,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.085683Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:c08efac0c8582ea1dc84ebcd1e82908add726a26fa4a7b6ddf241cbd780b0786","observation_id":"53b9db34-8ecc-43f5-bdef-34ccad97bd7c","resolution":{"observed_at":"2026-08-07T19:54:44.085683Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.687501Z","title":null,"venue":null,"work_id":"f27cf301-20b0-4d4f-93db-f425dc417513","year":2025},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":35,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.089608Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:46fc573b1bbbbdb3601aa0367e17064c0274672622fab1fc2d10a4d465e2f911","observation_id":"aaec11d5-0151-4f02-9615-0b1229e319ff","resolution":{"observed_at":"2026-08-07T19:54:44.691191Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.093659Z","title":null,"venue":null,"work_id":null,"year":2017},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":36,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.093659Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:cc774bb93bb7b92f182274c6716487771eff243e88b851a098d057e470d41d06","observation_id":"7b2a233f-d2af-4e33-af80-69e0205df693","resolution":{"observed_at":"2026-08-07T19:54:44.093659Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.669900Z","title":null,"venue":null,"work_id":"4fc88717-6d65-4df6-be68-d86ab32d61c7","year":2022},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":37,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.097433Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:785915890fc0467b1a46e8ece8c5a27ab2a6203176332e04599348cca46e4f35","observation_id":"b445c8b7-5cd7-4287-ae40-ad68ee933964","resolution":{"observed_at":"2026-08-07T19:54:44.673626Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":{"arxiv_id":"0906.4790","last_updated":"2009-06-25T20:11:42Z","snapshot_observed_at":"2026-07-06T01:55:42.869501Z","submitted_at":"2009-06-25T20:11:42Z","title":"Quantum Control of d-Dimensional Quantum Systems with Application to Alkali Atomic Spins","version":1},"cited_work":{"arxiv_id":"0906.4790","doi":null,"metadata_source":"pith","pith_arxiv_id":"0906.4790","snapshot_observed_at":"2026-08-07T19:54:44.330716Z","title":"Quantum Control of d-Dimensional Quantum Systems with Application to Alkali Atomic Spins","venue":"quant-ph","work_id":"b1e67e5e-1380-4fcf-be36-f3c842676aeb","year":2009},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":38,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.101128Z"},"links":{"cited_paper":"/paper/0906.4790","citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:499e3c4c43283f6b8357680b22d5310bfa3d07381ad68854802544ecbcd6b488","observation_id":"52b4b5e7-af5c-444b-91d9-e65130b5a43d","resolution":{"observed_at":"2026-08-07T19:54:44.335775Z","resolver_source":"local_arxiv","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.105256Z","title":null,"venue":null,"work_id":null,"year":2011},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":39,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.105256Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:eb910f22ddc063f5149f7e636801bd44a5821d87f9303b7e269d896f7e895dab","observation_id":"3403f402-6023-4315-ad5e-031a4beef47b","resolution":{"observed_at":"2026-08-07T19:54:44.105256Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.651470Z","title":"Gupta, A","venue":null,"work_id":"8b7fd89a-4898-45cf-b3f4-20a2e832a1fc","year":2024},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":40,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.109056Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:bfaf09f906d232524ced3abd492c5d9012cf3144f85154a72701efcf30fc064c","observation_id":"b8b6f933-36f7-4d60-ad2d-e39e21767aa6","resolution":{"observed_at":"2026-08-07T19:54:44.655170Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.639754Z","title":null,"venue":null,"work_id":"5b25d8e2-4085-4f24-a3ee-ce4b5680fbc1","year":2025},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":41,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.112890Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:8866f2e92baaa0b5ad98dd45dfac8386a318d846216c88cdecf70e3ebcad987b","observation_id":"2a853a85-ec9c-4baf-b531-50c8eb72d6dd","resolution":{"observed_at":"2026-08-07T19:54:44.643764Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.628441Z","title":"Campbell, B","venue":null,"work_id":"5226ee13-b6b1-4820-b03a-6eb0e0fc5209","year":2017},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":42,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.116482Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:959213702493e18451b37f9fc30252253f69185afcdfea8f8b40bd36813db3c7","observation_id":"e3309031-e9b9-47b6-99bf-6156614a82f4","resolution":{"observed_at":"2026-08-07T19:54:44.632232Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.617500Z","title":null,"venue":null,"work_id":"462dfc99-dd0b-4813-bf7b-e95c1fc8b5f3","year":2010},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":43,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.120426Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:411568fc611cc36f0c9e791e36d6461193bff3f06b17b41c1e843b582a3fb379","observation_id":"6591b2c2-6143-4b9f-8efe-db4912c291a7","resolution":{"observed_at":"2026-08-07T19:54:44.621326Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":"10.1063/5.0231566","metadata_source":"openalex","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-10T05:30:23.456663Z","title":null,"venue":"Review of Scientific Instruments","work_id":"5a7b89de-a9e9-4d92-a925-976ef4288da5","year":2024},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":44,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.124266Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:18b7e31d4377f293df0df050b5f68e4b8398318dc92d629b210ca7668da6e39a","observation_id":"fa25b148-3deb-4b57-9131-5189687469b9","resolution":{"observed_at":"2026-08-07T19:54:44.236178Z","resolver_source":"doi","status":"verified_exact"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.605366Z","title":"Asaad, V","venue":null,"work_id":"76c2d697-e71c-49b9-91bf-bdbfdab29c59","year":2020},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":45,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.128376Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:75bc308a2d21ca314c414c82c01b33bbd9fc3b078bda328a1d86ecb5e908dbe1","observation_id":"74072ae4-7600-44d4-8f4f-d006b6aee2b1","resolution":{"observed_at":"2026-08-07T19:54:44.609908Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.132066Z","title":"Khaneja, T","venue":null,"work_id":null,"year":2005},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":46,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.132066Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:831cbe5eb325be2f8352c1734884758caef2c8bd5679cb6e22f2a456facfdd48","observation_id":"9cb34844-dfd8-4c45-99c6-ef2a427ad2b0","resolution":{"observed_at":"2026-08-07T19:54:44.132066Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.588988Z","title":null,"venue":null,"work_id":"c7813fd5-2e79-409e-87a8-b67a2d8b724e","year":1993},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":47,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.135898Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:3aeea282b5e06459be8a6acfe9674880fc484797acc25793bfa86788699ddb32","observation_id":"6184116b-3298-448d-8388-68dc05126d34","resolution":{"observed_at":"2026-08-07T19:54:44.592471Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.578042Z","title":"Castro, A","venue":null,"work_id":"9ace4371-d245-4e80-8d25-9e93de95b9c6","year":2022},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":48,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.139623Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:53a074a5da21bc1e2da8594da5b9fb142883f5833ca36c84facb7609cf128f35","observation_id":"c07b17b8-a05b-42f4-9742-7d86dce1cf5b","resolution":{"observed_at":"2026-08-07T19:54:44.581734Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.566286Z","title":"Castro, qocttools: A program for quantum optimal control calculations, Computer Physics Communications 295, 108983 (2024)","venue":null,"work_id":"35196c0f-2638-4c4e-ae61-4c98016134ed","year":2024},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":49,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.143231Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:62d313e2ea74c3f866ddaf0a637527e5ed6961bd6f6e4a9631bde44e25e9faca","observation_id":"524507d4-ab9f-4d9f-a235-166df46b06f7","resolution":{"observed_at":"2026-08-07T19:54:44.570358Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.553801Z","title":"Peham, E","venue":null,"work_id":"f64af900-8853-4448-8f41-1ee5c63dd090","year":2026},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":50,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.146841Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:883418c98d6c8ec6e7dce68ccee65d6700a04b238c322b42889c9cf1a78806a3","observation_id":"aff6a29b-4e36-419e-b0c3-b2c3a921067e","resolution":{"observed_at":"2026-08-07T19:54:44.557623Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.150545Z","title":null,"venue":null,"work_id":null,"year":2026},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":51,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.150545Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:ae2650064b98d198d7eea4f3f25eef6eda075f85a658fb8b3da2ff4f80aa2fb5","observation_id":"3c15f7d0-31f9-41c1-9fcb-c5d9b0e23a6d","resolution":{"observed_at":"2026-08-07T19:54:44.150545Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.154438Z","title":"Holstein and H","venue":null,"work_id":null,"year":1940},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":52,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.154438Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:81bd3a6702bed0ee787aa19f3e57ed40fb49178363b056749ac86b0434ca911a","observation_id":"c6f3b926-99af-483a-a297-41dc01e6ece9","resolution":{"observed_at":"2026-08-07T19:54:44.154438Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.536343Z","title":null,"venue":null,"work_id":"f23f2ed6-d20c-4997-bbdd-200195d8e673","year":2025},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":53,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.158136Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:4718293e1ff15df68c1dfd8f6bfe5f7da947361641e4a0ab213abc7bfec59b69","observation_id":"8a45397e-855e-40c1-8562-572fcb0d1ef9","resolution":{"observed_at":"2026-08-07T19:54:44.540428Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.161667Z","title":"Aliferis, D","venue":null,"work_id":null,"year":2006},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":54,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.161667Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:ca08849985036126c83fc5e1d504dbca4990f251d204f2973be09a97acc8ff90","observation_id":"52c77e00-177d-4c63-93d8-86cbba8bd5c9","resolution":{"observed_at":"2026-08-07T19:54:44.161667Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.518314Z","title":"Hillmann, F","venue":null,"work_id":"8583589b-18c8-44b2-9493-aac0120e10de","year":2022},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":55,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.165390Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:ab991283fb617bf0fbda0a447ab9a5066c926030cc47ea28e13ab9137412c8f3","observation_id":"c538b53b-7d4c-46be-b61e-974b0b9180d2","resolution":{"observed_at":"2026-08-07T19:54:44.521990Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.506820Z","title":"Hausladen and W","venue":null,"work_id":"e0ff03ec-08e5-407f-85ac-fc18638db9c8","year":1994},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":56,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.170133Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:cbd073c8b0a6438893e1499d53f59a61ef0a7883050cea4cb5210dcc97ca7d04","observation_id":"83f0635f-d953-401f-a19d-392b599de3e1","resolution":{"observed_at":"2026-08-07T19:54:44.510896Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.495935Z","title":null,"venue":null,"work_id":"ae09bbef-6499-4835-a51d-2293bdb1c7a4","year":2024},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":57,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.173764Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:7a65021fe2563e2a3e6f449ac93c32c55ff23dbfe16b2fac8d30a8fe23164309","observation_id":"9f4cb9cc-f156-42f1-9673-704f23f8daaa","resolution":{"observed_at":"2026-08-07T19:54:44.499601Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.177358Z","title":null,"venue":null,"work_id":null,"year":1997},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":58,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.177358Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:7d2e967b76b93b4a7db9620b43ad9738c04a3d00133f26c5d22e8a7304a92e57","observation_id":"b36cccd3-4222-4e5a-b826-ef3533f3ce06","resolution":{"observed_at":"2026-08-07T19:54:44.177358Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.180898Z","title":"Hashim, L","venue":null,"work_id":null,"year":2025},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":59,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.180898Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:dd5b1ce8a8c5caa4bcd5a49a1c2d6ee991383e1ddd7b2c455f763fb1d7a91a40","observation_id":"b6e8101c-eee8-4f4a-a0fe-61a6fdb190e6","resolution":{"observed_at":"2026-08-07T19:54:44.180898Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.187086Z","title":null,"venue":null,"work_id":null,"year":2016},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":60,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.187086Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:5a3d86602b296c7fe47468803da184b3c3fd4129adc8212fb745f1bb5440f815","observation_id":"226c8ebf-8016-4544-bc57-e59b3aaff24c","resolution":{"observed_at":"2026-08-07T19:54:44.187086Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.465100Z","title":"Petiziol, A","venue":null,"work_id":"5cf9f721-5f4c-46d3-a95e-d7cd78041da7","year":2021},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":61,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.191028Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:f4b430fe1d334bc2fc47e2131230571e545166bbe2de97855ec0c4314927ace9","observation_id":"08b57d10-7402-442b-94ff-46e5e805dbf1","resolution":{"observed_at":"2026-08-07T19:54:44.468912Z","resolver_source":"raw_fallback","status":"verified_fuzzy"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.453255Z","title":null,"venue":null,"work_id":"cb92aebe-b64b-432a-995e-3b40a35a0a50","year":1984},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":62,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.194656Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:158f148cf759a65fe029f7b9e69857433d540df838ec835d1f387813dded959d","observation_id":"98dbbdd3-e47a-46cf-8afb-60bc7fe9d0a5","resolution":{"observed_at":"2026-08-07T19:54:44.457000Z","resolver_source":"raw_fallback","status":"unresolved"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":null,"pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.198397Z","title":null,"venue":null,"work_id":null,"year":2011},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":63,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.198397Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:f3a06a1aa77a5f7b318fa63d5950489ce83d61d52a138833caf03f86c43ec93d","observation_id":"a69f9f45-eccb-4c76-9746-dadda8efd4b3","resolution":{"observed_at":"2026-08-07T19:54:44.198397Z","resolver_source":null,"status":"unresolved"},"standing_notice":{"events":[],"reason":"canonical_work_link_unavailable","source_receipts":[],"state":"unavailable"}},{"citation":{"cited_paper":null,"cited_work":{"arxiv_id":null,"doi":null,"metadata_source":"raw_reference","pith_arxiv_id":null,"snapshot_observed_at":"2026-08-07T19:54:44.434570Z","title":null,"venue":null,"work_id":"4e610c0c-cdeb-445f-be77-2bb3ef5cd34d","year":1969},"citing_paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes","version":1},"reference_index":64,"source":"pdf_text","source_observed_at":"2026-08-07T19:54:44.201954Z"},"links":{"citing_paper":"/paper/2608.05992"},"observation_digest":"sha256:8ce0b308da00d82ace18d704cf19238ed18234e6a1e888a3aa253ed0d1981699","observation_id":"6d23bd72-5a31-4d8d-88d1-69bcdbd99776","resolution":{"observed_at":"2026-08-07T19:54:44.438512Z","resolver_source":"raw_fallback","status":"malformed_identifier"},"standing_notice":{"events":[],"observation":"No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.","reason":null,"source_receipts":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"state":"measured"}}],"paper":{"arxiv_id":"2608.05992","last_updated":"2026-08-06T13:04:40Z","latest_version":1,"primary_category":"quant-ph","snapshot_observed_at":"2026-08-09T23:44:37.847548Z","submitted_at":"2026-08-06T13:04:40Z","title":"Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes"},"reference_resolution":{"displayed":64,"state_counts":{"malformed_identifier":1,"metadata_mismatch":0,"parse_uncertain":0,"unresolved":46,"verified_exact":2,"verified_fuzzy":15},"total_outbound_references":64},"refusal":"A citation records a reference. It does not transfer a finding from one paper to another.","schema":"pith.paper-citation-record.v1","standing_sources":[{"observed_at":"2026-08-10T06:31:04.303077+00:00","source":"crossref"},{"observed_at":"2026-08-10T06:30:57.382061+00:00","source":"retraction_watch"}],"thesis":"As of 10 August 2026, this Paper Citation Record lists 64 of 64 outbound references and 0 inbound Pith citation observations for arXiv:2608.05992."}