{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2000:CYWJUEYHXCYW73RSH6UFJYI2QM","short_pith_number":"pith:CYWJUEYH","schema_version":"1.0","canonical_sha256":"162c9a1307b8b16fee323fa854e11a831cdac2443fe5eef34a27071e188f6ec3","source":{"kind":"arxiv","id":"cond-mat/0002264","version":1},"attestation_state":"computed","paper":{"title":"Ion-Beam Induced Current in High-Resistance Materials","license":"","headline":"","cross_cats":[],"primary_cat":"cond-mat","authors_text":"E. P. Yukalova, V. I. Yukalov","submitted_at":"2000-02-17T09:37:34Z","abstract_excerpt":"The peculiarities of electric current in high-resistance materials, such as semiconductors or semimetals, irradiated by ion beams are considered. It is shown that after ion--beam irradiation an unusual electric current may arise directed against the applied voltage. Such a negative current is a transient effect appearing at the initial stage of the process. The possibility of using this effect for studying the characteristics of irradiated materials is discussed. A new method for defining the mean projected range of ions is suggested."},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"cond-mat/0002264","kind":"arxiv","version":1},"metadata":{"license":"","primary_cat":"cond-mat","submitted_at":"2000-02-17T09:37:34Z","cross_cats_sorted":[],"title_canon_sha256":"dc2a2b4bb2dcb599f7da28253ca70f1c4bc13e01f99e60fa8ace5cdf8843c03f","abstract_canon_sha256":"d7d9d0763a05d6e31b66a36a65048ae4332a69c895b39886ad44e0023112e189"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T01:40:09.039027Z","signature_b64":"G22ZOmM0xrk/GERiOPrhw+ZtYwDhvkIq508aAZMeJFUuZyZ5GltNY84xCNW/MM/sn1c9Cugp1secrQ2wDIk/BQ==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"162c9a1307b8b16fee323fa854e11a831cdac2443fe5eef34a27071e188f6ec3","last_reissued_at":"2026-05-18T01:40:09.038263Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T01:40:09.038263Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Ion-Beam Induced Current in High-Resistance Materials","license":"","headline":"","cross_cats":[],"primary_cat":"cond-mat","authors_text":"E. P. Yukalova, V. I. Yukalov","submitted_at":"2000-02-17T09:37:34Z","abstract_excerpt":"The peculiarities of electric current in high-resistance materials, such as semiconductors or semimetals, irradiated by ion beams are considered. It is shown that after ion--beam irradiation an unusual electric current may arise directed against the applied voltage. Such a negative current is a transient effect appearing at the initial stage of the process. The possibility of using this effect for studying the characteristics of irradiated materials is discussed. A new method for defining the mean projected range of ions is suggested."},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"cond-mat/0002264","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"cond-mat/0002264","created_at":"2026-05-18T01:40:09.038396+00:00"},{"alias_kind":"arxiv_version","alias_value":"cond-mat/0002264v1","created_at":"2026-05-18T01:40:09.038396+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.cond-mat/0002264","created_at":"2026-05-18T01:40:09.038396+00:00"},{"alias_kind":"pith_short_12","alias_value":"CYWJUEYHXCYW","created_at":"2026-05-18T12:25:49.631198+00:00"},{"alias_kind":"pith_short_16","alias_value":"CYWJUEYHXCYW73RS","created_at":"2026-05-18T12:25:49.631198+00:00"},{"alias_kind":"pith_short_8","alias_value":"CYWJUEYH","created_at":"2026-05-18T12:25:49.631198+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/CYWJUEYHXCYW73RSH6UFJYI2QM","json":"https://pith.science/pith/CYWJUEYHXCYW73RSH6UFJYI2QM.json","graph_json":"https://pith.science/api/pith-number/CYWJUEYHXCYW73RSH6UFJYI2QM/graph.json","events_json":"https://pith.science/api/pith-number/CYWJUEYHXCYW73RSH6UFJYI2QM/events.json","paper":"https://pith.science/paper/CYWJUEYH"},"agent_actions":{"view_html":"https://pith.science/pith/CYWJUEYHXCYW73RSH6UFJYI2QM","download_json":"https://pith.science/pith/CYWJUEYHXCYW73RSH6UFJYI2QM.json","view_paper":"https://pith.science/paper/CYWJUEYH","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=cond-mat/0002264&json=true","fetch_graph":"https://pith.science/api/pith-number/CYWJUEYHXCYW73RSH6UFJYI2QM/graph.json","fetch_events":"https://pith.science/api/pith-number/CYWJUEYHXCYW73RSH6UFJYI2QM/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/CYWJUEYHXCYW73RSH6UFJYI2QM/action/timestamp_anchor","attest_storage":"https://pith.science/pith/CYWJUEYHXCYW73RSH6UFJYI2QM/action/storage_attestation","attest_author":"https://pith.science/pith/CYWJUEYHXCYW73RSH6UFJYI2QM/action/author_attestation","sign_citation":"https://pith.science/pith/CYWJUEYHXCYW73RSH6UFJYI2QM/action/citation_signature","submit_replication":"https://pith.science/pith/CYWJUEYHXCYW73RSH6UFJYI2QM/action/replication_record"}},"created_at":"2026-05-18T01:40:09.038396+00:00","updated_at":"2026-05-18T01:40:09.038396+00:00"}