{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2016:DWD4FODMTBHVJXWPU475WOTSTX","short_pith_number":"pith:DWD4FODM","schema_version":"1.0","canonical_sha256":"1d87c2b86c984f54decfa73fdb3a729dcfd9f4924d517049aa7bdef952e711aa","source":{"kind":"arxiv","id":"1612.09386","version":1},"attestation_state":"computed","paper":{"title":"Nanoscale characterization of bismuth telluride epitaxic layers by advanced X-ray analysis","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.mtrl-sci","authors_text":"Celso I. Fornari, Eduardo Abramof, Paulo H. O. Rappl, S\\'ergio L. Morelh\\~ao","submitted_at":"2016-12-30T04:43:36Z","abstract_excerpt":"Topological insulator surface properties are strongly correlated to structural properties, requiring high-resolution techniques capable of probing both surface and bulk structures at once. In this work, high flux of synchrotron source, recursive equations for fast X-ray dynamical diffraction simulation, and genetic algorithm for data fitting are combined to reveal the detailed structure of bismuth telluride epitaxic films with thickness ranging from 8 to 168 nm. It includes stacking sequences, thickness and composition of layers in model structures, interface coherence, surface termination and"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"1612.09386","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cond-mat.mtrl-sci","submitted_at":"2016-12-30T04:43:36Z","cross_cats_sorted":[],"title_canon_sha256":"07e6fcd9ad753936b0259ec00cc0217b6c2faf1275379c2e56a32059c0bd5734","abstract_canon_sha256":"812f508b79448724f6746959989d2468df4482aa174b0503459251e5b7addf11"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T00:53:41.645380Z","signature_b64":"A6LGP4tJVBGkU5L/obev9+aUj1khbFoLlsF/9DeWjCRGlmy/y6dlTlPTL6Wawh4Z2jZWISdjCrx+G/qDbOGbDg==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"1d87c2b86c984f54decfa73fdb3a729dcfd9f4924d517049aa7bdef952e711aa","last_reissued_at":"2026-05-18T00:53:41.644948Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T00:53:41.644948Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Nanoscale characterization of bismuth telluride epitaxic layers by advanced X-ray analysis","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":[],"primary_cat":"cond-mat.mtrl-sci","authors_text":"Celso I. Fornari, Eduardo Abramof, Paulo H. O. Rappl, S\\'ergio L. Morelh\\~ao","submitted_at":"2016-12-30T04:43:36Z","abstract_excerpt":"Topological insulator surface properties are strongly correlated to structural properties, requiring high-resolution techniques capable of probing both surface and bulk structures at once. In this work, high flux of synchrotron source, recursive equations for fast X-ray dynamical diffraction simulation, and genetic algorithm for data fitting are combined to reveal the detailed structure of bismuth telluride epitaxic films with thickness ranging from 8 to 168 nm. It includes stacking sequences, thickness and composition of layers in model structures, interface coherence, surface termination and"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1612.09386","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"1612.09386","created_at":"2026-05-18T00:53:41.645027+00:00"},{"alias_kind":"arxiv_version","alias_value":"1612.09386v1","created_at":"2026-05-18T00:53:41.645027+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1612.09386","created_at":"2026-05-18T00:53:41.645027+00:00"},{"alias_kind":"pith_short_12","alias_value":"DWD4FODMTBHV","created_at":"2026-05-18T12:30:12.583610+00:00"},{"alias_kind":"pith_short_16","alias_value":"DWD4FODMTBHVJXWP","created_at":"2026-05-18T12:30:12.583610+00:00"},{"alias_kind":"pith_short_8","alias_value":"DWD4FODM","created_at":"2026-05-18T12:30:12.583610+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/DWD4FODMTBHVJXWPU475WOTSTX","json":"https://pith.science/pith/DWD4FODMTBHVJXWPU475WOTSTX.json","graph_json":"https://pith.science/api/pith-number/DWD4FODMTBHVJXWPU475WOTSTX/graph.json","events_json":"https://pith.science/api/pith-number/DWD4FODMTBHVJXWPU475WOTSTX/events.json","paper":"https://pith.science/paper/DWD4FODM"},"agent_actions":{"view_html":"https://pith.science/pith/DWD4FODMTBHVJXWPU475WOTSTX","download_json":"https://pith.science/pith/DWD4FODMTBHVJXWPU475WOTSTX.json","view_paper":"https://pith.science/paper/DWD4FODM","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=1612.09386&json=true","fetch_graph":"https://pith.science/api/pith-number/DWD4FODMTBHVJXWPU475WOTSTX/graph.json","fetch_events":"https://pith.science/api/pith-number/DWD4FODMTBHVJXWPU475WOTSTX/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/DWD4FODMTBHVJXWPU475WOTSTX/action/timestamp_anchor","attest_storage":"https://pith.science/pith/DWD4FODMTBHVJXWPU475WOTSTX/action/storage_attestation","attest_author":"https://pith.science/pith/DWD4FODMTBHVJXWPU475WOTSTX/action/author_attestation","sign_citation":"https://pith.science/pith/DWD4FODMTBHVJXWPU475WOTSTX/action/citation_signature","submit_replication":"https://pith.science/pith/DWD4FODMTBHVJXWPU475WOTSTX/action/replication_record"}},"created_at":"2026-05-18T00:53:41.645027+00:00","updated_at":"2026-05-18T00:53:41.645027+00:00"}