{"record_type":"pith_number_record","schema_url":"https://pith.science/schemas/pith-number/v1.json","pith_number":"pith:2014:RGX6RUDEGTLW76W3HGFQFGI26W","short_pith_number":"pith:RGX6RUDE","schema_version":"1.0","canonical_sha256":"89afe8d06434d76ffadb398b02991af59247d8a161c48a2a909edfce91b8d1eb","source":{"kind":"arxiv","id":"1412.6271","version":1},"attestation_state":"computed","paper":{"title":"Nano-artifact metrics based on random collapse of resist","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cond-mat.mes-hall","cs.ET"],"primary_cat":"cs.CR","authors_text":"Daiki Sekiguchi, Kenta Hanaki, Makoto Naruse, Mikio Ishikawa, Morihisa Hoga, Motoichi Ohtsu, Naoya Tate, Ryosuke Suzuki, Tsutomu Matsumoto, Yasuyuki Ohyagi","submitted_at":"2014-12-19T10:18:09Z","abstract_excerpt":"Artifact metrics is an information security technology that uses the intrinsic characteristics of a physical object for authentication and clone resistance. Here, we demonstrate nano-artifact metrics based on silicon nanostructures formed via an array of resist pillars that randomly collapse when exposed to electron-beam lithography. The proposed technique uses conventional and scalable lithography processes, and because of the random collapse of resist, the resultant structure has extremely fine-scale morphology with a minimum dimension below 10 nm, which is less than the resolution of curren"},"verification_status":{"content_addressed":true,"pith_receipt":true,"author_attested":false,"weak_author_claims":0,"strong_author_claims":0,"externally_anchored":false,"storage_verified":false,"citation_signatures":0,"replication_records":0,"graph_snapshot":true,"references_resolved":false,"formal_links_present":false},"canonical_record":{"source":{"id":"1412.6271","kind":"arxiv","version":1},"metadata":{"license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","primary_cat":"cs.CR","submitted_at":"2014-12-19T10:18:09Z","cross_cats_sorted":["cond-mat.mes-hall","cs.ET"],"title_canon_sha256":"cf5b34007d710350a9859d6d98b0b87dea0a9fe19af979f60befbec20f421b73","abstract_canon_sha256":"09f48275f66a175b0a7e7c3e3849e7051c8033de91866794d38dea9b91de8a3a"},"schema_version":"1.0"},"receipt":{"kind":"pith_receipt","key_id":"pith-v1-2026-05","algorithm":"ed25519","signed_at":"2026-05-18T02:30:53.934213Z","signature_b64":"+yJ4S4JfOXGqUm4KWXBXyGUVBC/KJNqIXWbCcF3B2yvoEvp4wvw6Y3sGdtknI7i8h4gU4rkk6UkKIYaLDzk3AA==","signed_message":"canonical_sha256_bytes","builder_version":"pith-number-builder-2026-05-17-v1","receipt_version":"0.3","canonical_sha256":"89afe8d06434d76ffadb398b02991af59247d8a161c48a2a909edfce91b8d1eb","last_reissued_at":"2026-05-18T02:30:53.933564Z","signature_status":"signed_v1","first_computed_at":"2026-05-18T02:30:53.933564Z","public_key_fingerprint":"8d4b5ee74e4693bcd1df2446408b0d54"},"graph_snapshot":{"paper":{"title":"Nano-artifact metrics based on random collapse of resist","license":"http://arxiv.org/licenses/nonexclusive-distrib/1.0/","headline":"","cross_cats":["cond-mat.mes-hall","cs.ET"],"primary_cat":"cs.CR","authors_text":"Daiki Sekiguchi, Kenta Hanaki, Makoto Naruse, Mikio Ishikawa, Morihisa Hoga, Motoichi Ohtsu, Naoya Tate, Ryosuke Suzuki, Tsutomu Matsumoto, Yasuyuki Ohyagi","submitted_at":"2014-12-19T10:18:09Z","abstract_excerpt":"Artifact metrics is an information security technology that uses the intrinsic characteristics of a physical object for authentication and clone resistance. Here, we demonstrate nano-artifact metrics based on silicon nanostructures formed via an array of resist pillars that randomly collapse when exposed to electron-beam lithography. The proposed technique uses conventional and scalable lithography processes, and because of the random collapse of resist, the resultant structure has extremely fine-scale morphology with a minimum dimension below 10 nm, which is less than the resolution of curren"},"claims":{"count":0,"items":[],"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"source":{"id":"1412.6271","kind":"arxiv","version":1},"verdict":{"id":null,"model_set":{},"created_at":null,"strongest_claim":"","one_line_summary":"","pipeline_version":null,"weakest_assumption":"","pith_extraction_headline":""},"references":{"count":0,"sample":[],"resolved_work":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57","internal_anchors":0},"formal_canon":{"evidence_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"author_claims":{"count":0,"strong_count":0,"snapshot_sha256":"258153158e38e3291e3d48162225fcdb2d5a3ed65a07baac614ab91432fd4f57"},"builder_version":"pith-number-builder-2026-05-17-v1"},"aliases":[{"alias_kind":"arxiv","alias_value":"1412.6271","created_at":"2026-05-18T02:30:53.933663+00:00"},{"alias_kind":"arxiv_version","alias_value":"1412.6271v1","created_at":"2026-05-18T02:30:53.933663+00:00"},{"alias_kind":"doi","alias_value":"10.48550/arxiv.1412.6271","created_at":"2026-05-18T02:30:53.933663+00:00"},{"alias_kind":"pith_short_12","alias_value":"RGX6RUDEGTLW","created_at":"2026-05-18T12:28:46.137349+00:00"},{"alias_kind":"pith_short_16","alias_value":"RGX6RUDEGTLW76W3","created_at":"2026-05-18T12:28:46.137349+00:00"},{"alias_kind":"pith_short_8","alias_value":"RGX6RUDE","created_at":"2026-05-18T12:28:46.137349+00:00"}],"events":[],"event_summary":{},"paper_claims":[],"inbound_citations":{"count":0,"internal_anchor_count":0,"sample":[]},"formal_canon":{"evidence_count":0,"sample":[],"anchors":[]},"links":{"html":"https://pith.science/pith/RGX6RUDEGTLW76W3HGFQFGI26W","json":"https://pith.science/pith/RGX6RUDEGTLW76W3HGFQFGI26W.json","graph_json":"https://pith.science/api/pith-number/RGX6RUDEGTLW76W3HGFQFGI26W/graph.json","events_json":"https://pith.science/api/pith-number/RGX6RUDEGTLW76W3HGFQFGI26W/events.json","paper":"https://pith.science/paper/RGX6RUDE"},"agent_actions":{"view_html":"https://pith.science/pith/RGX6RUDEGTLW76W3HGFQFGI26W","download_json":"https://pith.science/pith/RGX6RUDEGTLW76W3HGFQFGI26W.json","view_paper":"https://pith.science/paper/RGX6RUDE","resolve_alias":"https://pith.science/api/pith-number/resolve?arxiv=1412.6271&json=true","fetch_graph":"https://pith.science/api/pith-number/RGX6RUDEGTLW76W3HGFQFGI26W/graph.json","fetch_events":"https://pith.science/api/pith-number/RGX6RUDEGTLW76W3HGFQFGI26W/events.json","actions":{"anchor_timestamp":"https://pith.science/pith/RGX6RUDEGTLW76W3HGFQFGI26W/action/timestamp_anchor","attest_storage":"https://pith.science/pith/RGX6RUDEGTLW76W3HGFQFGI26W/action/storage_attestation","attest_author":"https://pith.science/pith/RGX6RUDEGTLW76W3HGFQFGI26W/action/author_attestation","sign_citation":"https://pith.science/pith/RGX6RUDEGTLW76W3HGFQFGI26W/action/citation_signature","submit_replication":"https://pith.science/pith/RGX6RUDEGTLW76W3HGFQFGI26W/action/replication_record"}},"created_at":"2026-05-18T02:30:53.933663+00:00","updated_at":"2026-05-18T02:30:53.933663+00:00"}