Scanning noise microscopy detects a near-field signal from hot electrons at a buried InSb/CdTe interface, but the claimed origin in Coulomb scattering by charged ions is inferred rather than directly proven.
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Local Detection of Enhanced Hot Electron Scattering in InSb/CdTe Heterostructure Interface
Scanning noise microscopy detects a near-field signal from hot electrons at a buried InSb/CdTe interface, but the claimed origin in Coulomb scattering by charged ions is inferred rather than directly proven.