Pith. sign in

REVIEW

Epitaxial Growth of 2D Layered Transition Metal Dichalcogenides

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 1909.03502 v1 pith:FCQWXQWZ submitted 2019-09-08 cond-mat.mtrl-sci

classification cond-mat.mtrl-sci
keywords crystalsepitaxialepitaxyfilmsgrowthalongcharacterizationincluding
verification ladder T0 review T1 audit T2 compute T3 formal

Signed reviews

No signed human review yet.

0 comments
read the original abstract

Transition metal dichalcogenide (TMD) monolayers and heterostructures have emerged as a compelling class of materials with transformative new science that may be harnessed for novel device technologies. These materials are commonly fabricated by exfoliation of flakes from bulk crystals, but wafer-scale epitaxy of single crystal films is required to advance the field. This article reviews the fundamental aspects of epitaxial growth of van der Waals bonded crystals specific to TMD films. The structural and electronic properties of TMD crystals are initially described along with sources and methods used for vapor phase deposition. Issues specific to TMD epitaxy are critically reviewed including substrate properties and film-substrate orientation and bonding. The current status of TMD epitaxy on different substrate types is discussed along with characterization techniques for large area epitaxial films. Future directions are proposed including developments in substrates, in situ and full wafer characterization techniques and heterostructure growth.

Discussion (0). Continue with ORCID to comment.

Pith tools