REVIEW
Development of a method to measure trace level of uranium and thorium in scintillation films
Not yet reviewed by Pith; the record is open.
This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.
SPECIMEN: schema-true, not a live event
T0 review · schema-true
One-sentence machine reading of the paper's core claim.
pith:XXXXXXXX · record.json · timestamp
Development of a method to measure trace level of uranium and thorium in scintillation films
read the original abstract
We have established a method to measure picograms-per-gram (pg g$^{-1}$) levels of $^{238}$U and $^{232}$Th in scintillation films by combining the dry ashing method and inductively coupled plasma mass spectrometry. Trace amounts of $^{238}$U and $^{232}$Th were measured in up to 2~g of the scintillation film with almost 100% collection efficiency. This paper details the experimental procedure, including the pretreatment of the samples and labware, detection limit of the method, collection efficiencies of $^{238}$U and $^{232}$Th, and measurement of $^{238}$U and $^{232}$Th in a polyethylene naphthalate film. This method is also applicable to $^{238}$U and $^{232}$Th measurements in other low-background organic materials for rare event search experiments.
discussion (0)
Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.