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Characterization of 4H-SiC Low Gain Avalanche Detectors (LGADs)
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abstract
4H-SiC low gain avalanche detectors (LGADs) have been fabricated and characterized. The devices employ a circular mesa design with low-resistivity contacts and an SiO$_2$ passivation layer. The I-V and C-V characteristics of the 4H-SiC LGADs are compared with complementary 4H-SiC PiN diodes to confirm a high breakdown voltage and low leakage current. Both LGADs and PiN diodes were irradiated with $\alpha$ particles from a $^{210}_{84}\rm{Po}$ source. The charge collected by each device was compared, and it was observed that low-gain charge carrier multiplication is achieved in the 4H-SiC LGAD.
Forward citations
Cited by 2 Pith papers
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Time Resolution Characterization of 4H-SiC LGADs with a ${}^{90}$Sr Source
4H-SiC LGADs achieve 61 ps time resolution with 90Sr beta particles, comparable to Si LGADs, with limited collected charge identified as the current bottleneck.
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Impact of Proton Irradiation on 4H-SiC Low Gain Avalanche Detectors (LGADs)
Proton irradiation reduces the gain and rectification of 4H-SiC LGADs through gain-layer compensation and defect-limited impact ionization, yet the devices remain operational at fluences up to 3.33e14 p/cm2.
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