Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
A Novel Approach for Semiconductor Etching Process with Inductive Biases
As of 14 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:2104.02468.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-14T06:32:32.682623+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-08-07T15:12:24.738374Z
A source-named dated measurement, never combined with another source.
Source: pith, observed 2026-08-07T15:12:27.170546Z
Reference resolution
0 of 0 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
No outbound reference observations are available for this paper version.
Pith citing papers
Observation f51d7a66-579b-4c0a-b8b9-4335202530b4 · inbound
Few-Shot Test-Time Optimization Without Retraining for Semiconductor Recipe Generation and Beyond cites this paper.
Few-Shot Test-Time Optimization Without Retraining for Semiconductor Recipe Generation and Beyond A Novel Approach for Semiconductor Etching Process with Inductive Biases
Reference 32
- Resolution
- verified exact
- local_arxiv, observed 2026-08-07T15:12:27.296802Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.