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Measurement of the ${}^{136}$Xe two-neutrino double beta decay half-life via direct background subtraction in NEXT
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abstract
We report a measurement of the half-life of the ${}^{136}$Xe two-neutrino double beta decay performed with a novel direct background subtraction technique. The analysis relies on the data collected with the NEXT-White detector operated with ${}^{136}$Xe-enriched and ${}^{136}$Xe-depleted xenon, as well as on the topology of double-electron tracks. With a fiducial mass of only 3.5 kg of Xe, a half-life of $2.34^{+0.80}_{-0.46}\textrm{(stat)}^{+0.30}_{-0.17}\textrm{(sys)}\times10^{21}~\textrm{yr}$ is derived from the background-subtracted energy spectrum. The presented technique demonstrates the feasibility of unique background-model-independent neutrinoless double beta decay searches.
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Cited by 1 Pith paper
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Search for Double Beta Decay of $^{136}$Xe to the $0^+_1$ Excited State of $^{136}$Ba with PandaX-4T
PandaX-4T finds no double beta decay of 136Xe to the 0+1 excited state of 136Ba and sets a half-life limit of 7.5e22 years at 90% confidence.
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