REVIEW 4 major objections 7 minor 2 cited by
Exploiting epitaxial strained germanium for scaling low noise spin qubits at the micron-scale
T0 review · 4 major / 7 minor · reviewed 2026-08-12 · deepseek-v4-flash
Pith's one-line read Strained germanium grown on germanium wafers sets a low charge-noise benchmark for hole spin qubits and identifies the 73Ge and 29Si nuclear baths that must be purified to reach long coherence.
desk verdict Solid experimental noise benchmarking on a promising platform: the charge-noise numbers and the first 29Si coherence modulation in Ge/SiGe qubits are the real new results, but the low-frequency noise attribution could use one more discriminating check. read the letter →
The pith
A machine-rendered reading of the paper's core claim, the machinery that carries it, and where it could break.
The reading
What carries the argument
The load-bearing object is the epitaxial stack: a strained 16 nm Ge quantum well in a SiGe barrier grown on a Ge wafer with a low threading-dislocation density, whose reduced lattice mismatch suppresses disorder. The load-bearing instrument is the qubit used as a local spectrometer: Carr-Purcell-Meiboom-Gill trains of $N$ refocusing pulses ($N=1,\dots,64$) act as tunable frequency filters, and the decay of each echo sequence as a function of wait time $\tau$ maps the power spectral density $S_{f_L}(f)$ of Larmor-frequency noise. That noise is described by the model $$S_{f_L}(f)=\frac{S_0}{f}+S_{0,\mathrm{hf}}\,$e^{{-(f-f_{^{73}}$\mathrm{Ge}})^2/(2\sigma_{^{73}\mathrm{Ge}}^2)}$$ (with a second Gaussian for $^{29}$Si), where the $S_0/f$ term is interpreted as charge noise coupling through the spin-orbit interaction and the Gaussian peaks are hyperfine noise from spinful nuclei; fitting the echo data against this model yields the paper's central numbers.
What would settle it
Repeat the CPMG-64 experiment on the same device geometry with an isotopically purified stack ($^{70}$Ge quantum well and $^{28}$Si$^{70}$Ge barriers, residual $^{73}$Ge and $^{29}$Si below 0.01%). If the attribution is right, the collapse-and-revival dips at $\gamma_{{}^{73}\mathrm{Ge}}B$ and $\gamma_{{}^{29}\mathrm{Si}}B$ should disappear while the $S_0/f$ term stays at about $0.17\times 10^9\ \mathrm{Hz}^2/\mathrm{Hz}$; if the $1/f$ term also drops or reshapes, slow nuclear-spin diffusion was contributing to the low-frequency noise all along.
Extended reading notes
Core claim
On the paper's own terms, the central discovery is that a Ge/SiGe heterostructure grown on a Ge wafer combines the two properties a scalable spin-qubit platform needs: low electrical noise and measurable, countable magnetic noise sources. Charge-noise spectroscopy on devices containing up to ten quantum dots and four radio-frequency charge sensors returns $\sqrt{S_0}=0.3(1)\ \mu\mathrm{eV}/\sqrt{\mathrm{Hz}}$ at 1 Hz, and Coulomb-peak tracking at 10 mHz gives comparable noise that is uniform across a 1.5 $\mu$m array. The paper then establishes hole-spin qubit control in the same material and, through CPMG-N noise spectroscopy, shows that the qubit frequency noise is a $1/f$ component plus Gaussian peaks at the Larmor precession frequencies of $^{73}$Ge and $^{29}$Si nuclei. From those peaks it extracts integrated hyperfine noise amplitudes $\sigma_f = 180(8)$ kHz for $^{73}$Ge and $\sigma_f = 47(5)$ kHz for $^{29}$Si, so that the coherence of natural-germanium qubits is set by nuclear spins, while the $1/f$ component is attributed to charge noise and sets a much weaker limit once the nuclei are removed.
Load-bearing premise
The qubit-noise model attributes the slow, 1/f part of the measured frequency wobble to charge noise in the device; if slow nuclear-spin diffusion is actually producing that part, the extracted voltage-noise levels and the charge-noise-limited coherence times would need to be revised.
Editorial extensions
If this is right
- Charge noise stays low as devices grow: the ten-dot, four-sensor array shows comparable noise to small linear arrays across a 1.5 $\mu$m distance, so the platform does not obviously degrade when scaled to dense, micron-scale circuits.
- At magnetic fields below roughly 150 mT, $^{73}$Ge hyperfine noise dominates qubit decoherence; above it, charge noise through spin-orbit coupling takes over, so operating-field choice and material purity are both controllable levers.
- The demonstrated $^{29}$Si coherence modulation means the hole wavefunction reaches into the SiGe barrier, so isotopic purification must include the barrier layers, not only the germanium quantum well.
- With both nuclear baths removed, the paper projects Hahn-echo times near 0.4 ms at 10 mT (versus tens of microseconds measured in natural material), quantifying the coherence gain available from purification.
- The spin-echo-derived voltage noise of $12(1)\ \mu\mathrm{V}/\sqrt{\mathrm{Hz}}$ at 1 Hz is a factor of two better than the comparable silicon-substrate device in the reference it builds on, consistent with the directly measured charge-noise improvement.
Reading between the lines
- If threading dislocations are the dominant charge-noise source, then pushing dislocation density further down in Ge-wafer growth should directly lower $\sqrt{S_0}$; this is an extension of the paper's speculation, not one of its measurements.
- The $^{29}$Si signature could be used as a routine wafer-screening metric: the CPMG intensity of the $^{29}$Si dip at a few sites should correlate with interface abruptness, giving a quick quality flag before full qubit fabrication.
- Local spin-echo mapping across the 2D array (three qubit sites here) could be extended to every dot in the array to produce a noise map that directly guides which dots are most suitable as logical qubits.
- The same CPMG-plus-model protocol can be run on other spin-qubit materials to build comparable noise budgets, since it yields separate numbers for charge and hyperfine noise without needing a second device.
Signed reviews
Editorial analysis
A structured set of objections, weighed in public.
Referee Report
Summary. The manuscript characterizes charge and magnetic noise in Ge/SiGe heterostructures grown on Ge wafers. Using flank and Coulomb-peak-tracking methods on small linear arrays and on a 3-4-3 ten-dot array with four rf sensors, the authors report an average charge noise of sqrt(S0) = 0.3(1) ueV/sqrt(Hz) at 1 Hz and comparable noise at 10 mHz across a 1.5 um scale. They then demonstrate EDSR control of hole spin qubits and use CPMG-N sequences to fit a noise model comprising a 1/f term and a Gaussian peak at the 73Ge Larmor frequency, extracting S0, S0,hf, and sigma_Ge-73. From these fitted parameters they derive an effective voltage noise of 12(1) uV/sqrt(Hz) at 1 Hz and charge-noise-limited T2* estimates of 3.7(3) us at 117.5 mT and 44(4) us at 10 mT. They also observe a coherence dip in CPMG-64 data, attribute it to 29Si in the SiGe barriers, and extract a gyromagnetic ratio of 8.6(9) MHz/T and an integrated 29Si hyperfine noise amplitude of 47(5) kHz. The paper concludes with predictions for coherence improvements under isotopic purification.
Significance. If the extracted parameters hold, this work provides a valuable benchmark for hole spin qubits in strained Ge: a low and spatially uniform charge noise at the micron scale, a quantitative decomposition of electrical versus hyperfine noise, and a falsifiable 29Si signature. The open data repository, the use of two independent electrical noise methods, and the gyromagnetic-ratio check for 29Si are notable strengths that enhance reproducibility. The main caveat is that the spin-echo-derived low-frequency component is assigned to charge noise on plausibility grounds; however, the direct electrical charge-noise measurements are model-independent and constitute the core benchmark. The quantitative noise budget and the prediction of coherence gains from isotopic purification are of clear interest to the semiconductor spin qubit community.
major comments (4)
- [Charge and hyperfine noise in hole spin qubits (Eq. 9 and Methods, 'Charge noise-limited T2*')] The low-frequency term S0/f in Eq. (9) is assigned to charge noise, and this assignment is load-bearing for the voltage-noise conversion in Eq. (1), the claimed two-fold improvement over Ref. [29], and the charge-noise-limited T2* predictions in the Methods. The paper explicitly acknowledges that slow nuclear diffusion could contribute to this term, and the supporting consistency check (120(10) versus 80(60) uV/sqrt(Hz) at 10 mHz) compares different devices and dots with large scatter. I request either a control fit of the CPMG data with an alternative low-frequency spectral shape (e.g., f^-2 or a zero-frequency Lorentzian) showing that S0 and the derived voltage noise are stable, or a direct measurement that isolates charge noise (e.g., simultaneous qubit and sensor noise correlation), or a clear qualification that the voltage-noise and T2* numbers are conditional on this assumption. Without one of these, the spin-echo-derived voltage-noise claim is not fully supported.
- [Methods, 'Estimation of the hyperfine coupling constants', Eq. (11)] The integrated hyperfine noise sigma_f = 180(8) kHz and T2* = 1.25(5) us are computed from the Gaussian parameters S0,hf and sigma_Ge-73 that were fitted to the same CPMG traces used to build the model. These numbers are therefore model outputs rather than independent determinations, and the quoted uncertainties omit systematic contributions from the model form and the filter-function implementation. To make the estimates falsifiable, please report Ramsey free-induction decay measurements on the same qubits (or an independent measurement of the Overhauser field distribution) and/or state the sensitivity of sigma_f to the fitting range and to the choice of filter function.
- [Eq. (1) and surrounding text in 'Charge and hyperfine noise in hole spin qubits'] The conversion from S0 to voltage noise via Eq. (1) uses the g-factor susceptibility Delta_g/Delta_V = 6.7e-4 mV^-1 taken from Ref. [54] (a preprint) without an uncertainty, and assumes spatially homogeneous, uncorrelated traps under the gates. The propagation of only the statistical uncertainty in S0 leads to the quoted sqrt(S_V) = 12(1) uV/sqrt(Hz), which is misleading given the systematic uncertainty in the susceptibility and the correlation assumption. Please provide the source and uncertainty of Delta_g/Delta_V and discuss how correlated fluctuations would modify the result, or present this value with a clear caveat.
- [Hyperfine interaction with 29Si nuclei, Fig. 4] The identification of the 29Si hyperfine signature rests on the harmonic choice n=2 in f_dip = (2n-1)/(2 t_dip) and on a two-stage fit of Eq. (10) in which the 73Ge parameters are fixed. The extracted gyromagnetic ratio 8.6(9) MHz/T is consistent with 29Si, but only three field points and one dip are used, and the quoted sigma_Si-29 = 99(20) kHz likely depends on the fitting range and on the fixed 73Ge parameters. Please justify the harmonic assignment, report the stability of the 29Si parameters to these choices, and provide residuals or a goodness-of-fit metric for the fits in Fig. 4a.
minor comments (7)
- [Page 5, first sentence of the CPMG-1 paragraph] The phrase 'an CPMG-1 experiment' should be 'a CPMG-1 experiment'.
- [Eq. (1)] The displayed formula appears to show S_V = S0 (Delta_fL/Delta_V)^2, but the correct relation by unit analysis and by the numerical result 140 uV^2/Hz is S_V = S0 / (Delta_fL/Delta_V)^2; please correct the typo.
- [Supplementary Fig. S10(d) caption] The caption states 'S0=0.17(3) Hz2/Hz', which is missing the factor 10^9 that appears in the main text (S0=0.17(3)x10^9 Hz^2/Hz); please fix the units or the prefactor.
- [Abstract and 'Hyperfine interaction with 29Si nuclei'] The phrase 'identify coherence modulations associated with the interaction with the 29Si nuclear spin bath' is stronger than the evidence supports, given the single dip and the harmonic-assignment caveat; suggest 'attribute coherence modulations to' or similar.
- [Fig. 1e] Please state the number of spectra per gate and clarify whether the uncertainty on the average charge noise is the standard deviation of the distribution or the standard error of the mean.
- [Methods, 'Qubit noise model'] The fitting procedure follows Ref. [29] via reference only; since the filter-function treatment is central to the extraction, please include at least a brief description of the filter functions and the fitting procedure in the main text or Methods.
- [Eq. (14) and surrounding Methods text] The choice of frequency cutoffs f_L = 1 mHz and f_H = 1 MHz is not justified; please provide the reasoning or cite a reference for these values.
Circularity Check
The charge-noise-limited T2* values are closed-form restatements of the S0 fitted to the same CPMG data, so the 'predictions' are forced by the fit; the material charge-noise benchmark itself is independent.
-
fitted input called prediction
[Results section 'Charge and hyperfine noise in hole spin qubits' and Methods 'Charge noise-limited T2*' (Eqs. 12-14)]
"Performing a similar analysis on the low-frequency component, we predict a charge noise-limited dephasing time of T∗2 = 3.7(3) µs at 117.5 mT, and 44(4) µs at 10 mT (Methods). ... We evaluate the charge noise-limited T∗2 using the extracted voltage noise amplitude of √SV = 12(1) µV/√Hz at 1 Hz and the effective g-factor susceptibility of ∆g/∆V = 6.7·10−4 mV−1."
The predicted T∗2 is computed by substituting S0, extracted from fits to the CPMG-N coherence traces with the Eq. 9 model, into the closed-form quasi-static formulas T∗2 = 1/(√(2π)∆f) and ∆f = (∆g/∆V)∆VRMS, with ∆VRMS derived from SV = S0/(∆fL/∆V)2. No free-induction decay or low-field coherence data enter at this stage; the result is a deterministic rearrangement of the fitted S0 together with the assumed 1/f charge-noise attribution and the same-group g-factor susceptibility from Ref. [54]. The 'prediction' therefore reduces by construction to the fitted amplitude, although the underlying charge-noise benchmark is measured independently.
full rationale
The material-level charge noise benchmark (√S0 = 0.3(1) µeV/√Hz from flank and CPT measurements) is an independent electrical characterization and is not circular. The spin-echo noise analysis is largely honest data analysis: S0, S0,hf, and σGe−73 are fit to CPMG-N data using an empirical model (Eq. 9) inherited from Ref. [29], and the integrated σf values are summaries of those fitted parameters rather than independent predictions. The circular step is the subsequent 'prediction' of charge-noise-limited T2*: Eqs. 12-14 are closed-form rearrangements of the already-fitted S0, converted through a same-group g-factor susceptibility [54] and the assumed 1/f charge-noise attribution. The quoted 3.7(3) µs and 44(4) µs values are therefore forced by the fit and add no new information, even though they are framed as predictions. The hyperfine-derived T2* = 1.25(5) µs is compared with measured 1-2 µs values from same-group Ref. [54]; this is a broad consistency check, not circular, because those measured values were not used in the fit. The authors' explicit acknowledgment that slow nuclear diffusion could also contribute to S0 is a correctness risk rather than circularity. Because the core material benchmark is independent but one set of 'predictions' reduces by construction to fitted inputs, the circularity score is 6.
Assumptions & free parameters
free parameters (7)
- S0 (charge noise amplitude at 1 Hz) =
0.17(3) x 10^9 Hz^2/Hz (average from qubits Q1, Q4, Q7)
- S0,hf (73Ge hyperfine peak amplitude) =
1.1(3) x 10^6 Hz^2/Hz (average)
- σ_Ge-73 (73Ge frequency spread) =
12(1) kHz
- S0,Si-29 (29Si hyperfine peak amplitude) =
9.0(8) x 10^3 Hz^2/Hz
- σ_Si-29 (29Si frequency spread) =
99(20) kHz
- α (spectral exponent) =
0.9(2) flank average, 1.64(5) CPT, 1.0(3) Q4/Q7
- harmonic index n for 29Si dip conversion =
2
assumptions (5)
- domain assumption The qubit frequency noise PSD is S_fL = S0/f + S0,hf exp(-(f-f_Ge-73)^2/(2σ^2)), Eq. (9), from Ref [29].
- domain assumption The low-frequency 1/f component is attributed to charge noise rather than nuclear spin diffusion.
- domain assumption The 29Si coherence modulation is modeled by adding a Gaussian peak with fixed precession frequency f_Si-29 = 8.465 MHz/T × B.
- domain assumption g-factor susceptibility Δg/ΔV = 6.7x10^-4 mV^-1 from simulation (Ref [54]).
- domain assumption In-plane and out-of-plane g-tensor components (gx=-gy=0.04, gz=11) for angle estimation.
Cite this review
Pith. "Pith review of Exploiting epitaxial strained germanium for scaling low noise spin qubits at the micron-scale." pith.science (2026). https://pith.science/paper/SLXDME6P
@misc{pith2026241111526,
author = {Pith},
title = {Pith review of: Exploiting epitaxial strained germanium for scaling low noise spin qubits at the micron-scale},
year = {2026},
howpublished = {\url{https://pith.science/paper/SLXDME6P}},
note = {Machine review of arXiv:2411.11526}
}
abstract
Disorder in the heterogeneous material stack of semiconductor spin qubit systems introduces noise that compromises quantum information processing, posing a challenge to coherently control large-scale quantum devices. Here, we exploit low-disorder epitaxial strained quantum wells in Ge/SiGe heterostructures grown on Ge wafers to comprehensively probe the noise properties of complex micron-scale devices comprising of up to ten quantum dots and four rf-charge sensors arranged in a two-dimensional array. We demonstrate an average charge noise of $\sqrt{S_{0}}=0.3(1)$ $\mu\mathrm{eV}/\sqrt{\mathrm{Hz}}$ at 1 Hz across different locations on the wafer, providing a benchmark for quantum confined holes. We then establish hole-spin qubit control in these heterostructures and extend our investigation from electrical to magnetic noise through spin echo measurements. Exploiting dynamical decoupling sequences, we quantify the power spectral density components arising from the hyperfine interaction with $^{73}$Ge spinful isotopes and identify coherence modulations associated with the interaction with the $^{29}$Si nuclear spin bath near the Ge quantum well. We estimate an integrated hyperfine noise amplitude $\sigma_f$ of 180(8) kHz from $^{73}$Ge and of 47(5) kHz from $^{29}$Si, underscoring the need for full isotopic purification of the qubit host environment.
Figures
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Forward citations
Cited by 2 Pith papers
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Modular Autonomous Virtualization System for Two-Dimensional Semiconductor Quantum Dot Arrays
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Reference graph
Works this paper leans on
-
[29]
N. Hendrickx, L. Massai, M. Mergenthaler, F. Schupp, S. Paredes, S. Bedell, G. Salis, and A. Fuhrer, Nature Materials 23, 920 (2024)
work page 2024
-
[54]
V. John, C. X. Yu, B. v. Straaten, E. A. Rodríguez- Mena, M. Rodríguez, S. Oosterhout, L. E. A. Stehouwer, G. Scappucci, S. Bosco, M. Rimbach- Russ, Y.-M. Niquet, F. Borsoi, and M. Veldhorst, Preprint at http://arxiv.org/abs/2412.16044 (2024), arXiv:2412.16044
arXiv 2024
-
[1]
Burkard, T
G. Burkard, T. D. Ladd, A. Pan, J. M. Nichol, and J. R. Petta, Reviews of Modern Physics95, 025003 (2023)
2023
-
[2]
X. Xue, M. Russ, N. Samkharadze, B. Undseth, A. Sam- mak, G. Scappucci, and L. M. K. Vandersypen, Nature 601, 343 (2022)
2022
-
[3]
M. T. Mądzik, S. Asaad, A. Youssry, B. Joecker, K. M. Rudinger, E. Nielsen, K. C. Young, T. J. Proctor, A. D. Baczewski, A. Laucht, V. Schmitt, F. E. Hudson, K. M. Itoh, A. M. Jakob, B. C. Johnson, D. N. Jamieson, A. S. Dzurak, C. Ferrie, R. Blume-Kohout, and A. Morello, Nature 601, 348 (2022)
work page 2022
-
[4]
Scappucci, and S
A.Noiri, K.Takeda, T.Nakajima, T.Kobayashi, A.Sam- mak, G. Scappucci, and S. Tarucha, Nature 601, 338 (2022)
2022
-
[5]
A. R. Mills, C. R. Guinn, M. J. Gullans, A. J. Sigillito, M. M. Feldman, E. Nielsen, and J. R. Petta, Science Advances8, eabn5130 (2022)
2022
-
[6]
C.-A. Wang, V. John, H. Tidjani, C. X. Yu, A. S. Ivlev, C. Déprez, F. Van Riggelen-Doelman, B. D. Woods, N. W. Hendrickx, W. I. L. Lawrie, L. E. A. Stehouwer, S. D. Oosterhout, A. Sammak, M. Friesen, G. Scap- pucci, S. L. De Snoo, M. Rimbach-Russ, F. Borsoi, and M. Veldhorst, Science385, 447 (2024)
work page 2024
Show all 67 references
-
[7]
A. G. Fowler, M. Mariantoni, J. M. Martinis, and A. N. Cleland, Physical Review A86, 032324 (2012)
2012
-
[8]
Hoefler, T
T. Hoefler, T. Häner, and M. Troyer, Communications of the ACM66, 82 (2023)
2023
-
[9]
N. P. De Leon, K. M. Itoh, D. Kim, K. K. Mehta, T. E. Northup, H. Paik, B. S. Palmer, N. Samarth, S. Sangtawesin, and D. W. Steuerman, Science 372, eabb2823 (2021)
2021
-
[10]
Paladino, Y
E. Paladino, Y. Galperin, G. Falci, and B. Altshuler, Reviews of Modern Physics86, 361 (2014)
2014
-
[11]
Arute, K
F. Arute, K. Arya, R. Babbush, D. Bacon, J. C. Bardin, R. Barends, R. Biswas, S. Boixo, F. G. S. L. Brandao, D. A. Buell, B. Burkett, Y. Chen, Z. Chen, B. Chiaro, R. Collins, W. Courtney, A. Dunsworth, E. Farhi, B. Foxen, A. Fowler, C. Gidney, M. Giustina, R. Graff, K. Guerin,...
2019
-
[12]
Harper and S
R. Harper and S. T. Flammia, PRX Quantum4, 040311 (2023)
2023
-
[14]
E. J. Connors, J. Nelson, H. Qiao, L. F. Edge, and J. M. Nichol, Physical Review B100, 165305 (2019)
2019
-
[15]
Kranz, S
L. Kranz, S. K. Gorman, B. Thorgrimsson, Y. He, D. Keith, J. G. Keizer, and M. Y. Simmons, Advanced Materials 32, 2003361 (2020)
2020
-
[16]
Lodari, N
M. Lodari, N. W. Hendrickx, W. I. L. Lawrie, T.-K. Hsiao, L. M. K. Vandersypen, A. Sammak, M. Veldhorst, and G. Scappucci, Materials for Quantum Technology1, 011002 (2021)
2021
-
[17]
Zwerver, T
A. Zwerver, T. Krähenmann, T. Watson, L. Lampert, H. C. George, R. Pillarisetty, S. Bojarski, P. Amin, S. Amitonov, J. Boter,et al., Nature Electronics5, 184 (2022)
2022
-
[18]
Paquelet Wuetz, D
B. Paquelet Wuetz, D. Degli Esposti, A.-M. J. Zwerver, S. V. Amitonov, M. Botifoll, J. Arbiol, A. Sammak, L. M. K. Vandersypen, M. Russ, and G. Scappucci, Na- ture Communications14, 1385 (2023)
2023
-
[19]
Elsayed, M
A. Elsayed, M. Shehata, C. Godfrin, S. Kubicek, S. Mas- sar, Y. Canvel, J. Jussot, G. Simion, M. Mongillo, D. Wan, B. Govoreanu, I. P. Radu, R. Li, P. Van Dorpe, and K. De Greve, npj Quantum Information 10, 70 (2024)
2024
-
[20]
Massai, B
L. Massai, B. Hetényi, M. Mergenthaler, F. J. Schupp, L. Sommer, S. Paredes, S. W. Bedell, P. Harvey-Collard, G. Salis, A. Fuhrer, and N. W. Hendrickx, Communica- tions Materials5, 151 (2024)
2024
-
[21]
Yoneda, J
J. Yoneda, J. S. Rojas-Arias, P. Stano, K. Takeda, A. Noiri, T. Nakajima, D. Loss, and S. Tarucha, Na- ture Physics19, 1793 (2023)
2023
-
[22]
Rojas-Arias, A
J. Rojas-Arias, A. Noiri, P. Stano, T. Nakajima, J. Yoneda, K. Takeda, T. Kobayashi, A. Sammak, G. Scappucci, D. Loss, and S. Tarucha, Physical Review Applied 20, 054024 (2023)
2023
-
[23]
M. B. Donnelly, J. Rowlands, L. Kranz, Y. L. Hsueh, Y. Chung, A. V. Timofeev, H. Geng, P. Singh-Gregory, S. K. Gorman, J. G. Keizer, R. Rahman, and M. Y. Simmons, Preprint at http://arXiv.org/abs2405.03763 10 (2024)
2024 arXiv
-
[24]
L. E. A. Stehouwer, A. Tosato, D. Degli Esposti, D. Costa, M. Veldhorst, A. Sammak, and G. Scappucci, Applied Physics Letters123, 092101 (2023)
2023
-
[25]
Scappucci, C
G. Scappucci, C. Kloeffel, F. A. Zwanenburg, D. Loss, M. Myronov, J.-J. Zhang, S. De Franceschi, G. Kat- saros, and M. Veldhorst, Nature Reviews Materials 6, 926 (2021)
2021
-
[26]
Hendrickx, D
N. Hendrickx, D. Franke, A. Sammak, G. Scappucci, and M. Veldhorst, Nature577, 487 (2020)
2020
-
[27]
N. W. Hendrickx, W. I. L. Lawrie, M. Russ, F. van Rigge- len, S. L. de Snoo, R. N. Schouten, A. Sammak, G. Scap- pucci, and M. Veldhorst, Nature591, 580 (2021)
2021
-
[28]
Jirovec, A
D. Jirovec, A. Hofmann, A. Ballabio, P. M. Mutter, G. Tavani, M. Botifoll, A. Crippa, J. Kukucka, O. Sagi, F. Martins, J. Saez-Mollejo, I. Prieto, M. Borovkov, J. Arbiol, D. Chrastina, G. Isella, and G. Katsaros, Na- ture Materials20, 1106 (2021)
2021
-
[30]
N. W. Hendrickx, D. Franke, A. Sammak, M. Kouwen- hoven, D. Sabbagh, L. Yeoh, R. Li, M. Tagliaferri, M. Virgilio, G. Capellini,et al., Nature Communications 9, 2835 (2018)
2018
-
[31]
E. J. Connors, J. Nelson, L. F. Edge, and J. M. Nichol, Nature Communications13, 940 (2022)
2022
-
[32]
Spence, B
C. Spence, B. Cardoso Paz, V. Michal, E. Chanrion, D. J. Niegemann, B. Jadot, P.-A. Mortemousque, B. Klemt, V. Thiney, B. Bertrand,et al., Physical Review Applied 19, 044010 (2023)
2023
-
[33]
J. P. Dismukes, L. Ekstrom, and R. J. Paff, The Journal of Physical Chemistry68, 3021 (1964)
1964
-
[34]
A. E. Seedhouse, T. Tanttu, R. C. Leon, R. Zhao, K. Y. Tan, B. Hensen, F. E. Hudson, K. M. Itoh, J. Yoneda, C. H. Yang, A. Morello, A. Laucht, S. N. Coppersmith, A. Saraiva, and A. S. Dzurak, PRX Quantum2, 010303 (2021)
2021
-
[35]
S. G. J. Philips, M. T. Mądzik, S. V. Amitonov, S. L. de Snoo, M. Russ, N. Kalhor, C. Volk, W. I. L. Lawrie, D. Brousse, L. Tryputen, B. P. Wuetz, A. Sammak, M. Veldhorst, G. Scappucci, and L. M. K. Vandersypen, Nature 609, 919 (2022)
2022
-
[36]
Takeda, A
K. Takeda, A. Noiri, T. Nakajima, L. C. Camen- zind, T. Kobayashi, A. Sammak, G. Scappucci, and S. Tarucha, npj Quantum Information10, 22 (2024)
2024
-
[37]
Meiboom and D
S. Meiboom and D. Gill, Review of Scientific Instruments 29, 688 (1958)
1958
-
[38]
G. S. Uhrig, Phys. Rev. Lett.98, 100504 (2007)
2007
-
[39]
Cywiński, R
L. Cywiński, R. M. Lutchyn, C. P. Nave, and S. Das Sarma, Phys. Rev. B77, 174509 (2008)
2008
-
[40]
G. A. Álvarez and D. Suter, Phys. Rev. Lett.107, 230501 (2011)
2011
-
[41]
J. T. Muhonen, J. P. Dehollain, A. Laucht, F. E. Hud- son, R. Kalra, T. Sekiguchi, K. M. Itoh, D. N. Jamieson, J. C. McCallum, A. S. Dzurak, and A. Morello, Nature Nanotechnology 9, 986 (2014)
2014
-
[42]
Yoneda, K
J. Yoneda, K. Takeda, T. Otsuka, T. Nakajima, M. R. Delbecq, G. Allison, T. Honda, T. Kodera, S. Oda, Y. Hoshi, N. Usami, K. M. Itoh, and S. Tarucha, Nature Nanotechnology 13, 102 (2018)
2018
-
[43]
Jirovec, P
D. Jirovec, P. M. Mutter, A. Hofmann, A. Crippa, M. Rychetsky, D. L. Craig, J. Kukucka, F. Martins, A. Ballabio, N. Ares,et al., Physical Review Letters128, 126803 (2022)
2022
-
[44]
Van Bree, A
J. Van Bree, A. Y. Silov, M. Van Maasakkers, C. Pryor, M. Flatté, and P. Koenraad, Physical Review B 93, 035311 (2016)
2016
-
[45]
Fischer, W
J. Fischer, W. A. Coish, D. V. Bulaev, and D. Loss, Phys. Rev. B78, 155329 (2008)
2008
-
[46]
thesis, McGill University (2020)
P.Philippopoulos, Hyperfine and Spin–Orbit Interactions in Semiconductor Nanostructures., Ph.D. thesis, McGill University (2020)
2020
-
[47]
X. J. Wang, S. Chesi, and W. A. Coish, Phys. Rev. Lett. 109, 237601 (2012)
2012
-
[48]
Philippopoulos, S
P. Philippopoulos, S. Chesi, J. Salfi, S. Rogge, and W. A. Coish, Phys. Rev. B100, 125402 (2019)
2019
-
[49]
W. I. L. Lawrie,Spin Qubits in Silicon and Germanium, Ph.D. thesis, Delft University of Technology (2022)
2022
-
[50]
Bluhm, S
H. Bluhm, S. Foletti, I. Neder, M. Rudner, D. Mahalu, V. Umansky, and A. Yacoby, Nature Physics 7, 109 (2011)
2011
-
[51]
F. K. Malinowski, F. Martins, P. D. Nissen, E. Barnes, Ł. Cywiński, M. S. Rudner, S. Fallahi, G. C. Gardner, M. J. Manfra, C. M. Marcus, and F. Kuemmeth, Nature Nanotechnology 12, 16 (2017)
2017
-
[52]
E. A. Chekhovich, M. N. Makhonin, A. I. Tartakovskii, A. Yacoby, H. Bluhm, K. C. Nowack, and L. M. K. Vandersypen, Nature Materials12, 494 (2013)
2013
-
[53]
J. S. Rojas-Arias, Y. Kojima, K. Takeda, P. Stano, T. Nakajima, J. Yoneda, A. Noiri, T. Kobayashi, D. Loss, and S. Tarucha, Preprint at https://arxiv.org/abs/2408.13707 (2024)
2024
-
[55]
L. A. Terrazos, E. Marcellina, Z. Wang, S. N. Copper- smith, M. Friesen, A. R. Hamilton, X. Hu, B. Koiller, A. L. Saraiva, D. Culcer, and R. B. Capaz, Physical Review B103, 125201 (2021)
2021
-
[56]
C.-A. Wang, H. E. Ercan, M. F. Gyure, G. Scappucci, M. Veldhorst, and M. Rimbach-Russ, npj Quantum In- formation 10, 102 (2024)
2024
-
[57]
Simoen, J
E. Simoen, J. Mitard, B. De Jaeger, G. Eneman, A. Dob- bie, M. Myronov, D. R. Leadley, M. Meuris, T. Hoff- mann, and C. Claeys, IEEE Electron Device Letters32, 87 (2011)
2011
-
[58]
Simoen, C
E. Simoen, C. Claeys, A. Oliveira, P. Agopian, J. Mar- tino, B.Hsu, G.Eneman, E.Rosseel, R.Loo, H.Arimura, N. Horiguchi, W.-C. Wen, and H. Nakashima, in2019 34th Symposium on Microelectronics Technology and De- vices (SBMicro)(IEEE, Sao Paulo, Brazil, 2019) pp. 1–6
2019
-
[59]
W.-C. Hua, M. Lee, P. Chen, M.-J. Tsai, and C. Liu, IEEE Electron Device Letters26, 667 (2005)
2005
-
[60]
Corley-Wiciak, C
C. Corley-Wiciak, C. Richter, M. H. Zoellner, I. Zait- sev, C. L. Manganelli, E. Zatterin, T. U. Schülli, A. A. Corley-Wiciak, J. Katzer, F. Reichmann, W. M. Klesse, N. W. Hendrickx, A. Sammak, M. Veldhorst, G. Scap- pucci, M. Virgilio, and G. Capellini, ACS Applied Ma- terial...
2023
-
[61]
Costa, L
D. Costa, L. E. A. Stehouwer, Y. Huang, S. Martí- Sánchez, D. Degli Esposti, J. Arbiol, and G. Scappucci, Applied Physics Letters125, 222104 (2024)
2024
-
[62]
Moutanabbir, S
O. Moutanabbir, S. Assali, A. Attiaoui, G. Daligou, P. Daoust, P. D. Vecchio, S. Koelling, L. Luo, and N. Ro- 11 taru, Advanced Materials36, 2305703 (2024)
2024
-
[63]
Sabbagh, N
D. Sabbagh, N. Thomas, J. Torres, R. Pillarisetty, P. Amin, H. George, K. Singh, A. Budrevich, M. Robin- son, D. Merrill, L. Ross, J. Roberts, L. Lampert, L. Massa, S. Amitonov, J. Boter, G. Droulers, H. Eenink, M. Van Hezel, D. Donelson, M. Veldhorst, L. Vander- sypen, J. Cla...
2019
-
[64]
Struck, A
T. Struck, A. Hollmann, F. Schauer, O. Fedorets, A. Schmidbauer, K. Sawano, H. Riemann, N. V. Abrosi- mov, L. Cywiński, D. Bougeard, and L. R. Schreiber, npj Quantum Information6, 40 (2020). METHODS Heterostructure growth The Ge/SiGe heterostructure material is grown using red...
2020 arXiv
-
[65]
We extract the charge noise√S0 at 1 Hz, which is presented in Fig.1e (device 1, S1) of the main text
Each noise spectrum is fitted toS0/fα (red line) using a fit range between 0.1 and 10 Hz. We extract the charge noise√S0 at 1 Hz, which is presented in Fig.1e (device 1, S1) of the main text. Across the acquired noise spectra, we find an average charge noise ofS0 = 0.4(1) Hz2/...
-
[66]
We extract the charge noise√S0 at 1 Hz, which is presented in Fig.1e (device 1, S2) of the main text
Each noise spectrum is fitted toS0/fα (red line) using a fit range between 0.1 and 10 Hz. We extract the charge noise√S0 at 1 Hz, which is presented in Fig.1e (device 1, S2) of the main text. Across the acquired noise spectra, we find an average charge noise ofS0 = 0.3(1) Hz2/...
-
[67]
We extract the charge noise√S0 at 1 Hz, which is presented in Fig.1e (device 2, S1) of the main text
Each noise spectrum is fitted toS0/fα (red line) using a fit range between 0.1 and 10 Hz. We extract the charge noise√S0 at 1 Hz, which is presented in Fig.1e (device 2, S1) of the main text. Across the acquired noise spectra, we find an average charge noise ofS0 = 0.3(1) Hz2/...
-
[68]
We extract the charge noise√S0 at 1 Hz, which is presented in Fig.1e (device 2, S2) of the main text
Each noise spectrum is fitted toS0/fα (red line) using a fit range between 0.1 and 10 Hz. We extract the charge noise√S0 at 1 Hz, which is presented in Fig.1e (device 2, S2) of the main text. Across the acquired noise spectra, we find an average charge noise ofS0 = 0.4(1) Hz2/...
Reviewed August 12, 2026 · model on record in the stance chip above.
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