Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-11T17:03:02.299564Z
Paper Citation Record · LEDGER
Defect density of states of tin oxide and copper oxide p-type thin-film transistors
As of 19 August 2026, this Paper Citation Record lists 64 of 64 outbound references and 0 inbound Pith citation observations for arXiv:2412.09533.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-19T06:32:44.657259+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
64 of 64 outbound references displayed
- verified exact0
- verified fuzzy27
- unresolved37
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 4578bf3e-c9e0-427d-b5c9-69bdf188a248 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 1
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.783453Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 4282a5ff-1b78-4aec-b5fa-3866f67e9d29 · outbound
This paper cites oxygen vacancy (V O, donor), 4.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors oxygen vacancy (V O, donor), 4
Reference 2
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.774528Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation e1e32282-1756-4519-8fa6-5f94d72a739c · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 3
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.735904Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation c9b5a131-2bd0-4ccb-9d9b-d6c5ccb82444 · outbound
This paper cites Thermally evaporated gold ( t = 100 nm) was used as the source and drain contacts.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Thermally evaporated gold ( t = 100 nm) was used as the source and drain contacts
Reference 4
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.755072Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation e15d9245-adb9-485a-a301-42096b4b91ee · outbound
This paper cites While the tin and oxygen vacancy peaks are expected, peaks 1 and 5 require more discussion.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors While the tin and oxygen vacancy peaks are expected, peaks 1 and 5 require more discussion
Reference 5
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.764492Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 2b3a1d15-1cb3-4540-9751-605c6d909923 · outbound
This paper cites The diffraction-limited laser illuminates a tin or copper oxide active channel from the top side through the thin passivation layer of alu- minum oxide.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors The diffraction-limited laser illuminates a tin or copper oxide active channel from the top side through the thin passivation layer of alu- minum oxide
Reference 6
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.746192Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 9193be1a-6815-4377-9b4b-925f206fa213 · outbound
This paper cites Nathan, S.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Nathan, S
Reference 7
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.727123Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 72e4aae3-2b2d-4481-8eb1-3800b9d257c8 · outbound
This paper cites Wakimura, Y.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Wakimura, Y
Reference 8
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.718744Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation c1c85c5a-4908-42e8-b9be-08d553fef511 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 9
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.711036Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 506bc03b-bcfe-4527-8710-425f4d242a5e · outbound
This paper cites Hosono, Nature Electronics 2018, 1, 7 428.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Hosono, Nature Electronics 2018, 1, 7 428
Reference 10
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.703229Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation c4031cf9-d361-4aca-b675-5ae8b06b041a · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 11
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.695400Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 27f19220-00d0-47ea-9423-01da975d33d9 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 12
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.687565Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 5dcae030-6853-49e7-a507-0e4fec1afcbe · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 13
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.678150Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 5a4dce15-4e15-415d-aa4f-de0e9c3dd495 · outbound
This paper cites Ouyang, W.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Ouyang, W
Reference 14
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.670410Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 2233b82d-09c4-498c-835d-0d85edaf6bfb · outbound
This paper cites Devabharathi, S.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Devabharathi, S
Reference 15
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.662338Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 5825957a-4fb2-4a24-a5db-575a6718bbb4 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 16
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.655244Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation f76b6837-eafe-4acc-90e2-4422566f66c5 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 17
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.647813Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 00305a8e-abe9-4a74-9524-ddcc173db7d6 · outbound
This paper cites Fortunato, R.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Fortunato, R
Reference 18
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.640647Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 57d281bb-947f-40e0-b64f-fb9310584f69 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 19
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.633325Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation ab14179c-3f71-49aa-9105-5479563e1b17 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 20
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.626647Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 87d4a002-eb0e-41f4-9095-ed9b48e11b6c · outbound
This paper cites Nomura, H.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Nomura, H
Reference 21
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.620145Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation ac68847a-7e3d-4372-b30e-1fced7711771 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 22
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.613401Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 6f77d77b-7619-4e77-8234-f323c3b15727 · outbound
This paper cites Belmonte, H.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Belmonte, H
Reference 23
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.606839Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 2567087b-a5e0-4a06-ad9c-ba9074120d32 · outbound
This paper cites Iordanidou, C.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Iordanidou, C
Reference 24
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.599522Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 7d86a2fb-6777-41a3-8c73-c568274cb179 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 25
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.592277Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation a96cec9d-1a30-4919-bc8b-51fb1d6a1304 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 26
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.584967Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 6221638f-2779-4a54-b47f-75bdc0ec7ca1 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 27
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.577722Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 4f176fb2-6600-4667-a0d0-038a1b77a04e · outbound
This paper cites Fortunato, V.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Fortunato, V
Reference 28
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.570950Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 9239d49a-aa7c-4b2f-ac88-d5a5110b5f4a · outbound
This paper cites Sekkat, V.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Sekkat, V
Reference 29
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.564389Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 83c82f08-38ec-4d65-b330-894bb02feeeb · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 30
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.557978Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 2b7a7919-52a5-4026-818d-83a028c2fd54 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 31
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.551568Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation b70a859b-1dcf-4208-b8a4-b22bba2054b3 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 32
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.545401Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 0677c26d-9813-4d81-a75f-cdfc819af7fc · outbound
This paper cites Zivkovi´ c, N.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Zivkovi´ c, N
Reference 33
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.539005Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 650e2878-2faf-4f4f-a23e-8eb4130695a8 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 34
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.532493Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 11e767dd-eb89-489b-b077-ee72f6c61056 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 35
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.525983Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 8e29a9e0-baed-4b10-bedd-4e8cf9b08346 · outbound
This paper cites Jeong, D.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Jeong, D
Reference 36
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.519316Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 9aaba59e-5c5c-46fe-be17-c98cc69cae34 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 37
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.512636Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 1019a574-fdd7-4d7f-b631-ad706b37bf17 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 38
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.506230Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 9ceb3479-ada8-4b1b-9547-cd0aae49facf · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 39
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.499544Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 089a6e76-e1c0-4861-9812-4f126a819497 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 40
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.493114Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 6f1df4a3-a2a1-4224-92b9-c25b59ecd192 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 41
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.486338Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 682a5232-2e12-4dc1-b984-1421b3641ee3 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 42
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.479738Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 0d5a0108-3563-4a37-be2a-e65a518f5c06 · outbound
This paper cites Ozaslan, O.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Ozaslan, O
Reference 43
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.473192Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 6072fcfc-c569-4a31-9ae0-4a7719ce9848 · outbound
This paper cites Varley, A.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Varley, A
Reference 44
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.466832Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 5608db6e-6290-4241-8c4d-d9562796de55 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 45
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.460732Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 36981df4-1b64-41c9-9ecc-f1936adc6cd5 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 46
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.454500Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation a23f3942-968b-4923-bc37-6cbb33eab4b3 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 47
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.447573Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 3b65d8f5-70af-4f65-ae88-8d09387d7b19 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 48
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.440168Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 79324fe5-5b1c-4450-b3be-a5fdf3211832 · outbound
This paper cites Singh, J.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Singh, J
Reference 49
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.432845Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 6953b520-86b1-42bf-aa94-54ae461727c7 · outbound
This paper cites Im, Y.-G.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Im, Y.-G
Reference 50
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.425569Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 76c86d1f-b923-4dc2-ac6a-0903d1a21550 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 51
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.418487Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 6c49f128-32f7-44e9-b380-dc404cae0448 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 52
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.411501Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 1c105735-ad2e-40f6-bcd0-97d94e732752 · outbound
This paper cites Januar, C.-Y.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Januar, C.-Y
Reference 53
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.404780Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation bb84af4e-29f0-4f15-9204-9861be71750e · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 54
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.397649Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 78a95857-7783-4437-b415-7c233ef32e5a · outbound
This paper cites Leijtens, R.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Leijtens, R
Reference 55
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.390470Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 5cf58757-55db-4460-840f-ed5fdc3a13a4 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 56
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.382238Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 900df7d4-383e-49e5-9347-58bd78dc9add · outbound
This paper cites Napari, T.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Napari, T
Reference 57
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.374805Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 55cf67aa-335c-47de-bd8f-6eef9e4c5a3d · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 58
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.367852Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 032926a3-3ee4-444d-ba32-04b78a5a351c · outbound
This paper cites Alajlani, F.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Alajlani, F
Reference 59
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.360294Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 1f77490b-bd26-4594-ad88-073f4651ed01 · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 60
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.351925Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation 780372f9-2967-40f6-9e15-bc011b6e0b8e · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 61
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.344027Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation be5b71be-f9e5-4483-aeb9-6599f498020b · outbound
This paper cites an unresolved cited work.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Unresolved cited work
Reference 62
- Resolution
- unresolved
- raw_fallback, observed 2026-08-11T17:03:02.336139Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation b88b9383-4e62-437f-8767-477952f02e1e · outbound
This paper cites Koffyberg, F.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Koffyberg, F
Reference 63
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.328107Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Observation b78c1515-4206-4023-bdaf-6cb5c1ea4458 · outbound
This paper cites Hodby, T.
Defect density of states of tin oxide and copper oxide p-type thin-film transistors Hodby, T
Reference 64
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-11T17:03:02.320706Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-19T06:32:44.657259+00:00.
Pith citing papers
No inbound Pith citation observations are available.