Paper Citation Record · LEDGER

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories

As of 14 August 2026, this Paper Citation Record lists 28 of 28 outbound references and 0 inbound Pith citation observations for arXiv:2501.07949.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2501.07949 v1

Coverage vector

measured 28 of 28 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-10T20:35:58.590827Z

measured 28 of 28 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-13T06:32:02.005865+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

28 of 28 outbound references displayed

verified exact11
verified fuzzy5
unresolved11
parse uncertain0
malformed identifier0
metadata mismatch1

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 12ddfb7c-b62c-4628-bac1-cdc3e7afd043 · outbound

This paper cites an unresolved cited work.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Unresolved cited work

Reference 1

Resolution: unresolved; no resolver link, observed 2026-08-10T20:35:58.464332Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 7c96c030-bfb3-473f-98f3-795128bf2659 · outbound

This paper cites an unresolved cited work.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Unresolved cited work

Reference 2

Resolution: verified exact; doi, observed 2026-08-10T20:35:58.820780Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation a05beb43-bf73-49cc-8d58-5450a07866f0 · outbound

This paper cites D.; Prentice, R.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories D.; Prentice, R

Reference 3

Resolution: unresolved; no resolver link, observed 2026-08-10T20:35:58.474459Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 665d8c50-277f-4d70-8826-845ea34ebf11 · outbound

This paper cites Analysis of Multivariate Survival Data; New York, NY: Springer New York (Statistics for Biology and Health), 2000.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Analysis of Multivariate Survival Data; New York, NY: Springer New York (Statistics for Biology and Health), 2000

Reference 4

Resolution: unresolved; no resolver link, observed 2026-08-10T20:35:58.479356Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation df17d6c7-941e-4b63-a7b2-8c69e7aeec8d · outbound

This paper cites an unresolved cited work.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Unresolved cited work

Reference 5

Resolution: unresolved; raw_fallback, observed 2026-08-10T20:35:59.344667Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation 504ce98e-65e3-4c21-979a-3f68c079a77f · outbound

This paper cites an unresolved cited work.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Unresolved cited work

Reference 6

Resolution: verified exact; doi, observed 2026-08-10T20:35:58.787495Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation af407387-4830-4bc4-b8bc-c9457048a055 · outbound

This paper cites K.; Lemonte, A.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories K.; Lemonte, A

Reference 7

Resolution: verified exact; doi, observed 2026-08-10T20:35:58.772703Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation 17c84c92-a5e4-485a-822e-ce4a638da38d · outbound

This paper cites Matrix geometric solutions in stochastic models.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Matrix geometric solutions in stochastic models

Reference 8

Resolution: verified fuzzy; raw_fallback, observed 2026-08-10T20:35:59.330187Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation 49247d49-acdd-4fce-8779-bdc51c4a82be · outbound

This paper cites Ruin probabilities; World Scientific, Chinese, 2000.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Ruin probabilities; World Scientific, Chinese, 2000

Reference 9

Resolution: verified fuzzy; raw_fallback, observed 2026-08-10T20:35:59.314493Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation e35113b1-fff3-4c7a-a759-a53c18583e75 · outbound

This paper cites Fitting phase-type distributions via EM-algorithm.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Fitting phase-type distributions via EM-algorithm

Reference 10

Resolution: unresolved; no resolver link, observed 2026-08-10T20:35:58.508607Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 389d03da-8a07-49e6-bd8e-6f10578486b6 · outbound

This paper cites Phase-type distributions for studying variability in resistive memories.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Phase-type distributions for studying variability in resistive memories

Reference 11

Resolution: verified exact; doi, observed 2026-08-10T20:35:58.757274Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation 6503959d-42aa-41fe-ad50-74a4993ad1fe · outbound

This paper cites E.; Alonso, F.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories E.; Alonso, F

Reference 12

Resolution: verified exact; doi, observed 2026-08-10T20:35:58.740551Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation c95839f8-bd4d-4a27-b39f-196b108c55d6 · outbound

This paper cites E.; Aguilera, A.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories E.; Aguilera, A

Reference 13

Resolution: unresolved; no resolver link, observed 2026-08-10T20:35:58.522466Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation a5862bde-4e44-4fac-82e1-6943659ca20d · outbound

This paper cites F.; Samorodnitsky, G.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories F.; Samorodnitsky, G

Reference 14

Resolution: unresolved; no resolver link, observed 2026-08-10T20:35:58.526946Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 8525e9a0-c9ba-445f-a14f-f3a9fe33f1e2 · outbound

This paper cites Inhomogeneous phase -type distributions and heavy tails.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Inhomogeneous phase -type distributions and heavy tails

Reference 15

Resolution: verified exact; doi, observed 2026-08-10T20:35:58.724959Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation 1ebed259-5495-4957-a683-a76c51689609 · outbound

This paper cites H.; Zenga, M.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories H.; Zenga, M

Reference 16

Resolution: verified exact; doi, observed 2026-08-10T20:35:58.709381Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation a60139c3-d58a-4444-ab6b-103976d35622 · outbound

This paper cites C.; Wiper, M.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories C.; Wiper, M

Reference 17

Resolution: verified exact; doi, observed 2026-08-10T20:35:58.694061Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation e1ebad70-c696-48a1-9404-fb328bbc530d · outbound

This paper cites an unresolved cited work.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Unresolved cited work

Reference 18

Resolution: unresolved; raw_fallback, observed 2026-08-10T20:35:59.297987Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation 6cec06c9-e6e1-49b3-8a9b-f03e045ac964 · outbound

This paper cites Cluster-based fitting of phase-type distributions to empirical data.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Cluster-based fitting of phase-type distributions to empirical data

Reference 19

Resolution: verified exact; doi, observed 2026-08-10T20:35:58.679329Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation 1b9693a8-1693-488e-a02c-01b4fbb69a08 · outbound

This paper cites G.; Wang, J.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories G.; Wang, J

Reference 20

Resolution: verified fuzzy; raw_fallback, observed 2026-08-10T20:35:59.283477Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation 6791f201-7ccd-434d-8ab7-817c95a68035 · outbound

This paper cites Resistive switching: from fundamentals of nanoionic redox processes to memristive device applications ; Wiley-VCH, 2015.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Resistive switching: from fundamentals of nanoionic redox processes to memristive device applications ; Wiley-VCH, 2015

Reference 21

Resolution: verified fuzzy; raw_fallback, observed 2026-08-10T20:35:59.269253Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation 2513a534-cc9b-4d89-ae77-30a038f814b4 · outbound

This paper cites Utilizing the variability of resistive random access memory to implement reconfigurable physical unclonable func- tions.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Utilizing the variability of resistive random access memory to implement reconfigurable physical unclonable func- tions

Reference 22

Resolution: metadata mismatch; raw_fallback, observed 2026-08-10T20:35:58.961595Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation a811fddd-fcf4-4bce-8afd-419cbee85196 · outbound

This paper cites Stochastic memory devices for security and computing.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Stochastic memory devices for security and computing

Reference 23

Resolution: unresolved; no resolver link, observed 2026-08-10T20:35:58.567683Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 29627ee7-f268-47fd-a678-e38c4f86cf64 · outbound

This paper cites B.; García, H.; Campabadal, F.; Dueñas, S.; Castán, H.; Jiménez-Molinos, F.; Roldán, J.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories B.; García, H.; Campabadal, F.; Dueñas, S.; Castán, H.; Jiménez-Molinos, F.; Roldán, J

Reference 24

Resolution: verified exact; doi, observed 2026-08-10T20:35:58.654752Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation d1e59fb9-1f03-45f5-9d22-e9f5ee02f4a3 · outbound

This paper cites E.; Acal, C.; Aguilera, A.M.; Roldán, J.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories E.; Acal, C.; Aguilera, A.M.; Roldán, J

Reference 25

Resolution: verified exact; doi, observed 2026-08-10T20:35:58.638486Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation 596104ff-2c80-42a1-b81d-bafd903077cc · outbound

This paper cites H.; Lu, P.; Nocedal, J.; Zhu, C.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories H.; Lu, P.; Nocedal, J.; Zhu, C

Reference 26

Resolution: unresolved; no resolver link, observed 2026-08-10T20:35:58.581257Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 8c15299f-495c-4c19-8942-85a0ca193d41 · outbound

This paper cites an unresolved cited work.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories Unresolved cited work

Reference 27

Resolution: unresolved; raw_fallback, observed 2026-08-10T20:35:59.253156Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Observation 5514c108-5a6c-43a9-b75b-e7ce540b6e7a · outbound

This paper cites J.; Jones, M.

One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories J.; Jones, M

Reference 28

Resolution: verified fuzzy; raw_fallback, observed 2026-08-10T20:35:59.238049Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.

Pith citing papers

No inbound Pith citation observations are available.