Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-05-19T02:49:20.485016Z
Paper Citation Record · LEDGER
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures
As of 21 August 2026, this Paper Citation Record lists 24 of 24 outbound references and 0 inbound Pith citation observations for arXiv:2507.23109.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-21T06:32:19.484+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
24 of 24 outbound references displayed
- verified exact1
- verified fuzzy12
- unresolved10
- parse uncertain0
- malformed identifier1
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 5f6d115f-0f55-4012-91a5-272d539c930f · outbound
This paper cites Kimoto, Material science and device physics in SiC technology for high-voltage power devices, Japanese Journal of Applied Physics 54, 040103 (2015).
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Kimoto, Material science and device physics in SiC technology for high-voltage power devices, Japanese Journal of Applied Physics 54, 040103 (2015)
Reference 1
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T02:52:01.196681Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation fcf818dd-2d6c-4876-95c2-29a4fc6d6748 · outbound
This paper cites French, G.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures French, G
Reference 2
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T02:52:01.254696Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 22dcf35e-a87d-491f-ab1c-dd551db78f2b · outbound
This paper cites Romijn, S.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Romijn, S
Reference 3
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T02:52:01.248736Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 59c07ec6-f71e-4827-86ba-502870de7b35 · outbound
This paper cites Romijn, S.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Romijn, S
Reference 4
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T02:52:01.251716Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation b9986ad2-5afe-4993-ae61-00e0ab1c334a · outbound
This paper cites an unresolved cited work.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Unresolved cited work
Reference 5
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T02:52:01.257539Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 4159cbdd-7576-4f1c-9d6f-7beb62c71669 · outbound
This paper cites an unresolved cited work.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Unresolved cited work
Reference 6
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T02:52:01.240557Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 97d7a8f7-8448-4a06-bbde-954e6a3a7eed · outbound
This paper cites an unresolved cited work.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Unresolved cited work
Reference 7
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T02:52:01.243405Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 3578988d-0ce1-4015-825a-62bf32e4908d · outbound
This paper cites Lohrmann, B.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Lohrmann, B
Reference 8
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T02:52:01.237728Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation dfb033d0-93c4-4646-91a3-dea57baa4fc9 · outbound
This paper cites Banerjee, C.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Banerjee, C
Reference 9
- Resolution
- verified exact
- arxiv_id, observed 2026-05-19T02:52:00.094293Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation e540a501-8ccb-4cbc-a385-9f315466aaee · outbound
This paper cites an unresolved cited work.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Unresolved cited work
Reference 10
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T02:52:01.225898Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation aa9675d0-4f16-4614-82cf-369bac2a7078 · outbound
This paper cites an unresolved cited work.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Unresolved cited work
Reference 11
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T02:52:01.228754Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation da5d3bbe-5318-4d9d-9df7-f9126471592a · outbound
This paper cites Burkard, T.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Burkard, T
Reference 12
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T02:52:01.231717Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation b323bb88-f873-424e-8692-0654a0485993 · outbound
This paper cites Eastoe, G.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Eastoe, G
Reference 13
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T02:52:01.234715Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation bae381e9-9d78-4e0d-afb3-8af569a5eaea · outbound
This paper cites Patra, R.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Patra, R
Reference 14
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T02:52:01.246167Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation e5d1d385-e058-4f68-95de-d89a134e40d1 · outbound
This paper cites Sze and K.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Sze and K
Reference 15
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T02:52:01.260411Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 41201bc7-4483-4ced-8d00-8b84adb26ed4 · outbound
This paper cites an unresolved cited work.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Unresolved cited work
Reference 16
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T02:52:01.217167Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation d20324d3-4f35-43d4-8104-ee01453316e3 · outbound
This paper cites an unresolved cited work.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Unresolved cited work
Reference 17
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T02:52:01.211278Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation f5a3f131-2fde-4104-9613-553c90cb0bb6 · outbound
This paper cites an unresolved cited work.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Unresolved cited work
Reference 18
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T02:52:01.214238Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation fdd57a05-62fa-4d74-b0e2-03ccd58f0aca · outbound
This paper cites Beckers, F.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Beckers, F
Reference 19
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T02:52:01.222951Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation c750e317-d939-42a6-b0eb-96606beb3ae8 · outbound
This paper cites Yoshioka, J.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Yoshioka, J
Reference 20
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T02:52:01.205476Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 771a5ee5-dc3e-479e-9960-5e1303c8acc1 · outbound
This paper cites Neamen, Semiconductor Physics and Devices , 4th ed.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Neamen, Semiconductor Physics and Devices , 4th ed
Reference 21
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-05-19T02:52:01.208369Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 0684d9cd-8731-48a3-ab24-614854591310 · outbound
This paper cites an unresolved cited work.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Unresolved cited work
Reference 22
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T02:52:01.199505Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 136c3fd8-7787-4426-98c1-bfbfff3a4580 · outbound
This paper cites an unresolved cited work.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Unresolved cited work
Reference 23
- Resolution
- unresolved
- raw_fallback, observed 2026-05-19T02:52:01.202416Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Observation 5a0a8907-2542-49e2-9cb8-2086d958af9e · outbound
This paper cites an unresolved cited work.
Reproducibility and variability in commercial SiC MOSFETs at deep-cryogenic temperatures Unresolved cited work
Reference 24
- Resolution
- malformed identifier
- raw_fallback, observed 2026-05-19T02:52:01.220054Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-21T06:32:19.484+00:00.
Pith citing papers
No inbound Pith citation observations are available.