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Paper Citation Record · LEDGER

Electrical Impedance Tomography with an Integrated Picoliter-Volume Subtractive Microfluidic Chamber in 65 nm CMOS

As of 20 August 2026, this Paper Citation Record lists 12 of 12 outbound references and 0 inbound Pith citation observations for arXiv:2508.20431.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2508.20431 v1

Coverage vector

measured 12 of 12 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-05T15:10:00.950332Z

measured 12 of 12 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-20T06:33:59.587034+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

12 of 12 outbound references displayed

  • verified exact0
  • verified fuzzy7
  • unresolved5
  • parse uncertain0
  • malformed identifier0
  • metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 676629eb-84d8-49c3-86f0-5b30cca5ffe5 · outbound

This paper cites an unresolved cited work.

Electrical Impedance Tomography with an Integrated Picoliter-Volume Subtractive Microfluidic Chamber in 65 nm CMOS Unresolved cited work

Reference 1

Resolution
unresolved
raw_fallback, observed 2026-08-05T15:10:01.243945Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.

source=pdf_text observed=2026-08-05T15:10:00.890043Z digest=sha256:42814e0e0cdfa8ce38b6ae21dbf5e5f90f87c57fe6df6785416d0644b91fcda9

Observation 59ad319d-dbbc-4b9a-8314-de405dbf9a61 · outbound

This paper cites an unresolved cited work.

Electrical Impedance Tomography with an Integrated Picoliter-Volume Subtractive Microfluidic Chamber in 65 nm CMOS Unresolved cited work

Reference 2

Resolution
unresolved
raw_fallback, observed 2026-08-05T15:10:01.218381Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.

source=pdf_text observed=2026-08-05T15:10:00.895643Z digest=sha256:b02865c48d9f012fbc1871297d8564bef9b57629a3e329089d38b8d00fc9b8f6

Observation 96c99bb3-7835-434b-90f8-bab33640e8f2 · outbound

This paper cites an unresolved cited work.

Electrical Impedance Tomography with an Integrated Picoliter-Volume Subtractive Microfluidic Chamber in 65 nm CMOS Unresolved cited work

Reference 3

Resolution
unresolved
raw_fallback, observed 2026-08-05T15:10:01.197416Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.

source=pdf_text observed=2026-08-05T15:10:00.902815Z digest=sha256:dba7e1dbcded38b5d3f25378580a639ab771777179fe08034bcbdf3c1407595b

Observation 1dfbbbaa-3ca7-47c7-bb22-321456d8feef · outbound

This paper cites Electrical impedance tomog- raphy system based on active electrodes.

Electrical Impedance Tomography with an Integrated Picoliter-Volume Subtractive Microfluidic Chamber in 65 nm CMOS Electrical impedance tomog- raphy system based on active electrodes

Reference 4

Resolution
verified fuzzy
raw_fallback, observed 2026-08-05T15:10:01.174814Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.

source=pdf_text observed=2026-08-05T15:10:00.908593Z digest=sha256:30e2d9028de071d834dfecd81c880ca244f270d1a628eecdc6869c27ab1aa4ac

Observation 362bef88-afd2-405c-a6a5-2b5f68f824fa · outbound

This paper cites an unresolved cited work.

Electrical Impedance Tomography with an Integrated Picoliter-Volume Subtractive Microfluidic Chamber in 65 nm CMOS Unresolved cited work

Reference 5

Resolution
unresolved
raw_fallback, observed 2026-08-05T15:10:01.148221Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.

source=pdf_text observed=2026-08-05T15:10:00.913939Z digest=sha256:31bde1ec69779ea3520e659087b05628aa06338fd376b3149fce8c5bcb6e3148

Observation e56f9f95-3d89-43b1-b9cd-15995f1c7c2c · outbound

This paper cites Electrical impedance tomography for real-time and label-free cellular viability assays of 3D tumour spheroids,.

Electrical Impedance Tomography with an Integrated Picoliter-Volume Subtractive Microfluidic Chamber in 65 nm CMOS Electrical impedance tomography for real-time and label-free cellular viability assays of 3D tumour spheroids,

Reference 6

Resolution
verified fuzzy
raw_fallback, observed 2026-08-05T15:10:01.129968Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.

source=pdf_text observed=2026-08-05T15:10:00.920945Z digest=sha256:6b0b7a9e4357a77dac6cefb6fb864a9be776c9c267f2d13b292c0713c3b4bfd7

Observation e1164b6a-8cdd-45e4-b7f0-5a3699f67c15 · outbound

This paper cites an unresolved cited work.

Electrical Impedance Tomography with an Integrated Picoliter-Volume Subtractive Microfluidic Chamber in 65 nm CMOS Unresolved cited work

Reference 7

Resolution
unresolved
raw_fallback, observed 2026-08-05T15:10:01.111488Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.

source=pdf_text observed=2026-08-05T15:10:00.926816Z digest=sha256:0d42c1276c04a717ee7b0617c81b246fd466124bf58167d0b32da84285f375b2

Observation a0d46dbb-c58e-4eef-b512-b0a4cbad21c9 · outbound

This paper cites Image reconstruction in elec- trical impedance tomography based on structure-aware sparse Bayesian learning,.

Electrical Impedance Tomography with an Integrated Picoliter-Volume Subtractive Microfluidic Chamber in 65 nm CMOS Image reconstruction in elec- trical impedance tomography based on structure-aware sparse Bayesian learning,

Reference 8

Resolution
verified fuzzy
raw_fallback, observed 2026-08-05T15:10:01.093503Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.

source=pdf_text observed=2026-08-05T15:10:00.931719Z digest=sha256:bb649ec3d0e57d342238b778bdec6f3f7de36f6006de963d5ce9ec075e5f5645

Observation 86f78c2f-4ed6-4b94-8b98-6f0b6804ede6 · outbound

This paper cites Subtractive photonics in bulk CMOS,.

Electrical Impedance Tomography with an Integrated Picoliter-Volume Subtractive Microfluidic Chamber in 65 nm CMOS Subtractive photonics in bulk CMOS,

Reference 9

Resolution
verified fuzzy
raw_fallback, observed 2026-08-05T15:10:01.068713Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.

source=pdf_text observed=2026-08-05T15:10:00.936566Z digest=sha256:72de9c7f55b71dc509b3a6748aea35210d8115d7b636b4298aa4116920fa703b

Observation e6a57822-1c9e-4909-88cc-46b354dec569 · outbound

This paper cites Fatemi, C.

Electrical Impedance Tomography with an Integrated Picoliter-Volume Subtractive Microfluidic Chamber in 65 nm CMOS Fatemi, C

Reference 10

Resolution
verified fuzzy
raw_fallback, observed 2026-08-05T15:10:01.036271Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.

source=pdf_text observed=2026-08-05T15:10:00.941300Z digest=sha256:0b87b1898019971f212831d82b63b030f81925942d98c744c1f44e37cd9a1e43

Observation 8302a390-d0d8-4a65-849c-8af6230eef2b · outbound

This paper cites Sarkar and A.

Electrical Impedance Tomography with an Integrated Picoliter-Volume Subtractive Microfluidic Chamber in 65 nm CMOS Sarkar and A

Reference 11

Resolution
verified fuzzy
raw_fallback, observed 2026-08-05T15:10:01.014008Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.

source=pdf_text observed=2026-08-05T15:10:00.945603Z digest=sha256:2f2612d78bd6b1f0cb87751995e89e9bc773690bfd043d82fd40687bda88e0f5

Observation bf177b35-ef94-4041-9ef2-1515c9c3a43e · outbound

This paper cites Adler and W.

Electrical Impedance Tomography with an Integrated Picoliter-Volume Subtractive Microfluidic Chamber in 65 nm CMOS Adler and W

Reference 12

Resolution
verified fuzzy
raw_fallback, observed 2026-08-05T15:10:00.997419Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-20T06:33:59.587034+00:00.

source=pdf_text observed=2026-08-05T15:10:00.950332Z digest=sha256:305ba5c0936948f96d58fcf6f056f451ba8d979cba8f035f74d4f150c8c47267

Pith citing papers

No inbound Pith citation observations are available.