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Direct method for the quantitative analysis of surface contamination on ultra-low background materials from exposure to dust

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arxiv 2006.12746 v1 pith:4OMF7ZXX submitted 2020-06-23 physics.ins-det

Direct method for the quantitative analysis of surface contamination on ultra-low background materials from exposure to dust

M. L. di Vacri , I. J. Arnquist , S. Scorza , E. W. Hoppe , Jeter Hall This is my paper
classification physics.ins-det
keywords dustmethodbackgroundexposureanalysisdirectfalloutlocations
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In this work we present a method for the direct determination of contaminant fallout rates on material surfaces from exposure to dust. Naturally occurring radionuclides K-40, Th-232, U-238 and stable Pb were investigated. Until now, background contributions from dust particulate have largely been estimated from fallout models and assumed dust composition. Our method utilizes a variety of low background collection media for exposure in locations of interest, followed by surface leaching and leachate analysis using inductively coupled plasma mass spectrometry (ICP-MS). The method was validated and applied in selected locations at Pacific Northwest National Laboratory (PNNL) and the SNOLAB underground facility.

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