Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
Machine Learning-Based Reward-Driven Tuning of Scanning Probe Microscopy: Towards Fully Automated Microscopy
As of 18 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 2 inbound Pith citation observations for arXiv:2408.04055.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-17T06:30:58.91139+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-08-08T13:08:30.949785Z
A source-named dated measurement, never combined with another source.
Source: pith, observed 2026-08-07T05:14:36.534148Z
Reference resolution
0 of 0 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
No outbound reference observations are available for this paper version.
Pith citing papers
Observation d45cca4d-16f0-42ac-b311-f55fd31870ac · inbound
PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe Microscopy cites this paper.
PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe Microscopy Machine Learning-Based Reward-Driven Tuning of Scanning Probe Microscopy: Towards Fully Automated Microscopy
Reference 24
- Resolution
- unresolved
- no resolver link, observed 2026-08-08T13:08:30.949785Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation da92fcd4-d5ae-4d9c-b37f-13b4070ef557 · inbound
Mic-hackathon 2024: Hackathon on Machine Learning for Electron and Scanning Probe Microscopy cites this paper.
Mic-hackathon 2024: Hackathon on Machine Learning for Electron and Scanning Probe Microscopy Machine Learning-Based Reward-Driven Tuning of Scanning Probe Microscopy: Towards Fully Automated Microscopy
Reference 16
- Resolution
- verified exact
- local_arxiv, observed 2026-08-07T05:14:36.538271Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.