Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-06T14:15:43.247525Z
Paper Citation Record · LEDGER
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices
As of 18 August 2026, this Paper Citation Record lists 52 of 52 outbound references and 0 inbound Pith citation observations for arXiv:2507.19663.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-18T06:34:40.430872+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
52 of 52 outbound references displayed
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- verified fuzzy29
- unresolved21
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External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 9bd443ec-6de1-46e8-aa29-3f8269edea64 · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 1
- Resolution
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation d5f8294a-3086-4726-8f0c-d29bf0e2ee47 · outbound
This paper cites Shahriari, K.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Shahriari, K
Reference 2
- Resolution
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation f7662caa-7978-48a6-9485-4a2d7244fe2f · outbound
This paper cites Garnett, Bayesian optimization, Cambridge University Press, 2023.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Garnett, Bayesian optimization, Cambridge University Press, 2023
Reference 3
- Resolution
- unresolved
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 2d9c0cdd-d078-4e38-bf6c-c21af143e53d · outbound
This paper cites Zhang, W.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Zhang, W
Reference 4
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 24aa3f5c-af67-4fd6-a511-538b5bee7cf4 · outbound
This paper cites Huang, C.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Huang, C
Reference 5
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation bcbec3bf-726c-4822-9bdc-749eb09991cb · outbound
This paper cites Zhang, F.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Zhang, F
Reference 6
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 9194b8b4-2b1f-487f-86ba-db62faa0772f · outbound
This paper cites Tilgner, Physics of failure for interconnect structures: an essay, Microsys- tem technologies 15 (1) (2009) 129–138.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Tilgner, Physics of failure for interconnect structures: an essay, Microsys- tem technologies 15 (1) (2009) 129–138
Reference 7
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 78998532-2ba1-41ce-9d74-83f65e59bb39 · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 8
- Resolution
- unresolved
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation c3a46e5d-7cbc-4941-a719-c42add7d2e01 · outbound
This paper cites Musadiq, W.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Musadiq, W
Reference 9
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T14:15:43.615196Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 2a0af54f-d57a-41f1-a4ea-8bc44cccdd5a · outbound
This paper cites Pecht, Handbook of electronic package design, CRC press, 2018.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Pecht, Handbook of electronic package design, CRC press, 2018
Reference 10
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T14:15:43.607781Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 1d6d76e5-0e4d-4e02-9a12-590f2c713644 · outbound
This paper cites Wolfgang, Examples for failures in power electronics systems, ECPE tu- torial on reliability of power electronic systems, Nuremberg, Germany (2007) 19–20.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Wolfgang, Examples for failures in power electronics systems, ECPE tu- torial on reliability of power electronic systems, Nuremberg, Germany (2007) 19–20
Reference 11
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 33825e00-b44b-4133-8890-6d4794039120 · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 12
- Resolution
- unresolved
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 1c2d3445-181f-4d68-a74d-9817c4e89d2c · outbound
This paper cites Arabi, A.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Arabi, A
Reference 13
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation b0b9e694-3e96-4f46-9647-45493b39cd6e · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 14
- Resolution
- unresolved
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation ebe9fdda-dafa-4d5f-b53f-5af2a49d237f · outbound
This paper cites De Jong, A.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices De Jong, A
Reference 15
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 4e55bcd9-a995-4113-805e-897bacbebf19 · outbound
This paper cites de Jong, A.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices de Jong, A
Reference 16
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation f9cd298b-190d-4c9c-bf8e-453a3c1432fc · outbound
This paper cites Van Driel, G.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Van Driel, G
Reference 17
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation f5307224-91ca-496e-9769-10ee794613ec · outbound
This paper cites Wymys lowski, W.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Wymys lowski, W
Reference 18
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T14:15:43.549229Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation b5935333-6aee-4be1-96a6-211f09d5c0a8 · outbound
This paper cites A Tutorial on Bayesian Optimization.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices A Tutorial on Bayesian Optimization
Reference 19
- Resolution
- unresolved
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 594e3272-4ab6-42ca-ad7d-baa57a87571d · outbound
This paper cites Feurer, J.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Feurer, J
Reference 20
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 9168a66e-e833-49fb-9056-3441a0e3d9a1 · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 21
- Resolution
- unresolved
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation f542d1d0-70d6-42b9-bf8c-7b53365cce98 · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 22
- Resolution
- unresolved
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation f6e1482b-5881-4755-96e1-49c293f2d180 · outbound
This paper cites Khalil, A.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Khalil, A
Reference 23
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation e54d764c-5c3e-47f3-9880-60bb5ff65f5a · outbound
This paper cites Sharma, T.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Sharma, T
Reference 24
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 2c22e59a-964e-4284-bac3-97e3ec278c81 · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 25
- Resolution
- unresolved
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 0cbadb61-9f07-4e0a-8a9b-002fd9793e6a · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 26
- Resolution
- unresolved
- raw_fallback, observed 2026-08-06T14:15:43.497008Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 98fa9d7d-cbff-453a-beb0-58239091973b · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 27
- Resolution
- unresolved
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation e2fe1ca8-0d8d-4ab0-866a-eac7f99e4f36 · outbound
This paper cites Auer, Using confidence bounds for exploitation-exploration trade-offs, Jour- nal of Machine Learning Research 3 (Nov) (2002) 397–422.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Auer, Using confidence bounds for exploitation-exploration trade-offs, Jour- nal of Machine Learning Research 3 (Nov) (2002) 397–422
Reference 28
- Resolution
- verified fuzzy
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 353b8221-ecea-462d-b5e0-071bd845d534 · outbound
This paper cites Adam: A Method for Stochastic Optimization.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Adam: A Method for Stochastic Optimization
Reference 29
- Resolution
- unresolved
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation e5b97a7f-0ce1-43a0-8789-216ec90c09d8 · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 30
- Resolution
- unresolved
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 1881d761-0323-46b9-a713-6ac08fd94118 · outbound
This paper cites Unexpected Improvements to Expected Improvement for Bayesian Optimization.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unexpected Improvements to Expected Improvement for Bayesian Optimization
Reference 31
- Resolution
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Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 92bbf20d-04a6-4e21-b659-0f96b67ec463 · outbound
This paper cites Duvenaud, J.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Duvenaud, J
Reference 32
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T14:15:43.467495Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 4cda675a-7f1e-4641-b349-93bc512d49af · outbound
This paper cites Chicco, M.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Chicco, M
Reference 33
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T14:15:43.459788Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation b22ece07-d042-4c62-967c-8b8d134723c9 · outbound
This paper cites Are you using test log-likelihood correctly?.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Are you using test log-likelihood correctly?
Reference 34
- Resolution
- verified exact
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Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 67780aab-103a-4b18-a4b6-3c8e1ef35edc · outbound
This paper cites Gelman, J.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Gelman, J
Reference 35
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T14:15:43.452097Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation b2c691ba-64f0-44b3-a8af-6d87f600950a · outbound
This paper cites Tree-Structured Parzen Estimator: Understanding Its Algorithm Components and Their Roles for Better Empirical Performance.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Tree-Structured Parzen Estimator: Understanding Its Algorithm Components and Their Roles for Better Empirical Performance
Reference 36
- Resolution
- unresolved
- no resolver link, observed 2026-08-06T14:15:43.125723Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 445574af-81b9-41f1-a54f-8234d308f1a6 · outbound
This paper cites Hutter, H.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Hutter, H
Reference 37
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T14:15:43.444353Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation da7fda7a-71bb-48f2-8887-0b5ba5365856 · outbound
This paper cites Bergstra, B.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Bergstra, B
Reference 38
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T14:15:43.436813Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 5bb4ef2f-09aa-4c4a-bdc5-edf677ffd8e8 · outbound
This paper cites Akiba, S.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Akiba, S
Reference 39
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T14:15:43.429308Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation d4b1d99c-d02f-43ff-b76a-d36f49ce5c3e · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 40
- Resolution
- unresolved
- raw_fallback, observed 2026-08-06T14:15:43.421821Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 8d8a9ccb-321c-4b78-8e01-b994989484ee · outbound
This paper cites Tuning Hyperparameters without Grad Students: Scalable and Robust Bayesian Optimisation with Dragonfly.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Tuning Hyperparameters without Grad Students: Scalable and Robust Bayesian Optimisation with Dragonfly
Reference 41
- Resolution
- verified exact
- local_arxiv, observed 2026-08-06T14:15:43.277446Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 7adfe4fd-ca6b-40a1-a990-1c78784081be · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 42
- Resolution
- unresolved
- raw_fallback, observed 2026-08-06T14:15:43.413921Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation d854cb37-a3f6-4c52-bafc-1ca4fe803947 · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 43
- Resolution
- unresolved
- no resolver link, observed 2026-08-06T14:15:43.142776Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 964dbe63-3bdb-491b-ad98-3870cb24faf4 · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 44
- Resolution
- unresolved
- raw_fallback, observed 2026-08-06T14:15:43.399996Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 02449761-e57a-43be-9ccd-8dc2d41ae82d · outbound
This paper cites Saltelli, P.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Saltelli, P
Reference 45
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T14:15:43.391262Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 711a7446-289b-417b-bf1e-47c43c505b41 · outbound
This paper cites Niessner, A.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Niessner, A
Reference 46
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T14:15:43.382984Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation ad872792-58c7-436d-a7fd-e6c714877334 · outbound
This paper cites Gromala, A.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Gromala, A
Reference 47
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T14:15:43.374208Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 270585ba-c22f-4e33-a47c-c669d2ffc911 · outbound
This paper cites Nossent, P.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Nossent, P
Reference 48
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T14:15:43.366212Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation c452236f-c2cf-4217-aa4b-6f8b498276e3 · outbound
This paper cites Zhang, M.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Zhang, M
Reference 49
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T14:15:43.358504Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 4f526979-5bc0-4075-9edf-24e5867505b1 · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 50
- Resolution
- unresolved
- raw_fallback, observed 2026-08-06T14:15:43.350636Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation 93b57c4d-bf63-487d-875a-2ec6c95f2da1 · outbound
This paper cites an unresolved cited work.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work
Reference 51
- Resolution
- unresolved
- raw_fallback, observed 2026-08-06T14:15:43.342218Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation db0e9304-c9bf-45f7-953f-40ea03f03272 · outbound
This paper cites Vandevelde, E.
Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Vandevelde, E
Reference 52
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- raw_fallback, observed 2026-08-06T14:15:43.333402Z
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