Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses | Paper Citation Record

Observation 53fb003d-033a-41c1-93d5-23fa15885d4f · outbound

This paper cites Mertins, F.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Mertins, F

Reference 1

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.983420Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation cd94bd79-b44d-472e-9610-0fbc30aa5bc1 · outbound

This paper cites Underwood, T.W.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Underwood, T.W

Reference 2

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.969181Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 7c101919-5f95-413a-879c-1a83d1c1c94e · outbound

This paper cites Huang, Q.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Huang, Q

Reference 3

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.954492Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 9ea337f6-a534-429b-b307-74465a1d6ea1 · outbound

This paper cites Kördel, A.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Kördel, A

Reference 4

Resolution: unresolved; no resolver link, observed 2026-08-15T21:54:13.627463Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation ce8004ad-f9cb-41ed-b92e-5b40c53672e8 · outbound

This paper cites Di Fonzo, B.R.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Di Fonzo, B.R

Reference 5

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.927432Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 640a0218-e093-4eee-83bf-3c45d6ade841 · outbound

This paper cites Zhong, W.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Zhong, W

Reference 6

Resolution: verified fuzzy; raw_fallback, observed 2026-08-15T21:54:15.586097Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation fc738a43-a340-4e04-b00d-1ab73fcaa376 · outbound

This paper cites Maruyama, D.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Maruyama, D

Reference 7

Resolution: verified fuzzy; raw_fallback, observed 2026-08-15T21:54:15.570651Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 965e06f7-cbba-4d36-896d-87d83ba6bb26 · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 8

Resolution: unresolved; no resolver link, observed 2026-08-15T21:54:13.657849Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation fdf26831-185a-40f2-868e-5c8774f6a508 · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 9

Resolution: metadata mismatch; raw_fallback, observed 2026-08-15T21:54:15.381788Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation dc3da258-be51-42b9-b29f-ed8c9949970c · outbound

This paper cites Eriksson, N.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Eriksson, N

Reference 10

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.877039Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation efa34001-9cf4-4277-add1-ac65b13b07c8 · outbound

This paper cites Eriksson, N.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Eriksson, N

Reference 11

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.862852Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 8111c672-8d47-4b52-ad3c-fa5cd470fc4e · outbound

This paper cites Maruyama, D.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Maruyama, D

Reference 12

Resolution: unresolved; no resolver link, observed 2026-08-15T21:54:13.677758Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 9c6b2905-a3c6-4696-987b-facbf471ab4a · outbound

This paper cites Elsenhans, P.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Elsenhans, P

Reference 13

Resolution: verified fuzzy; raw_fallback, observed 2026-08-15T21:54:15.553820Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation f9e8bb64-400a-4457-9241-52b918e44924 · outbound

This paper cites Broekhuijsen, N.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Broekhuijsen, N

Reference 14

Resolution: unresolved; no resolver link, observed 2026-08-15T21:54:13.692574Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 905dd391-413c-4541-8868-3fa9314ae9d6 · outbound

This paper cites Stendahl, N.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Stendahl, N

Reference 15

Resolution: unresolved; no resolver link, observed 2026-08-15T21:54:13.697029Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation e5471bdd-6ced-49da-a20c-0f06640234ca · outbound

This paper cites Smertin, E.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Smertin, E

Reference 16

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.813114Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 424a7813-d747-4c25-af70-ba93d65f05b9 · outbound

This paper cites Duerig, A.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Duerig, A

Reference 17

Resolution: unresolved; no resolver link, observed 2026-08-15T21:54:13.706296Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 8ce1d1c8-f17a-4c80-b3ed-f83d58191a4a · outbound

This paper cites Armitage, T.L.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Armitage, T.L

Reference 18

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.788117Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 86c29fcd-b260-4d06-8e2f-e1ee2bf8fafb · outbound

This paper cites Polkovnikov, N.N.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Polkovnikov, N.N

Reference 19

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.773780Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 2077b855-1870-40ca-a993-a905c709abcf · outbound

This paper cites Chkhalo, A.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Chkhalo, A

Reference 20

Resolution: verified exact; raw_fallback, observed 2026-08-15T21:54:15.200706Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 20e8c83e-c6a0-4ad6-b3b7-612282fb11d5 · outbound

This paper cites Repoux, Comparison of background removal methods for XPS, Surface and Interface Analysis 18 (1992) 567–570.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Repoux, Comparison of background removal methods for XPS, Surface and Interface Analysis 18 (1992) 567–570

Reference 21

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.759266Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 98089bfc-7e0c-454d-b284-5da5f95f6588 · outbound

This paper cites Tougaard, Universality classes of inelastic electron scattering cross-sections, Surface and Interface Analysis 25 (1997) 137–154.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Tougaard, Universality classes of inelastic electron scattering cross-sections, Surface and Interface Analysis 25 (1997) 137–154

Reference 22

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.744856Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation f66843cc-6d35-44d7-bdc0-4f8d0d71414b · outbound

This paper cites Svechnikov, Multifitting: software for the reflectometric reconstruction of multilayer nanofilms, J Appl Crystallogr 53 (2020) 244–252.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Svechnikov, Multifitting: software for the reflectometric reconstruction of multilayer nanofilms, J Appl Crystallogr 53 (2020) 244–252

Reference 23

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.729778Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation b6392b0c-532c-4b62-9980-76e9588fab35 · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 24

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.714259Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation dca514d0-39a4-4279-9838-e1457d83da9e · outbound

This paper cites Jain, S.P.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Jain, S.P

Reference 25

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.699227Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation fb1f2680-031d-458d-9d10-c37d462b5d9c · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 26

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.684412Z

Source-reported events for the cited work

correction dated 2018-02-13. Source: crossref record 10.1016/j.matdes.2018.02.014->10.1016/j.matdes.2017.05.055:correction, observed 2026-07-11T03:17:19.891751+00:00. This notice travels one citation hop only.

Observation 85e17aea-11f4-4f0a-b077-cb74610bd853 · outbound

This paper cites Babaei-Dehkordi, M.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Babaei-Dehkordi, M

Reference 27

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.669051Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 4ac8534e-d41e-445d-ade3-f111b079c56f · outbound

This paper cites Senkovskiy, D.Yu.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Senkovskiy, D.Yu

Reference 28

Resolution: verified fuzzy; raw_fallback, observed 2026-08-15T21:54:15.538553Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 62490964-24ae-4028-b530-0a999418b532 · outbound

This paper cites Petrović, D.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Petrović, D

Reference 29

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.636964Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 2c52a43a-f9ee-4184-995b-cc84e0be4be6 · outbound

This paper cites Hillebrecht, J.C.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Hillebrecht, J.C

Reference 30

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.621234Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 9d981cd3-8418-4675-8227-98230a8ec49f · outbound

This paper cites Hüfner, G.K.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Hüfner, G.K

Reference 31

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.606438Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 1417d2a3-2e9d-4929-bd67-f5811ea638c5 · outbound

This paper cites Wang, C.L.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Wang, C.L

Reference 32

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.591384Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation cadb6d0c-6bc9-404d-977e-b354b5fe315d · outbound

This paper cites Richardson, L.A.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Richardson, L.A

Reference 33

Resolution: malformed identifier; no resolver link, observed 2026-08-15T21:54:13.784356Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 8db0bee2-722b-477d-b330-5e7de4eaa8fb · outbound

This paper cites Kittel, Introduction to Solid State Physics.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Kittel, Introduction to Solid State Physics

Reference 34

Resolution: verified fuzzy; raw_fallback, observed 2026-08-15T21:54:15.522298Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 99f3e233-7d2e-4173-bc7a-e4b8e8fc8cf5 · outbound

This paper cites Diebold, T.E.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Diebold, T.E

Reference 35

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.566825Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation ac9a75ae-c148-4ecd-a2a5-7e30eb59ab1b · outbound

This paper cites Barreca, A.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Barreca, A

Reference 36

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.551703Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 2cb4efce-9c60-4487-88f6-ccb170353394 · outbound

This paper cites Biesinger, L.W.M.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Biesinger, L.W.M

Reference 37

Resolution: unresolved; no resolver link, observed 2026-08-15T21:54:13.802721Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation 2a6ff335-e830-4130-bf11-afdb9b9384e8 · outbound

This paper cites Hashimoto, A.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Hashimoto, A

Reference 38

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.526493Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation e1136356-364f-4d46-9ec3-890413f9d0a6 · outbound

This paper cites Biesinger, B.P.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Biesinger, B.P

Reference 39

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.511272Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 21cf5abe-2d8c-42fb-82d0-842a3943d089 · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 40

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.494816Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation bda1f952-e9b5-485a-9c08-c4a4540e7652 · outbound

This paper cites Brundle, B.V.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Brundle, B.V

Reference 41

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.373989Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation f993b7c6-078f-4410-925d-951590775f63 · outbound

This paper cites TRZHASKOVSKAYA, V .I.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses TRZHASKOVSKAYA, V .I

Reference 42

Resolution: verified exact; raw_fallback, observed 2026-08-15T21:54:15.132909Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 2f77295d-8b31-4348-85f0-63617758c818 · outbound

This paper cites Tanuma, C.J.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Tanuma, C.J

Reference 43

Resolution: verified fuzzy; raw_fallback, observed 2026-08-15T21:54:15.506594Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation c7625678-af8a-4de6-95b1-d21ccb17bae5 · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 44

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.343874Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation e828ce17-c479-45af-b681-a9e8b3aa78b2 · outbound

This paper cites Mansour, Characterization of NiO by XPS, Surface Science Spectra 3 (1994) 231–238.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Mansour, Characterization of NiO by XPS, Surface Science Spectra 3 (1994) 231–238

Reference 45

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.328848Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation e2c8b5f4-5d87-458d-aa90-d428c5a3ca00 · outbound

This paper cites Pagot, M.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Pagot, M

Reference 46

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.313683Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation cd16d12b-7414-41bb-b775-f4bc636f0c45 · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 47

Resolution: malformed identifier; no resolver link, observed 2026-08-15T21:54:13.855578Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation c28342ea-ecaa-4d3a-b659-a05fd061a988 · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 48

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.288812Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 4aba33b9-5604-44e5-b41d-8fbce4ea5c0d · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 49

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.274175Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 648ecda5-3cf3-4cea-ac6d-32c058421bd3 · outbound

This paper cites Jensen, S.S.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Jensen, S.S

Reference 50

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.259620Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation b7b6a456-e03a-4283-9695-822ea4affe47 · outbound

This paper cites Desbiens, R.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Desbiens, R

Reference 51

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.245666Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 867a4573-e6f1-47d6-b2d2-115527a89479 · outbound

This paper cites Barr, An XPS study of Si as it occurs in adsorbents, catalysts, and thin films, Applications of Surface Science 15 (1983) 1–35.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Barr, An XPS study of Si as it occurs in adsorbents, catalysts, and thin films, Applications of Surface Science 15 (1983) 1–35

Reference 52

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.231264Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 2b925008-00cf-4717-924f-d449873825d9 · outbound

This paper cites Nakajima, S.P.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Nakajima, S.P

Reference 53

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.216412Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation ee479b69-b5b0-4bce-9edd-334095e1e32e · outbound

This paper cites Lee, E.T.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Lee, E.T

Reference 54

Resolution: malformed identifier; doi_truncated, observed 2026-08-15T21:54:14.201980Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 65290b97-ed5f-40ab-bfff-c801a9010844 · outbound

This paper cites Osiceanu, An XPS study on ion beam induced oxidation of titanium silicide, Appl Surf Sci 253 (2006) 381–384.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Osiceanu, An XPS study on ion beam induced oxidation of titanium silicide, Appl Surf Sci 253 (2006) 381–384

Reference 55

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.186942Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 719a2f62-4ac4-4fa8-b018-27f5ecb0ac37 · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 56

Resolution: unresolved; raw_fallback, observed 2026-08-15T21:54:15.491137Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation ad7e5e73-f515-4e75-a8d9-01b7ad898a59 · outbound

This paper cites Aboulfadl, F.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Aboulfadl, F

Reference 57

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.157996Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 4c1725eb-2ec0-424f-ab4e-45648771d328 · outbound

This paper cites Hollanders, B.J.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Hollanders, B.J

Reference 58

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.143061Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 97880928-c728-4119-9841-af355b72fcd4 · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 59

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.127829Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation ce9c9b23-70ae-44bd-adc2-29cacbf624ec · outbound

This paper cites Zhang, Z.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Zhang, Z

Reference 60

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.110522Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 65fc4bd9-4712-4379-ab2d-c42e01dc2ac8 · outbound

This paper cites Jankowski, M.A.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Jankowski, M.A

Reference 61

Resolution: verified exact; raw_fallback, observed 2026-08-15T21:54:15.052634Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 2a9b3f62-448b-4051-82ab-01fb9643f34f · outbound

This paper cites Singh, S.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Singh, S

Reference 62

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.093802Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 7872c8fd-bda4-4d42-9c51-47b02533d11b · outbound

This paper cites Shi, Z.H.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Shi, Z.H

Reference 63

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.078928Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation d981215c-1976-4ca8-911c-8cab3c915d37 · outbound

This paper cites Bhatt, V.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Bhatt, V

Reference 64

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.063427Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation b5cc87d4-62e0-467f-a5ba-d305a5d43acf · outbound

This paper cites El-Eskandarany, Metallic glassy Ti 2 Ni grain-growth inhibitor powder for enhancing the hydrogenation/dehydrogenation kinetics of MgH 2, RSC Adv 9 (2019) 1036–1046.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses El-Eskandarany, Metallic glassy Ti 2 Ni grain-growth inhibitor powder for enhancing the hydrogenation/dehydrogenation kinetics of MgH 2, RSC Adv 9 (2019) 1036–1046

Reference 65

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.048527Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 232a88a9-7c78-43b8-bdcd-8364a11fdceb · outbound

This paper cites Patterson, The Scherrer Formula for X-Ray Particle Size Determination, Physical Review 56 (1939) 978.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Patterson, The Scherrer Formula for X-Ray Particle Size Determination, Physical Review 56 (1939) 978

Reference 66

Resolution: unresolved; no resolver link, observed 2026-08-15T21:54:13.949231Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

Observation fa1eb5d2-532d-4c2e-8e66-fe66ef6f7739 · outbound

This paper cites Bhatt, S.M.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Bhatt, S.M

Reference 67

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.020926Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 576e3917-328c-48ee-a693-22e3b564cf1f · outbound

This paper cites Kraegermann, K.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Kraegermann, K

Reference 68

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.004998Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 0666dd0f-fb01-4168-815e-b15f687bb4f5 · outbound

This paper cites Arblaster, Selected Values of the Crystallographic Properties of Elements, ASM International,.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Arblaster, Selected Values of the Crystallographic Properties of Elements, ASM International,

Reference 69

Resolution: verified fuzzy; raw_fallback, observed 2026-08-15T21:54:15.476247Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 412d8f35-2183-4d29-98a2-372a2a10598f · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 119

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.838608Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 3b72f2a8-52d1-4add-8979-4568b455f5a3 · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 196

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.652307Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation f5dbe4be-7fbb-47cd-916b-189a74735cd4 · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 267

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.172286Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 6c765770-7478-45ac-a89b-aeaac3f33629 · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 275

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.359441Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 1fd17eeb-ca2d-4e04-af97-e49317d1abb8 · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 1258

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.891739Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 5e6b0db5-ad41-4744-b026-f101b6f30839 · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 2018

Resolution: parse uncertain; raw_fallback, observed 2026-08-15T21:54:15.461401Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Observation 5c3f33cf-b470-46a5-aa9d-a3d11d2038fd · outbound

This paper cites an unresolved cited work.

Influence of Silicon Interlayers on Transition Layer Formation in Ti/Ni Multilayer Structures of Different Thicknesses Unresolved cited work

Reference 2680

Resolution: verified exact; doi, observed 2026-08-15T21:54:14.912702Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-23T06:30:58.430688+00:00.

Coverage vector

Reference resolution

Outbound references

Pith citing papers