Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
General Resolution Enhancement Method in Atomic Force Microscopy (AFM) Using Deep Learning
As of 18 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:1809.03704.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-17T06:30:58.91139+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-08-08T13:08:30.953696Z
A source-named dated measurement, never combined with another source.
Source: pith, observed 2026-08-08T13:08:31.207133Z
Reference resolution
0 of 0 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
No outbound reference observations are available for this paper version.
Pith citing papers
Observation 15f6a504-b1f5-4da4-87df-4f15b9f50412 · inbound
PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe Microscopy cites this paper.
PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe Microscopy General Resolution Enhancement Method in Atomic Force Microscopy (AFM) Using Deep Learning
Reference 25
- Resolution
- verified exact
- local_arxiv, observed 2026-08-08T13:08:31.248758Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-17T06:30:58.91139+00:00.