REVIEW 3 major objections 5 minor 12 references
Performance studies of the CE-65v2 MAPS prototype structure
T0 review · 3 major / 5 minor · reviewed 2026-08-08 · deepseek-v4-flash
Pith's one-line read The CE-65v2 sensor's standard process achieves spatial resolution below 3 µm (below 2 µm at 15 µm pitch) at seed thresholds around 150–170 electrons with >99% hit efficiency, meeting a future lepton collider's vertex detector target.
desk verdict New test-beam data on a 65 nm MAPS prototype plausibly show the STD process meeting the FCC-ee 3 µm resolution target, but missing uncertainty budgets and a shaky telescope-resolution subtraction keep the quantitative claims from being fully established. read the letter →
The pith
A machine-rendered reading of the paper's core claim, the machinery that carries it, and where it could break.
The reading
What carries the argument
The central mechanism is diffusion-dominated charge sharing in the STD process. When a particle crosses the sensor, the deposited charge spreads over several neighbouring pixels because the depletion layer does not extend to the pixel boundaries; a cluster is defined by grouping pixels above the seed threshold, and the hit position is computed as the centre of gravity of the cluster charges, optionally including all charges in a 3×3 window around the seed (the window method). The in-pixel study is the tool that makes the mechanism visible: it superimposes the hit information of every pixel (excluding the two outermost rows and columns) so efficiency and the mean absolute deviation between reconstructed and track positions can be plotted as a function of the hit position inside a pixel. Comparing STD with GAP isolates the effect of the process-level charge-collection profile on the achievable resolution.
What would settle it
Recompute the device-under-test resolution using a telescope resolution estimated internally from the test-beam data, for example from the scatter of reference-plane residuals around their track-fit pulls, and check whether the 15 µm STD pitch still gives a sub-2 µm value after that self-consistent subtraction.
Extended reading notes
Core claim
This paper claims that the CE-65v2, a 48×24 pixel monolithic active pixel sensor made in a 65 nm CMOS imaging process, can meet the 3 µm spatial-resolution requirement of a future lepton-collider vertex detector. In the standard (STD) process, where the depletion region stops short of the pixel edges and charge spreads by diffusion, the sensor reaches about 3 µm resolution at a seed threshold near 150 electrons and, according to the conclusion, below 2 µm for the 15 µm pixel pitch and below 3 µm for the 22.5 µm pitch, with hit efficiency above 99%. The alternative gap (GAP) process, which adds a low-dose n-type layer with gaps between pixels to steer charge by drift, collects charge faster but shares less; it reaches about 3.3 µm resolution. The in-pixel maps, made by superimposing many tracks relative to each pixel centre, show the STD process gives uniform positional accuracy across the pixel while efficiency drops at edges and corners, whereas the GAP process is uniformly efficient but loses positional accuracy at edges and corners.
Load-bearing premise
The load-bearing premise is that the 2.2 µm telescope resolution used for the quadrature subtraction is not an overestimate and that the reference-track and device residuals are uncorrelated; if the telescope is actually more precise than 2.2 µm, the reported sub-3 µm sensor resolutions are too optimistic.
Editorial extensions
If this is right
- A vertex detector layer built from STD CE-65v2-type sensors could in principle meet the 3 µm requirement at around 99% efficiency, with the 15 µm pitch providing a sub-2 µm margin.
- The GAP process, which trades resolution for faster charge collection and better radiation tolerance, reaches about 3.3 µm; reducing the pixel pitch is a plausible route to bring it below the 3 µm target.
- In-pixel maps indicate that a single cluster-position algorithm may not suit both processes: STD needs help at edges and corners where efficiency drops, while GAP needs help there where positional accuracy drops.
- Operating at 4 V reverse bias improves STD resolution relative to 10 V but can lower efficiency at high seed thresholds, so the operating point must balance resolution against efficiency.
- Exploiting charge-sharing information from a 3×3 window is what allows resolutions below $\mathrm{pitch}/\sqrt{12}$; a readout that discards neighbour charges would forfeit the STD process's main advantage.
Reading between the lines
- Editorial inference: if the STD process is chosen for a vertex detector, the dominant engineering problem shifts to the readout — digitising and transporting neighbour-charge information at high hit rates without adding material; the paper's own outlook implies this, and the in-pixel maps make it concrete.
- Editorial inference: the efficiency dip at STD pixel corners suggests a digital implementation might need a position-dependent seed threshold or a cluster-weighting scheme that treats corner hits specially, since charge is split four ways there.
- Editorial inference: the 4 V versus 10 V comparison suggests reverse bias could be tuned continuously to trade resolution against efficiency; a future bias scan would map this trade-off quantitatively.
- Editorial inference: applying the same in-pixel technique to the untested 18 µm pitch and the modified-without-gap process would show whether diffusion sharing or a smaller pitch is the more robust route to the 3 µm target, extending the paper's stated next steps.
Editorial analysis
A structured set of objections, weighed in public.
Referee Report
Summary. The paper reports test-beam measurements of the CE-65v2 monolithic active pixel sensor (MAPS) prototype fabricated in the 65 nm TPSCo CMOS process. It compares the standard (STD) and modified-with-gap (GAP) process variants, pixel pitches of 15 and 22.5 µm, and reverse biases of 4 and 10 V. The authors measure global hit efficiency and spatial resolution as functions of seed threshold, and present in-pixel maps of efficiency and mean absolute deviation. The central claim is that the STD process reaches the FCC-ee vertex detector requirement of 3 µm spatial resolution at a seed threshold of about 150 e-, with about 99% efficiency, and the conclusion states that resolutions below 2 µm (3 µm) are achieved with 15 µm (22.5 µm) pitch while maintaining over 99% efficiency.
Significance. If confirmed, the result is significant for future lepton collider vertex detectors: it demonstrates that a large-pitch MAPS sensor relying on diffusion-dominated charge sharing can meet the 3 µm spatial resolution requirement of FCC-ee. The in-pixel efficiency and resolution maps provide valuable insight into charge-sharing behavior and process-dependent performance. The paper uses an established analysis framework (Corryvreckan) and builds on prior characterization, and the measured trends are physically plausible. However, the quantitative claims lack uncertainty propagation and depend on a telescope-resolution subtraction that is not independently validated, so the headline numbers are not yet fully established.
major comments (3)
- [Section 3] The telescope resolution is quoted as 2.2 µm with no uncertainty or validation, and the DUT resolution is obtained by subtracting this value in quadrature. Because the reported DUT resolutions are in the 2–5 µm range, the subtraction is highly sensitive: a 0.3 µm misestimate of the telescope resolution would shift a nominal 3.0 µm result to 3.2 µm or 2.7 µm, moving it across the FCC-ee threshold. The authors should report the uncertainty on the telescope resolution, describe how it was determined, and provide a check that the residuals are Gaussian and independent of the DUT residuals. This is required to support the quantitative claim that the STD process meets the 3 µm requirement.
- [Section 4, Figs. 1c and 1d] The paper does not define the spatial-resolution estimator (RMS, Gaussian sigma, or median-based) and shows no uncertainties on the efficiency or resolution points. Without this information, the statement that the STD process 'achieves the target resolution of 3 µm' cannot be evaluated statistically. The authors should specify the estimator, add statistical and systematic uncertainties at least for the quoted operating points, and explain how the efficiency values at the quoted threshold are obtained.
- [Section 6 vs Section 4] The conclusion claims 'resolutions < 2 µm (< 3 µm) are achieved with a pitch of 15 µm (22.5 µm), while still operating with over 99% efficiency,' but Section 4 only supports a 3 µm resolution at ~150 e- for both pitches. The reverse bias and seed threshold for the stronger conclusion are not specified, nor is it clear that these points appear in Figs. 1c and 1d. The authors should either reconcile the conclusion with the presented figures or specify the exact operating conditions (bias, threshold) and show the corresponding efficiency, so that the claim is traceable and reproducible.
minor comments (5)
- [Section 3] The beam energy '120 GeV' should specify the momentum unit (e.g., 120 GeV/c), and the footnote giving a website for the telescope optimizer should be replaced by a formal reference or a description of the method.
- [Section 4] The lowest seed threshold is set to three times the noise RMS, but the actual noise value is not reported; please state it to make the threshold scale meaningful.
- [Section 5, Figs. 2 and 3] The color scales of the in-pixel maps are not described in the text or captions; please add units and numerical ranges. Also, the mean absolute deviation (MAD) plotted in Fig. 3 is a different metric from the RMS spatial resolution in Fig. 1; the text should clarify that the two are not directly comparable.
- [Section 5] The paper states that 'a large amount of statistics was collected' but does not report the number of tracks or events used in the analysis; including this number would help the reader judge the statistical precision of the in-pixel maps.
- [Section 6] The statement that the GAP process 'enables resolutions of ~3.3 µm' should specify the pixel pitch and operating conditions, since the resolution is strongly pitch- and threshold-dependent.
Circularity Check
No significant circularity: the CE-65v2 results are test-beam measurements compared against an external FCC-ee requirement; the telescope resolution and calibration inputs are independent of the headline DUT resolution claims.
full rationale
The paper is an experimental characterization study, not a derivation. The headline claims — sub-3 µm spatial resolution for the STD process and the FCC-ee requirement comparison — are based on measured hit residuals in a test beam, not on a fitted parameter that is then renamed as a prediction. The telescope resolution of 2.2 µm is an input that is subtracted in quadrature, and it is stated to be evaluated with a telescope optimiser on the reference telescope; it is not fitted to the DUT data or defined in terms of the target result. The lab calibration with a 55Fe source and the use of the Corryvreckan framework also enter as independent analysis tools. Self-citations appear for context ([3] for the FCC-ee vertex detector requirement and [8] for the previous CE-65v2 campaign), but the requirement is an external benchmark and the previous campaign provides independent prior measurements rather than the result being derived from it. The cited works are not invoked to forbid alternatives or to supply the central resolution numbers. The identified weakness — no quoted uncertainty on the 2.2 µm telescope resolution and no explicit Gaussianity/independence check — is a legitimate systematic-correctness concern, but it does not make the measurement circular: an input with unknown error can weaken a claim without turning the claim into its own premise. Therefore the circularity score is 0.
Assumptions & free parameters
free parameters (2)
- 55Fe charge calibration constant =
not stated (determined in [8])
- Reference telescope resolution =
2.2 µm
assumptions (4)
- domain assumption The reference telescope resolution is 2.2 µm and is uncorrelated with the DUT residuals, so quadrature subtraction is valid.
- domain assumption The 55Fe calibration of the sensor gain, performed before the test beam, remains valid during the test beam data taking.
- domain assumption The charge collection model of the STD and GAP processes, taken from reference [7], correctly describes the efficiency and resolution differences.
- domain assumption Centre-of-gravity cluster reconstruction with the chosen neighbour thresholds yields unbiased hit positions.
Cite this review
Pith. "Pith review of Performance studies of the CE-65v2 MAPS prototype structure." pith.science (2026). https://pith.science/paper/LEK3HVHF
@misc{pith2026250204070,
author = {Pith},
title = {Pith review of: Performance studies of the CE-65v2 MAPS prototype structure},
year = {2026},
howpublished = {\url{https://pith.science/paper/LEK3HVHF}},
note = {Machine review of arXiv:2502.04070}
}
abstract
With the next upgrade of the ALICE inner tracking system (ITS3) as its primary focus, a set of small MAPS test structures have been developed in the 65 nm TPSCo CMOS process. The CE-65 focuses on the characterisation of the analogue charge collection properties of this technology. The latest iteration, the CE-65v2, was produced in different processes (standard, with a low-dose n-type blanket, and blanket with gap between pixels), pixel pitches (15, 18, 22.5 $\mu$m), and pixel arrangements (square or staggered). The comparatively large pixel array size of $48\times24$ pixels in CE-65v2 allows the uniformity of the pixel response to be studied, among other benefits. The CE-65v2 chip was characterised in a test beam at the CERN SPS. A first analysis showed that hit efficiencies of $\geq 99\%$ and spatial resolution better than 5 $\mu$m can be achieved for all pitches and process variants. For the standard process, thanks to larger charge sharing, even spatial resolutions below 3 $\mu$m are reached, in line with vertex detector requirements for the FCC-ee. This contribution further investigates the data collected at the SPS test beam. Thanks to the large sensor size and efficient data collection, a large amount of statistics was collected, which allows for detailed in-pixel studies to see the efficiency and spatial resolution as a function of the hit position within the pixels. Again, different pitches and process variants are compared.
Reference graph
Works this paper leans on
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[8]
W. Snoeys, G. Aglieri Rinella, A. Andronic, M. Antonelli, R. Baccomi, R. Ballabriga Sune et al., Optimization of a 65 nm CMOS imaging process for monolithic CMOS sensors for high energy physics , https://doi.org/10.22323/1.420.0083 PoS Pixel2022 (2023) 083
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" write newline "" before.all 'output.state := FUNCTION blank.sep after.quote 'output.state := FUNCTION fin.entry output.state after.quoted.block = 'skip 'add.period if write newline FUNCTION new.block output.state before.all = 'skip output.state after.quote = after.quoted.block 'output.state := after.block 'output.state := if if FUNCTION new.sentence out...
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[2]
ALICE collaboration, Technical Design report for the ALICE Inner Tracking System 3 - ITS3 ; A bent wafer-scale monolithic pixel detector , Tech. Rep. CERN-LHCC-2024-003 https://cds.cern.ch/record/2890181, CERN, Geneva (2024)
arXiv 2024
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[3]
FCC Collaboration , FCC-ee : The lepton collider: Future circular collider conceptual design report volume 2 , https://doi.org/10.1140/epjst/e2019-900045-4 EPJ ST 228 (2019) 261–623
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A. Ilg, A. Macchiolo and F. Palla, The vertexing challenge at FCC-ee , to appear in Pixel2024 proc. https://doi.org/10.48550/ARXIV.2502.04071
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A. Ilg, Design and Performance of the IDEA Vertex Detector at FCC-ee in Full Simulation , https://doi.org/10.22323/1.449.0600 PoS EPS-HEP2023 (2023) 600
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K. Gautam and A. Kumar, Characterisation of analogue MAPS fabricated in 65 nm technology for the ALICE ITS3 , https://doi.org/10.1016/j.nima.2024.169787 NIMA 1068 (2024) 169787
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[9]
Ploerer, H
E. Ploerer, H. Baba, J. Baudot, A. Besson, S. Bugiel, T. Chujo et al., Characterisation of analogue MAPS produced in the 65 nm TPSCo process , https://doi.org/10.1088/1748-0221/20/01/c01019 JINST 20 (2025) C01019
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Banerjee, J
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Aglieri Rinella, A
G. Aglieri Rinella, A. Andronic, M. Antonelli, M. Aresti, R. Baccomi, P. Becht et al., Digital pixel test structures implemented in a 65 nm CMOS process , https://doi.org/10.1016/j.nima.2023.168589 NIMA 1056 (2023) 168589
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Dannheim, K
D. Dannheim, K. Dort, L. Huth, D. Hynds, I. Kremastiotis, J. Kr\" o ger et al., Corryvreckan: a modular 4d track reconstruction and analysis software for test beam data, https://doi.org/10.1088/1748-0221/16/03/p03008 JINST 16 (2021) P03008
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Reviewed August 8, 2026 · model on record in the stance chip above.
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