Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-06T22:07:16.066367Z
Paper Citation Record · LEDGER
Ultra-High-Temperature Vacuum Prober for Electrical and Thermal Measurements
As of 13 August 2026, this Paper Citation Record lists 2 of 2 outbound references and 0 inbound Pith citation observations for arXiv:2506.22643.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-13T06:32:02.005865+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
2 of 2 outbound references displayed
- verified exact0
- verified fuzzy1
- unresolved0
- parse uncertain0
- malformed identifier1
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 36bc91c2-2321-43cb-9abd-4168653f193a · outbound
This paper cites This contactless configuration electrically isolates the sample from the high-power heating source through a vacuum gap, ensuring reliable measurements under extreme condition.
Ultra-High-Temperature Vacuum Prober for Electrical and Thermal Measurements This contactless configuration electrically isolates the sample from the high-power heating source through a vacuum gap, ensuring reliable measurements under extreme condition
Reference 1
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-06T22:07:16.290398Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.
Observation af7b40c5-2429-4ec1-abd3-ecb82bee7e52 · outbound
This paper cites A review of high-temperature electronics technology and applications,.
Ultra-High-Temperature Vacuum Prober for Electrical and Thermal Measurements A review of high-temperature electronics technology and applications,
Reference 6
- Resolution
- malformed identifier
- raw_fallback, observed 2026-08-06T22:07:16.190214Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-13T06:32:02.005865+00:00.
Pith citing papers
No inbound Pith citation observations are available.