Pith. sign in

Paper Citation Record · LEDGER

Soft Error Rate in Space: A Unified Analytical Approach

As of 14 August 2026, this Paper Citation Record lists 15 of 15 outbound references and 0 inbound Pith citation observations for arXiv:2501.06260.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2501.06260 v1

Coverage vector

measured 15 of 15 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-10T21:20:24.285056Z

measured 15 of 15 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-14T06:32:32.682623+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

15 of 15 outbound references displayed

  • verified exact4
  • verified fuzzy5
  • unresolved2
  • parse uncertain0
  • malformed identifier0
  • metadata mismatch4

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 4718384f-6144-43c2-a1dd-688c9c3ae4a1 · outbound

This paper cites The Single Event Revolution, IEEE Trans Nucl Sci, 2013, 60 (3), 1824-1835.

Soft Error Rate in Space: A Unified Analytical Approach The Single Event Revolution, IEEE Trans Nucl Sci, 2013, 60 (3), 1824-1835

Reference 1

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:20:25.038056Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

source=pdf_text observed=2026-08-10T21:20:24.211395Z digest=sha256:c20a350a0f18f3d557a0984b2ceab34abe15e9aef11eef7382d3629c66402269

Observation 332749d8-7f51-4f38-bf2e-5493af40d4e9 · outbound

This paper cites Single-Event Analysis and Prediction, IEEE NSREC Short Course Notes, 1997.

Soft Error Rate in Space: A Unified Analytical Approach Single-Event Analysis and Prediction, IEEE NSREC Short Course Notes, 1997

Reference 2

Resolution
verified fuzzy
raw_fallback, observed 2026-08-10T21:20:25.116924Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

source=pdf_text observed=2026-08-10T21:20:24.217091Z digest=sha256:64caf902dea4ab4bb746c03f7c8d525be55330191fb2eda8ffd04503da5fd778

Observation 22c13335-fd33-46e6-922c-403db6cd4b57 · outbound

This paper cites A Review of Single-Event Upset-Rate Calculation Methods,.

Soft Error Rate in Space: A Unified Analytical Approach A Review of Single-Event Upset-Rate Calculation Methods,

Reference 3

Resolution
unresolved
no resolver link, observed 2026-08-10T21:20:24.221870Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-10T21:20:24.221870Z digest=sha256:e80ee80a86337357ee8aab706919ccbb7ab55c767719e8a5348a2f0f785668d6

Observation 7d82a26c-e800-4a76-8e05-4128cdbe7967 · outbound

This paper cites et al., SEU-sensitive volumes in bulk and SOI SRAMs from first-principles calculations and experiments, IEEE Trans Nucl Sci, 2001, 48 (6), 1893-1903.

Soft Error Rate in Space: A Unified Analytical Approach et al., SEU-sensitive volumes in bulk and SOI SRAMs from first-principles calculations and experiments, IEEE Trans Nucl Sci, 2001, 48 (6), 1893-1903

Reference 4

Resolution
verified exact
doi, observed 2026-08-10T21:20:24.374139Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

source=pdf_text observed=2026-08-10T21:20:24.226597Z digest=sha256:32cf99c663180f1f0f33a661f1dcb39502501a75f48d32f91a46921b6610db9c

Observation af064a71-54da-479a-8eae-758b4217b817 · outbound

This paper cites Compact Modeling and Simulation of Heavy Ion -Induced Soft Error Rate in Space Environment: Principles and Validation, IEEE Trans Nucl Sci, 2017, 64 (8), 2129-2135.

Soft Error Rate in Space: A Unified Analytical Approach Compact Modeling and Simulation of Heavy Ion -Induced Soft Error Rate in Space Environment: Principles and Validation, IEEE Trans Nucl Sci, 2017, 64 (8), 2129-2135

Reference 5

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:20:24.862917Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

source=pdf_text observed=2026-08-10T21:20:24.231380Z digest=sha256:d17ff34e5dda516f944d842faa263d68057490681673ad0f8317459a7c14601e

Observation d5f97e2e-3e82-4971-8149-fd66f3c8c227 · outbound

This paper cites an unresolved cited work.

Soft Error Rate in Space: A Unified Analytical Approach Unresolved cited work

Reference 6

Resolution
verified exact
doi, observed 2026-08-10T21:20:24.356876Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

source=pdf_text observed=2026-08-10T21:20:24.237256Z digest=sha256:206a6927b13632af945206a23a9c316a520d18c3d2bdb48765277ad05fc2c444

Observation b004da5c-1dbe-46af-8206-dfb48511411a · outbound

This paper cites et al., Statistics and methodology of multiple cell upset characterization under heavy ion irradiation, Nucl Instrum Methods Phys Res, Sect A, 2015, 775, 41-45.

Soft Error Rate in Space: A Unified Analytical Approach et al., Statistics and methodology of multiple cell upset characterization under heavy ion irradiation, Nucl Instrum Methods Phys Res, Sect A, 2015, 775, 41-45

Reference 7

Resolution
verified exact
doi, observed 2026-08-10T21:20:24.340441Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

source=pdf_text observed=2026-08-10T21:20:24.242867Z digest=sha256:1c8cece61b4ab34e2289129a7618df8cdcc3742b6764479be97967670a719699

Observation 6a28e79d-e79a-4dfb-9e07-440a34ce795d · outbound

This paper cites Methodology of Soft Error Rate Computation in Modern Microelectronics, IEEE Trans Nucl Sci, 2010, 57 (6), 3725-3733.

Soft Error Rate in Space: A Unified Analytical Approach Methodology of Soft Error Rate Computation in Modern Microelectronics, IEEE Trans Nucl Sci, 2010, 57 (6), 3725-3733

Reference 8

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:20:24.770298Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

source=pdf_text observed=2026-08-10T21:20:24.247738Z digest=sha256:2b01b60432afa29d3773036e45811f2e44fcc8f69a64511d8bcebf8a0114afba

Observation 0f5bf3a7-f046-4a44-a93c-f95631d51127 · outbound

This paper cites Suggested Single Event Upset Figure of Merit,.

Soft Error Rate in Space: A Unified Analytical Approach Suggested Single Event Upset Figure of Merit,

Reference 9

Resolution
metadata mismatch
raw_fallback, observed 2026-08-10T21:20:24.655148Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

source=pdf_text observed=2026-08-10T21:20:24.252697Z digest=sha256:6dcadd031d8585cba140774300bdeff0cbea213a1adce3e96b98f1afa092604b

Observation 1190a762-d04e-4ef2-b3ef-0c6e46550eff · outbound

This paper cites Scaling Trends and Bias Dependence of SRAM SER from 16 -nm to 3 -nm FinFET,.

Soft Error Rate in Space: A Unified Analytical Approach Scaling Trends and Bias Dependence of SRAM SER from 16 -nm to 3 -nm FinFET,

Reference 10

Resolution
unresolved
no resolver link, observed 2026-08-10T21:20:24.258791Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-10T21:20:24.258791Z digest=sha256:90f7c178bd2d347a72ab4fa32fb7128fb1239620b900c1ee4385ab12a51bf34d

Observation 69802c23-d3de-4703-b85d-b2c394ba7f22 · outbound

This paper cites 33, 146, pp.

Soft Error Rate in Space: A Unified Analytical Approach 33, 146, pp

Reference 11

Resolution
verified fuzzy
raw_fallback, observed 2026-08-10T21:20:25.099769Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

source=pdf_text observed=2026-08-10T21:20:24.263714Z digest=sha256:b1a6c039c165d37c8975a421d5c50ecf124465f4067f5df958a8b77740f10f9a

Observation 7ea7863b-7fd5-4071-9eb8-3e72b1a9db82 · outbound

This paper cites Geometrical analysis of soft errors and oxide damage produced by heavy cosmic rays and alpha particles,.

Soft Error Rate in Space: A Unified Analytical Approach Geometrical analysis of soft errors and oxide damage produced by heavy cosmic rays and alpha particles,

Reference 12

Resolution
verified fuzzy
raw_fallback, observed 2026-08-10T21:20:25.084433Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

source=pdf_text observed=2026-08-10T21:20:24.268805Z digest=sha256:9feb6dcf01e151889d28d6f677bc72f910411348423b24ba4bf0bc6423e71ebc

Observation 20aa9627-e7d7-469c-8dd0-89ad4240410b · outbound

This paper cites CREME’96: a revision of the cosmic ray effects on microelectronics c ode.

Soft Error Rate in Space: A Unified Analytical Approach CREME’96: a revision of the cosmic ray effects on microelectronics c ode

Reference 13

Resolution
verified fuzzy
raw_fallback, observed 2026-08-10T21:20:25.069261Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

source=pdf_text observed=2026-08-10T21:20:24.273765Z digest=sha256:b3b3e55c17b0fa521daa017ccfebe2985f3b68eccc144df93cac1d5a9a84b804

Observation ff1fb6e3-cdd4-46df-a1f6-e9b6000561a7 · outbound

This paper cites Single-Event Effects Rate Prediction.

Soft Error Rate in Space: A Unified Analytical Approach Single-Event Effects Rate Prediction

Reference 14

Resolution
verified fuzzy
raw_fallback, observed 2026-08-10T21:20:25.053725Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

source=pdf_text observed=2026-08-10T21:20:24.278802Z digest=sha256:974556caf078e63af00293ad92c809b7e9655943d405ad2ba22e0eedbc28aedd

Observation f3720524-c56c-49bc-97c9-b349155cc6b6 · outbound

This paper cites Analytic SEU rate calculation compared to space data,.

Soft Error Rate in Space: A Unified Analytical Approach Analytic SEU rate calculation compared to space data,

Reference 15

Resolution
verified exact
doi, observed 2026-08-10T21:20:24.323942Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.

source=pdf_text observed=2026-08-10T21:20:24.285056Z digest=sha256:45dfd233febcd7f534674875693d0bff46d4961f3400ad9691ec2046051bcdcf

Pith citing papers

No inbound Pith citation observations are available.