Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
High coherence fluxonium manufactured with a wafer-scale uniformity process
As of 14 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 3 inbound Pith citation observations for arXiv:2405.05481.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-14T06:32:32.682623+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-08-12T14:39:54.184048Z
A source-named dated measurement, never combined with another source.
Source: arxiv_reference, observed 2026-05-18T01:50:37.959597Z
Reference resolution
0 of 0 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
No outbound reference observations are available for this paper version.
Pith citing papers
Observation fdbb86de-6d9f-4c4d-88e1-4a8879d42663 · inbound
Energy participation ratio analysis for very anharmonic superconducting circuits cites this paper.
Energy participation ratio analysis for very anharmonic superconducting circuits High coherence fluxonium manufactured with a wafer-scale uniformity process
Reference 28
- Resolution
- unresolved
- no resolver link, observed 2026-08-12T14:39:54.184048Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 376d662f-de77-4556-8d55-85341c131500 · inbound
High-fidelity QND readout and measurement back-action in a Tantalum-based high-coherence fluxonium qubit cites this paper.
High-fidelity QND readout and measurement back-action in a Tantalum-based high-coherence fluxonium qubit High coherence fluxonium manufactured with a wafer-scale uniformity process
Reference 29
- Resolution
- unresolved
- no resolver link, observed 2026-08-10T11:26:41.490316Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation 475b355a-1daf-4a23-8662-73ab8bbdc40d · inbound
Testing Electromagnetic Memory via Acceleration-Induced Phase Imprints in Superconductors cites this paper.
Testing Electromagnetic Memory via Acceleration-Induced Phase Imprints in Superconductors High coherence fluxonium manufactured with a wafer-scale uniformity process
Reference 71
- Resolution
- verified exact
- arxiv_id, observed 2026-05-18T01:50:37.962594Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-14T06:32:32.682623+00:00.