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Paper Citation Record · LEDGER

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series

As of 11 August 2026, this Paper Citation Record lists 27 of 27 outbound references and 0 inbound Pith citation observations for arXiv:2507.01999.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2507.01999 v1

Coverage vector

measured 27 of 27 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-06T21:15:07.929632Z

measured 27 of 27 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-10T06:31:04.303077+00:00

measured 0 of 0 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

27 of 27 outbound references displayed

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External citation measurements

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Outbound references

Observation 320c1388-97bc-49d8-b75d-503410eb554a · outbound

This paper cites URL: https://www.machinedesign.com/mechanical-motion-systems/article/21837100/ error-in-measuring-low-flows-could-cost-chipmakers-millions.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series URL: https://www.machinedesign.com/mechanical-motion-systems/article/21837100/ error-in-measuring-low-flows-could-cost-chipmakers-millions

Reference 1

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This paper cites URL: https://semiengineering.com/ getting-smarter-about-tool-maintenance/.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series URL: https://semiengineering.com/ getting-smarter-about-tool-maintenance/

Reference 2

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Observation bc6a7de4-4e80-4f59-93c9-1d203e668b0d · outbound

This paper cites Nonlinear signal processing using neural networks: Prediction and system modelling, 6 1987.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Nonlinear signal processing using neural networks: Prediction and system modelling, 6 1987

Reference 3

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Observation cfaadeb6-fd78-49df-b367-c78668dcafad · outbound

This paper cites an unresolved cited work.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Unresolved cited work

Reference 4

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This paper cites an unresolved cited work.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Unresolved cited work

Reference 5

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Observation 904d338a-a3bd-423b-bb1b-1b74be949a87 · outbound

This paper cites Designing an artificial neural network for forecasting tourism time series.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Designing an artificial neural network for forecasting tourism time series

Reference 6

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Observation a07f5a53-1db4-4130-a97c-a34c0039b29c · outbound

This paper cites An Empirical Evaluation of Generic Convolutional and Recurrent Networks for Sequence Modeling.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series An Empirical Evaluation of Generic Convolutional and Recurrent Networks for Sequence Modeling

Reference 7

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Observation 93785d09-487a-4268-a1b6-4598ccf53fe7 · outbound

This paper cites Deep learning with long short-term memory networks for finan- cial market predictions.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Deep learning with long short-term memory networks for finan- cial market predictions

Reference 8

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This paper cites Multimodal fusion for sensor data using stacked autoencoders.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Multimodal fusion for sensor data using stacked autoencoders

Reference 9

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This paper cites A practical guide to wavelet analysis.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series A practical guide to wavelet analysis

Reference 10

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Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Unresolved cited work

Reference 11

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Observation 3e00b80e-b7ae-43f0-9399-08c88891dc08 · outbound

This paper cites Webb, Shirui Pan, Charu Aggarwal, and Mahsa Salehi.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Webb, Shirui Pan, Charu Aggarwal, and Mahsa Salehi

Reference 12

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verified exact
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This paper cites Equipment anomaly detection for semiconductor manufac- turing by exploiting unsupervised learning from sensory data.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Equipment anomaly detection for semiconductor manufac- turing by exploiting unsupervised learning from sensory data

Reference 13

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This paper cites Adel, and Mustapha Ouladsine.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Adel, and Mustapha Ouladsine

Reference 14

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verified exact
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Observation 810a87d5-0ebf-4929-a134-08b9b7ed8abe · outbound

This paper cites Failure detection and primary cause identification of multivariate time series data in semiconductor equipment.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Failure detection and primary cause identification of multivariate time series data in semiconductor equipment

Reference 15

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Observation 2610aa26-9848-45ea-85ce-798483efcc84 · outbound

This paper cites Anomaly detection in time series data and its application to semiconductor manufacturing.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Anomaly detection in time series data and its application to semiconductor manufacturing

Reference 16

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Observation 74b1e9d1-db50-401f-88ed-56223e7db441 · outbound

This paper cites Adaptive asymmetric least squares baseline estimation for analytical instruments.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Adaptive asymmetric least squares baseline estimation for analytical instruments

Reference 17

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This paper cites Ricker, ormsby, klander, butterworth – a choice of wavelets | cseg recorder, 9 1994.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Ricker, ormsby, klander, butterworth – a choice of wavelets | cseg recorder, 9 1994

Reference 18

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This paper cites Very deep convolutional networks for large-scale image recognition.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Very deep convolutional networks for large-scale image recognition

Reference 19

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Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Berg, and Li Fei-Fei

Reference 20

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Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series On a classical problem of probability theory b

Reference 21

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This paper cites Neural Architecture Search: A Survey.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Neural Architecture Search: A Survey

Reference 22

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This paper cites Recurrent Neural Networks (RNNs): A gentle Introduction and Overview.

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Recurrent Neural Networks (RNNs): A gentle Introduction and Overview

Reference 23

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Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Transformers in vision: A survey

Reference 24

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Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Lafferty, Andrew McCallum, and Fernando C

Reference 25

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Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Rahmani, and Pasi Liljeberg

Reference 26

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Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series Unresolved cited work

Reference 2020

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Pith citing papers

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