Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-07T10:46:08.861056Z
Paper Citation Record · LEDGER
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition
As of 8 August 2026, this Paper Citation Record lists 64 of 64 outbound references and 0 inbound Pith citation observations for arXiv:2506.04477.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-08T06:32:00.761636+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
64 of 64 outbound references displayed
- verified exact0
- verified fuzzy55
- unresolved9
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation 50adbbf7-035c-4d0a-a0d8-2a829d8466b9 · outbound
This paper cites Fast grain mapping with sub-nanometer resolution using 4d-stem with grain classification by princi- pal component analysis and non-negative matrix factoriza- tion.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Fast grain mapping with sub-nanometer resolution using 4d-stem with grain classification by princi- pal component analysis and non-negative matrix factoriza- tion
Reference 1
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.630009Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 01448d3d-475b-4382-9780-a47fca8cd363 · outbound
This paper cites Baccouche et al.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Baccouche et al
Reference 2
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.619950Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 1e1cb172-216a-4f35-8420-dd011a159cf7 · outbound
This paper cites an unresolved cited work.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Unresolved cited work
Reference 3
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T10:46:09.608944Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 0368c490-5bc3-4887-9d95-382d899bd52e · outbound
This paper cites van Heijst, Jeroen J.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition van Heijst, Jeroen J
Reference 4
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.599058Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation d3faaf1c-3b7d-443e-b01f-d41d9aa1bd55 · outbound
This paper cites Clough and A.I.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Clough and A.I
Reference 5
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.588731Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 11b394a6-2614-4823-b5b2-f5a230cc3355 · outbound
This paper cites Strain mapping of semicon- ductor specimens with nm-scale resolution in a transmission electron microscope.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Strain mapping of semicon- ductor specimens with nm-scale resolution in a transmission electron microscope
Reference 6
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.578119Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation de889a6b-571d-4e5d-b824-ce7781623011 · outbound
This paper cites an unresolved cited work.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Unresolved cited work
Reference 7
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T10:46:09.568110Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 96099c23-61c9-4f17-8b0c-7c79862c4ca3 · outbound
This paper cites Centernet: Keypoint triplets for object detection.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Centernet: Keypoint triplets for object detection
Reference 8
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.557919Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 419a80d3-13c5-4a4f-a021-567702b7c8f3 · outbound
This paper cites A novel automated method to measure strain at the nano scale.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition A novel automated method to measure strain at the nano scale
Reference 9
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.547674Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 711b01e3-4a49-414b-95ac-75d04b68063c · outbound
This paper cites Phase object reconstruction for 4d-stem using deep learning.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Phase object reconstruction for 4d-stem using deep learning
Reference 10
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.537632Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 1324f6a9-d0f0-4896-b7fe-a396d38f0f69 · outbound
This paper cites Local and transient nanoscale strain map- ping during in situ deformation.Applied Physics Letters, 109 (8), 2016.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Local and transient nanoscale strain map- ping during in situ deformation.Applied Physics Letters, 109 (8), 2016
Reference 11
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.527778Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 3ef1a668-2021-4f9d-8d5f-de43273f4cc5 · outbound
This paper cites Strain field around individual dislocations controls failure (small methods 12/2024).
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Strain field around individual dislocations controls failure (small methods 12/2024)
Reference 12
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.517025Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation a87011a3-7e31-4949-86c2-8e84d9f45677 · outbound
This paper cites an unresolved cited work.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Unresolved cited work
Reference 13
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T10:46:09.506695Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 083b8325-fcfd-41ac-a3ce-663658510a32 · outbound
This paper cites A versatile ma- chine learning workflow for high-throughput analysis of supported metal catalyst particles.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition A versatile ma- chine learning workflow for high-throughput analysis of supported metal catalyst particles
Reference 14
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.496474Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 675c07a9-b58d-4da3-9e00-7a74985b8053 · outbound
This paper cites Asynchronous LLM Function Calling.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Asynchronous LLM Function Calling
Reference 15
- Resolution
- unresolved
- no resolver link, observed 2026-08-07T10:46:08.560118Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.
Observation bb43ee88-ab06-48b3-94a1-f2c9c01c4233 · outbound
This paper cites Automated analysis of transmission electron micrographs of metallic nanoparticles by machine learning.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Automated analysis of transmission electron micrographs of metallic nanoparticles by machine learning
Reference 16
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.485386Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 1a5467fb-9390-41db-bd23-43fd19e1a5f3 · outbound
This paper cites Electron bessel beam diffraction for precise and accu- rate nanoscale strain mapping.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Electron bessel beam diffraction for precise and accu- rate nanoscale strain mapping
Reference 17
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.475204Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation c16ba428-1fb1-4b7b-8884-a45dca6dbd1e · outbound
This paper cites Haifawi et al.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Haifawi et al
Reference 18
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.464191Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 162da0df-a3d9-407d-8cbf-c6d75834758e · outbound
This paper cites Horwath, Dmitri N.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Horwath, Dmitri N
Reference 19
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.453716Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 7b89f5ba-f405-44d5-98e6-008d1806360b · outbound
This paper cites Jia et al.
Reference 20
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.443297Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 9ba04466-6471-4c46-b497-0c8dba29c26b · outbound
This paper cites Tate, Jiwoong Park, Sol M.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Tate, Jiwoong Park, Sol M
Reference 21
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.433028Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 2ad44cf1-4cd4-412b-9b3e-a198ad0225ab · outbound
This paper cites Yolo by ultralytics (version 8.0.0).
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Yolo by ultralytics (version 8.0.0)
Reference 22
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.422549Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 85a02f36-a3c6-4c15-ae96-e7c2e72a348a · outbound
This paper cites Korrelationstheorie der station ¨aren stochastischen prozesse.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Korrelationstheorie der station ¨aren stochastischen prozesse
Reference 23
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.412494Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 5aa710f3-2d1a-4509-be38-376d1f11170c · outbound
This paper cites Atomic-scale strain analysis for advanced si/sige heterostructure by using transmission electron microscopy.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Atomic-scale strain analysis for advanced si/sige heterostructure by using transmission electron microscopy
Reference 24
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.401921Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 2cf75e64-ff3e-4abf-8096-c93f119be87a · outbound
This paper cites Manifold learning of four-dimensional scanning transmission electron microscopy.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Manifold learning of four-dimensional scanning transmission electron microscopy
Reference 25
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.391057Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 8aec59a2-3f1e-4423-adf9-220d02cd9547 · outbound
This paper cites Generalized focal loss: Learning qualified and distributed bounding boxes for dense object detection.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Generalized focal loss: Learning qualified and distributed bounding boxes for dense object detection
Reference 26
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.380384Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 0d08c449-da9c-47e1-9dac-96a27b52f5e2 · outbound
This paper cites Feature pyramid networks for object detection.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Feature pyramid networks for object detection
Reference 27
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.369666Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 858fc97a-a749-4a77-b55a-0d49467d3560 · outbound
This paper cites Path aggregation network for instance seg- mentation.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Path aggregation network for instance seg- mentation
Reference 28
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.357949Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 0c9551e0-fb4c-456b-80d0-0c9a5c22115c · outbound
This paper cites Comparing different software packages for the mapping of strain from scanning precession diffraction data.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Comparing different software packages for the mapping of strain from scanning precession diffraction data
Reference 29
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.347962Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation cea5c744-6527-4ae3-8e34-7eef5c0cdfba · outbound
This paper cites Krause, Dennis Zillmann, and Andreas Rosenauer.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Krause, Dennis Zillmann, and Andreas Rosenauer
Reference 30
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.336873Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 9ac74276-de9e-47a8-9ed4-71ea33e73afb · outbound
This paper cites Mixed precision training, 2018.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Mixed precision training, 2018
Reference 31
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.325598Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation ff88e4b4-0a98-40e7-b69a-89d9d2a6393b · outbound
This paper cites an unresolved cited work.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Unresolved cited work
Reference 32
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T10:46:09.313384Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 5f2d3cbc-066c-4632-8e9f-13b0799b3629 · outbound
This paper cites Disentangling multiple scattering with deep learning: application to strain mapping from electron diffrac- tion patterns.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Disentangling multiple scattering with deep learning: application to strain mapping from electron diffrac- tion patterns
Reference 33
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.300998Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 515182d6-e9bc-4543-a3b0-c7d31f65ca12 · outbound
This paper cites Strain measurement in semiconductor heterostructures by scanning transmission electron microscopy.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Strain measurement in semiconductor heterostructures by scanning transmission electron microscopy
Reference 34
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.289465Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 109868bd-4b8f-45d5-96cf-90205437354a · outbound
This paper cites Four-dimensional scanning transmission elec- tron microscopy (4d-stem): From scanning nanodiffraction to ptychography and beyond.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Four-dimensional scanning transmission elec- tron microscopy (4d-stem): From scanning nanodiffraction to ptychography and beyond
Reference 35
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.277504Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 0892d7d4-a5c0-4b58-9123-f25456ae8497 · outbound
This paper cites Automated crystal orientation map- ping in py4dstem using sparse correlation matching.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Automated crystal orientation map- ping in py4dstem using sparse correlation matching
Reference 36
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.266234Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 7baf9172-ad6d-42ca-950a-6b9e2bb768f9 · outbound
This paper cites Strain mapping at nanometer resolu- tion using advanced nano-beam electron diffraction.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Strain mapping at nanometer resolu- tion using advanced nano-beam electron diffraction
Reference 37
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.253212Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation ade2698c-b01f-4c4f-a79e-5fd26066a278 · outbound
This paper cites The exit-wave power-cepstrum transform for scan- ning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition The exit-wave power-cepstrum transform for scan- ning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision
Reference 38
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.240239Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 7d99d432-f9d2-4038-a81d-d5d36b8b05b3 · outbound
This paper cites High-resolution mapping of strain partitioning and relaxation in ingan/gan nanowire heterostructures.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition High-resolution mapping of strain partitioning and relaxation in ingan/gan nanowire heterostructures
Reference 39
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.229241Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 839cfdd7-e4ce-48b2-9c2b-a3966c044177 · outbound
This paper cites an unresolved cited work.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Unresolved cited work
Reference 40
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T10:46:09.218852Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation c4c9df4f-87fa-41aa-abbb-69a40b1cffb8 · outbound
This paper cites Pekin, Christoph Gammer, Jim Ciston, An- drew M.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Pekin, Christoph Gammer, Jim Ciston, An- drew M
Reference 41
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.207264Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 54d465da-a524-49b2-b7a3-6ef6ce0ed73c · outbound
This paper cites Yolo9000: Better, faster, stronger.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Yolo9000: Better, faster, stronger
Reference 42
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.196358Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation f940d883-b640-41e1-82fc-6ab06c38f5ec · outbound
This paper cites U- Net: Convolutional Networks for Biomedical Image Seg- mentation.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition U- Net: Convolutional Networks for Biomedical Image Seg- mentation
Reference 43
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.184778Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 1a94576f-4005-47af-bc6c-9be46645c875 · outbound
This paper cites Bekkers, Marleen Hoogendoorn, and Remco Duits.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Bekkers, Marleen Hoogendoorn, and Remco Duits
Reference 44
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.172960Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 704e24c6-04ad-453c-a99c-c3b6d3884074 · outbound
This paper cites Cepstral scanning transmission electron microscopy imaging of severe lattice distortions.Ul- tramicroscopy, 231:113252, 2021.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Cepstral scanning transmission electron microscopy imaging of severe lattice distortions.Ul- tramicroscopy, 231:113252, 2021
Reference 45
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.160956Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 04f807d8-1536-4d7f-a89b-64db88618fd9 · outbound
This paper cites Uncovering material deformations via machine learning combined with four-dimensional scanning transmis- sion electron microscopy.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Uncovering material deformations via machine learning combined with four-dimensional scanning transmis- sion electron microscopy
Reference 46
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.148515Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 3c9d9cd3-1da6-4989-bfdb-165c5d730d97 · outbound
This paper cites Domain-dependent strain and stack- ing in two-dimensional van der waals ferroelectrics.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Domain-dependent strain and stack- ing in two-dimensional van der waals ferroelectrics
Reference 47
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.137188Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 732ff45b-bbd4-44ea-946c-d8d2586c07ca · outbound
This paper cites an unresolved cited work.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Unresolved cited work
Reference 48
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T10:46:09.126782Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 6d339a55-0bcb-4c60-b142-3c57292113cd · outbound
This paper cites Using stem with quasi- parallel illumination and an automated peak-finding routine for strain analysis at the nanometre scale.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Using stem with quasi- parallel illumination and an automated peak-finding routine for strain analysis at the nanometre scale
Reference 49
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.115781Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 68b34bb1-2f61-4e54-89d5-2a22b9dfadd3 · outbound
This paper cites Sunde, C.D.
Reference 50
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.104502Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 0b7ecd9f-516c-49dd-a18c-8fd6b76e4936 · outbound
This paper cites Generalization across experimental parameters in neural net- work analysis of high-resolution transmission electron mi- croscopy datasets.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Generalization across experimental parameters in neural net- work analysis of high-resolution transmission electron mi- croscopy datasets
Reference 51
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.092717Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation f909a582-37c3-49f7-8a04-b9a1d900b49d · outbound
This paper cites Tate, Prafull Purohit, Darol Chamberlain, Kayla X.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Tate, Prafull Purohit, Darol Chamberlain, Kayla X
Reference 52
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.081147Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 4b2cd6a4-3501-4a8a-aed7-8a9acb7da540 · outbound
This paper cites Thronsen, T.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Thronsen, T
Reference 53
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.069189Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 45bf88d3-e4a7-4d06-be36-c93435de4691 · outbound
This paper cites Fcos: Fully convolutional one-stage object detection.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Fcos: Fully convolutional one-stage object detection
Reference 54
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.055872Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation ddf46ba9-c708-4203-9589-1037576323bb · outbound
This paper cites an unresolved cited work.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Unresolved cited work
Reference 55
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T10:46:09.044418Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation fa6fe6e5-bb3c-4b8c-8cf4-6282f4405e65 · outbound
This paper cites Autodisk: Automated diffraction processing and strain map- ping in 4d-stem.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Autodisk: Automated diffraction processing and strain map- ping in 4d-stem
Reference 56
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.033254Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 92ffbc85-1efd-46dc-8a0a-8491694b833a · outbound
This paper cites Generalized harmonic analysis.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Generalized harmonic analysis
Reference 57
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.020619Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 29989068-bec7-4e53-a313-cd6321d73a3b · outbound
This paper cites Flexible for- mation of coherent probes on an aberration-corrected stem with three condensers.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Flexible for- mation of coherent probes on an aberration-corrected stem with three condensers
Reference 58
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:09.008122Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation bbed91cf-25ae-4cfa-abe7-2906f4384fe7 · outbound
This paper cites Un- supervised machine learning and cepstral analysis with 4d- stem for characterizing complex microstructures of metallic alloys.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Un- supervised machine learning and cepstral analysis with 4d- stem for characterizing complex microstructures of metallic alloys
Reference 59
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:08.993233Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation caec0016-6ad8-41f5-b2fc-9650ab9c29b2 · outbound
This paper cites Lattice strain mapping using circular hough transform for electron diffraction disk detection.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Lattice strain mapping using circular hough transform for electron diffraction disk detection
Reference 60
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:08.976056Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 4e5643f1-bcec-412e-ae35-9be63ff85268 · outbound
This paper cites Training artificial neural networks for precision ori- entation and strain mapping using 4d electron diffraction datasets.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Training artificial neural networks for precision ori- entation and strain mapping using 4d electron diffraction datasets
Reference 61
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:08.960630Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 6e98ae10-b65f-4d63-b915-da87ca747dae · outbound
This paper cites Patterned probes for high precision 4d-stem bragg measurements.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Patterned probes for high precision 4d-stem bragg measurements
Reference 62
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:08.944850Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 0c228b77-92eb-47c7-8659-7fbcf15e0af1 · outbound
This paper cites an unresolved cited work.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Unresolved cited work
Reference 63
- Resolution
- unresolved
- raw_fallback, observed 2026-08-07T10:46:08.928777Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Observation 2cbfaef3-457a-4295-adbf-9fa996ccc5a4 · outbound
This paper cites Crystal phase mapping by scanning preces- sion electron diffraction and machine learning decomposi- tion.
Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition Crystal phase mapping by scanning preces- sion electron diffraction and machine learning decomposi- tion
Reference 64
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-07T10:46:08.912577Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-08T06:32:00.761636+00:00.
Pith citing papers
No inbound Pith citation observations are available.