Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-14T04:15:56.673884Z
Paper Citation Record · LEDGER
Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry
As of 15 August 2026, this Paper Citation Record lists 10 of 10 outbound references and 0 inbound Pith citation observations for arXiv:2608.10146.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-15T06:32:42.880941+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
10 of 10 outbound references displayed
- verified exact2
- verified fuzzy2
- unresolved6
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation fef7c61c-9dc9-410e-8ad1-8876a1ac547e · outbound
This paper cites an unresolved cited work.
Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Unresolved cited work
Reference 1
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T04:15:56.831365Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 9674cb33-2650-4ba9-ba58-383ed832ab23 · outbound
This paper cites an unresolved cited work.
Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Unresolved cited work
Reference 2
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T04:15:56.817977Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation aeb3de6a-97cf-40de-8b29-5425f2fc51bf · outbound
This paper cites Quinten, SN Appl.
Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Quinten, SN Appl
Reference 3
- Resolution
- verified exact
- doi, observed 2026-08-14T04:15:56.724762Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation d815b604-baac-41a6-9bf0-1660488e6f9c · outbound
This paper cites an unresolved cited work.
Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Unresolved cited work
Reference 4
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T04:15:56.806007Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 03b92399-e228-46e7-9339-b7988f0001f6 · outbound
This paper cites an unresolved cited work.
Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Unresolved cited work
Reference 5
- Resolution
- verified exact
- doi, observed 2026-08-14T04:15:56.712239Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation cc586877-7b2a-427a-8c14-fab45edcb884 · outbound
This paper cites an unresolved cited work.
Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Unresolved cited work
Reference 6
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T04:15:56.789266Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation e18b465d-5186-4d82-82c2-54d5b1aab8ab · outbound
This paper cites an unresolved cited work.
Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Unresolved cited work
Reference 7
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T04:15:56.778776Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 50ee82ae-8aab-4121-94d7-b1352a98f8e3 · outbound
This paper cites Huang, C.
Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Huang, C
Reference 8
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T04:15:56.768242Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 6de75659-7014-4793-93f3-d63b4064480a · outbound
This paper cites Angus Macleod, Thin-Film Optical Filters, Fifth Edition (CRC Press, 2017).
Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Angus Macleod, Thin-Film Optical Filters, Fifth Edition (CRC Press, 2017)
Reference 9
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T04:15:56.757264Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Observation 5d5d3712-4758-4347-baf9-24fcdb9d446d · outbound
This paper cites an unresolved cited work.
Practical Evaluation of FFT-Based Thickness Extraction for Thick-Film Reflectometry Unresolved cited work
Reference 10
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T04:15:56.744597Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-15T06:32:42.880941+00:00.
Pith citing papers
No inbound Pith citation observations are available.