Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
Quality Concerns Caused by Quality Control -- deformation of silicon strip detector modules in thermal cycling tests
As of 14 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:2503.03133.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-14T06:32:32.682623+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-07-31T01:54:49.354486Z
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
0 of 0 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
No outbound reference observations are available for this paper version.
Pith citing papers
Observation 58f3d805-a119-497e-a860-6ece0c86f20f · inbound
Cracking under pressure --- investigating mitigation approaches for silicon fractures on ATLAS strip tracker petals at cold temperatures cites this paper.
Cracking under pressure --- investigating mitigation approaches for silicon fractures on ATLAS strip tracker petals at cold temperatures Quality Concerns Caused by Quality Control -- deformation of silicon strip detector modules in thermal cycling tests
Reference 40
- Resolution
- unresolved
- no resolver link, observed 2026-07-31T01:54:49.354486Z
Source-reported events for the cited work
Unavailable: canonical work link unavailable.