Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links, observed 2026-08-14T12:57:31.949331Z
Paper Citation Record · LEDGER
Measured Effectiveness of Deep N-well Substrate Isolation in a 65nm Pixel Readout Chip Prototype
As of 18 August 2026, this Paper Citation Record lists 4 of 4 outbound references and 0 inbound Pith citation observations for arXiv:1908.06182.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-18T06:34:40.430872+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links
A source-named dated measurement, never combined with another source.
Source: cited_works
Reference resolution
4 of 4 outbound references displayed
- verified exact0
- verified fuzzy1
- unresolved3
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
Observation aa9137b2-6d62-42f7-a262-2f9f6d61ba3d · outbound
This paper cites 38th Int.
Measured Effectiveness of Deep N-well Substrate Isolation in a 65nm Pixel Readout Chip Prototype 38th Int
Reference 1
- Resolution
- verified fuzzy
- raw_fallback, observed 2026-08-14T12:57:32.051228Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation b39ffb83-01fe-4b46-b6f9-e7b7ca94f321 · outbound
This paper cites an unresolved cited work.
Measured Effectiveness of Deep N-well Substrate Isolation in a 65nm Pixel Readout Chip Prototype Unresolved cited work
Reference 2
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:57:32.033728Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation e5c7c9b3-4fab-4c31-9ccf-7fab418fcb97 · outbound
This paper cites an unresolved cited work.
Measured Effectiveness of Deep N-well Substrate Isolation in a 65nm Pixel Readout Chip Prototype Unresolved cited work
Reference 3
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:57:32.017641Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Observation f07d2212-09fe-4641-8373-6528ae9560d7 · outbound
This paper cites an unresolved cited work.
Measured Effectiveness of Deep N-well Substrate Isolation in a 65nm Pixel Readout Chip Prototype Unresolved cited work
Reference 4
- Resolution
- unresolved
- raw_fallback, observed 2026-08-14T12:57:31.996938Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-18T06:34:40.430872+00:00.
Pith citing papers
No inbound Pith citation observations are available.