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G\"oran Possnert

Identifiers

  • name variant G\"oran Possnert 0.60 · backfill

Papers (1)

  1. Ultra-thin film and interface analysis of high-k dielectric materials employing Time-Of-Flight Medium Energy Ion Scattering (TOF-MEIS) cond-mat.mtrl-sci · 2013 · author #5

Mentions

  • 1309.0611 #5 · backfill · confidence 0.70 G\"oran Possnert

Frequent Coauthors