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\'Eric Kajfasz

Identifiers

  • name variant \'Eric Kajfasz 0.60 · backfill

Papers (1)

  1. Toward a universal characterization methodology for conversion gain measurement of CMOS APS: application to Euclid and SVOM astro-ph.IM · 2024 · author #4

Mentions

  • 2409.03374 #4 · arxiv_oai · confidence 0.70 \'Eric Kajfasz

Frequent Coauthors