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Yuibi Gomi

Identifiers

  • name variant Yuibi Gomi 0.60 · backfill

Papers (1)

  1. A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement physics.ins-det · 2025 · author #1

Mentions

  • 2504.08305 #1 · arxiv_oai · confidence 0.70 Yuibi Gomi

Frequent Coauthors