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D.S. Gets

Identifiers

  • name variant D.S. Gets 0.60 · backfill

Papers (1)

  1. EDEPR of impurity centers embedded in silicon microcavities cond-mat.mes-hall · 2009 · author #3

Mentions

  • 0910.3851 #3 · backfill · confidence 0.70 D.S. Gets

Frequent Coauthors