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Per Sandstr\"om

Identifiers

  • name variant Per Sandstr\"om 0.60 · backfill

Papers (1)

  1. A single platform with van der Pauw geometry for measurement of Seebeck coefficient, resistivity, and Hall effect of thin films physics.ins-det · 2026 · author #4

Mentions

  • 2606.28137 #4 · arxiv_oai · confidence 0.70 Per Sandstr\"om

Frequent Coauthors