pith. sign in

A. M. See (2)

Identifiers

  • name variant A. M. See (2) 0.60 · backfill

Papers (1)

  1. Probing the Sensitivity of Electron Wave Interference to Disorder-Induced Scattering in Solid-State Devices cond-mat.mes-hall · 2011 · author #3

Mentions

  • 1106.5823 #3 · backfill · confidence 0.70 A. M. See (2)

Frequent Coauthors