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Mu Lan

Identifiers

  • name variant Mu Lan 0.50 · backfill

Papers (2)

  1. Enhanced low-flux sensitivity (ELFS) effect of neutron-induced displacement damage in bipolar devices: physical mechanism and parametric model physics.space-ph · 2019 · author #3
  2. Mechanism of Synergistic Effects of Neutron- and Gamma-Ray-Radiated PNP Bipolar Transistors physics.app-ph · 2019 · author #8

Mentions

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Frequent Coauthors