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Utku Soylu

Identifiers

  • name variant Utku Soylu 0.60 · backfill

Papers (1)

  1. Direct On-Wafer Measurements of Noise Parameters in C- and X-bands at $T=4$ K physics.ins-det · 2026 · author #3

Mentions

  • 2605.17073 #3 · arxiv_oai · confidence 0.70 Utku Soylu

Frequent Coauthors